h w becker nupecc small scale facilities workshop 7 8 sep 2007 n.
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H.-W. Becker, NUPECC Small Scale Facilities workshop, 7./8. Sep. 2007 PowerPoint Presentation
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H.-W. Becker, NUPECC Small Scale Facilities workshop, 7./8. Sep. 2007
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  1. Activities and Opportunities at the accelerator lab in Bochum H.-W. Becker, NUPECC Small Scale Facilities workshop, 7./8. Sep. 2007

  2. Experiment – 12C(,)16O BochumRecoil Mass Separator ERNA Sputter Ion Source I20 pµA 4MV DynamitronTandem Accelerator RUB Recoil Focussing 4He Gas target E-E Telescope magnetic Quadrupols Wien-Filter Doublett Triplett Analysing magnet Singlett Ion beam Purification Wien-Filter Wien-Filter Side FC 60° Dipol magnet Wien-Filter Recoil Separation

  3. Experiment – 12C(,)16O BochumRecoil Mass Separator ERNA – Results DRAGON TRIUMF Matei et al. PRL 97 (2006) 242503 R-Matrix calculation Kunz et al. Ap.J. 567 (2002) 643 new complete R matrix calculation E1/E2 Data Stuttgart-Exp. Fey et al. (to be published) Karlsruhe BaF2-Ball

  4. Astrophysics with the Summing Crystal  4p-Geometry – summing over angular distribution  summing over cascades: Example: 88Sr(p,g)89Y (important for p-process) 88Sr(NO3)2-Target

  5. “seed “ abundances s process reaction network p-nuclei abundances p process The game of understanding p-process abundances Results: A. Spyrou, H.-W. Becker, A. Lagoyannis, S. Harissopulos and C. Rolfs, Phys. Rev. C, in print

  6. High Resolution Depth Profiling with Low Energy Nuclear Resonances: Lewis-peak 500 kV machine Ep = 417 keV Resonance in 29Si 1 nm beam resolution: 30-40 eV total resolution ~ 70 eV (mainly doppler broadening) 20 eV stability:

  7. Investigation of Diffusion Processes in Minerals Olivin (Fe,Mg)2SiO4 native sample artificial layer enriched in 29Si (PLD)

  8. High Energy Ion Projection field strength: 14 T MxE product: 100 MeV u/q2 demagnification: 15 mask area: Ø 30 mm resolution (PMMA): 0.3 m (0.6 MeV Si)

  9. 10 µm 103 N 104 N 105 N Nitrogen -Vacancy (NV)center fabrication in type IIa diamond 2 MeV N implantation + annealing Approx. 1-2 N iones/ N-V defect Meijer et al. APL 87 (2005)