290 likes | 420 Views
This protocol outlines the advanced techniques used in atomic force microscopy (AFM) for analyzing CD surfaces and calibration gratings. It includes steps for lowering cantilevers, positioning lasers, and selecting cantilevers with the appropriate stiffness. The procedure emphasizes the importance of fine-tuning laser locations and monitoring photodetector voltage for accurate data collection. With a focus on practical tips and troubleshooting (including manual reference), this guide showcases the meticulous process required to observe and analyze the pits and lands of a CD.
E N D
Positioning the laser on the reflective surface of the cantilever
Discussing how the cantilever interacts with the sample surface
Tyree finally gets the laser aimed at the right spot on the cantilever.
Watching the AFM scan the surface of the calibration grating
Pipetting sodium hydroxide to dissolve the label and acrylic layers
Using duct tape to remove the label, acrylic and reflective layers
Tyree has sacrificed part of his Celine Dion collection to science.