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Modules Produced With Low R int Sensors. Anthony Affolder UCSB. Modules Produced with low R int sensors. 5 modules were produced with a set of 10 sensors with low interstrip resistances 5036 (Sensors 32016112, 32016113) Depletion Voltage 168 V 5041 (Sensors 32016111, 32016101)

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Modules Produced With Low R int Sensors


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modules produced with low r int sensors1
Modules Produced with low Rint sensors
  • 5 modules were produced with a set of 10 sensors with low interstrip resistances
    • 5036 (Sensors 32016112, 32016113)
      • Depletion Voltage 168 V
    • 5041 (Sensors 32016111, 32016101)
      • Depletion Voltage 173 V
    • 5077 (Sensors 32016114, 32016103)
      • Depletion Voltage 150 V
    • 5187 (Sensors 32016120, 32016117)
      • Depletion Voltage 166 V
    • 5100 (Sensors 33600223, 33215723)
      • Depletion Voltage 296 V
what we can not measure
What we can(not) measure
  • With the ARCS system, we can measure the isolation of the strips only through noise and calibration injection
    • Mostly a measure of the load capacitance on the channel
  • We do not have the tools to measure other quantities which would be very important to the determination if these sensors are usable
    • Cannot measure Rint vs V to know to what severity that the sensors have this problem
    • Cannot measure the charge collection efficiency, charge sharing, and single hit resolution with tools at UCSB
      • Need a pinpoint penetrating laser/source scan
results i
Results (I)
  • With the previous caveats, all 5 modules look identical to other 10 modules made that day with unaffected sensors at 400 V bias voltage
  • For the four modules with the low depletion voltage (150-180 V), the modules showed regular noise response at the 10% level with a bias voltage as low as 20 V
    • In order to make a more strong statement, Rint vs. bias voltage has to be known at low bias voltages
    • At such low voltages in becomes difficult to distinguish between under-depletion and Rint effects
result ii
Result (II)
  • For module 5100, a noise source on order of the same size as the other noise source can be seen on second half of module until 150 V bias applied
    • Since sensors have a depletion voltage of 300V, it is not possible with this measurement to know if increase noise is due to Rint effects or under-depletion
  • To disentangle the two effects, measurements of signal are needed
    • Laser/source/beam
conclusions
Conclusions
  • 5 modules using low Rint sensors for Pisa have been built
  • All 5 modules show regular performance in tests possible at 400 V
  • 4 of the modules show regular noise down to 20 V
  • 1 module shows increased noise up to 150 bias voltage
    • Not clear if it is Rint or under depletion effect
  • Karlsruhe has agreed to perform laser/source scans on modules 5100 and 5187 in order to address this issue and issues of charge sharing, hit resolution, etc.