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This article by Carol Dixon explores the process of comparing different options for improvement using Lean Six Sigma methodology. It discusses criteria evaluation, statistical hypothesis testing, and decision-making processes in manufacturing. An example of comparing semiconductor materials is provided to illustrate the process. The article concludes with considerations on cost-effectiveness.
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Which Process is Better? Carol Dixon, Freeflowe Technical Services Lean Six Sigma, Quality, Continuous Improvement 2/27/2014
Introduction Carol Dixon, ASQ CQE, CSSGB Principal, Freeflowe Technical Servicescarol_dixon@freeflowe.com Phone: 541-602-5076 Lean Six Sigma, Quality, Continuous Improvement Consulting and Blended Training for small manufacturing businesses • Bachelor’s Engineering Physics • Graduate studies in Statistics • Member of ASQ since 2011 • Manufacturing and Quality Engineer in electronics, primarily Hewlett-Packard and medical devices
Overview • Process Improvements in manufacturing frequently involve comparisons • What is a process? – Process Map • Which process is better? • Options • Criteria for evaluation • Comparison criteria for each option and between options • Statistical Hypothesis testing (t-test) • Complete evaluation • Results • Conclusions • Making decision
Process Map New Supplier, material property, actual material change Raw materials Test/ inspect Process step 1 Tooling, Process or metrology, operator change Process step 2 Pass Final Product Process step n Process
EXAMPLE – Which material is better? Two different semiconductor materials are being evaluated within a batch for impact to electrical resistance. (Typical batch size 25 wafers). Each wafer for this example will have 100 die. Specification (Target R) = 1250 Ω, LSL= 1200 Ω, USL1300 Ω • Wafers 1-6 – Old material • Wafers 7-25 – New material After processing all wafers are tested electrically and parameters are compared between the old and new.
Hypothesis testing HO: µ1 = µ2 HA:µ1≠ µ2 HO :µ1= µ2 (α) Courtesy: http://www.cvgs.k12.va.us:81/DIGSTATS/main/inferant/d_tdist.htm
Results • Go to JMP • Test for normality – R_mean • Hypothesis testing for R_mean and Yield • Process capability, CpK
Conclusions • Is the new material better than the old material? Based on comparison criteria Y or N? • What if the new material costs 20% less? • What if the new material costs 20% more?