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This design project focuses on creating a high-speed 200MHz absolute-value detector using innovative circuit topology and static CMOS style to achieve fast performance with moderate area usage. The critical path analysis, design optimization, and layout considerations are highlighted to showcase the efficient design approach. Three key features of the design are minimal delay, highly regular layout, and optimized logic for reduced area. Potential improvements include changing the circuit topology for better performance.
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A 200MHz <insert E #>pJ6-bit Absolute-Value Detector Name 1 Name 2
Design Summary • A) Circuit topology, B) Circuit Style(e.g. Ripple –carry Adder + Comparator, static CMOS) • C) WHY: about Area, about Delay, other(e.g. moderate Area, fast, regular design) Note: tp = max {All Inputs Out} Area (A) = X[µm] × Y[µm] *Replace [] with your numbers: e.g. tp = 2ns etc. EE115C – Winter 2013
Critical Path Analysis • Highlight critical path • block diagram of design / crit-path delay equation SAMPLE EE115C – Winter 2013
Design Optimization • Gate level critical path • MOS detail of gates, optimizations, and sizing strategy 0.96 P0 0.96 P1 0.96 P6 0.96 T-Gate S7 1.44 1.44 1.44 Ci P7 0.96 G0 G6 G1 0.96/ 0.48 3.84/ 1.92 SAMPLE 0.48 0.48 0.48 CLKB 0.48 • Propagate Carry instead of Carry to reduce transistor count along Manchester chain • NMOS only pass gate as all Carry nodes are pre-charged to VDD at CLK=0 • Dynamic logic in Ci inverter and G0:7 AND gates footless Domino in Manchester chain • Generate CO and Sum to incorporate the 4X buffer in signal chain. EE115C – Winter 2013
Functionality Check • Relevant waveforms (3 most critical input to output paths) SAMPLE EE115C – Winter 2013
Absolute-Value Detector Layout Highlight critical path 2 INPUT BUFFER INPUT BUFFER 3 Indicate size FA0 FA1 FA2 FA3 Y = 38.3mm SAMPLE X = 33.0mm OUTPUT BUFFER OUTPUT BUFFER 1 CLOCK CHAIN Show layout 4 OUTPUT BUFFER OUTPUT BUFFER AR, Area Aspect ratio: 1.16 Area: 1467mm2 FA7 FA6 FA5 FA4 (6) Anything else Density: 85% INPUT BUFFER INPUT BUFFER 5 EE115C – Winter 2013
Discussion • Three most important features of your design • (e.g. Minimum delay through transistors sizing) • (e.g. Highly regular layout design made easy to route) • (e.g. Logic optimization strategy for reduced area) • Given another chance, 3 things you would do different • (e.g. Change topology, because…) • (e.g. Optimize only last few stages to save design time) • (e.g. Nothing, I nailed it down! ;)) Any additional slides will NOT be graded EE115C – Winter 2013