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Advanced AFM Techniques for Analyzing CD Surfaces and Calibration Gratings

This protocol outlines the advanced techniques used in atomic force microscopy (AFM) for analyzing CD surfaces and calibration gratings. It includes steps for lowering cantilevers, positioning lasers, and selecting cantilevers with the appropriate stiffness. The procedure emphasizes the importance of fine-tuning laser locations and monitoring photodetector voltage for accurate data collection. With a focus on practical tips and troubleshooting (including manual reference), this guide showcases the meticulous process required to observe and analyze the pits and lands of a CD.

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Advanced AFM Techniques for Analyzing CD Surfaces and Calibration Gratings

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