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Static Event Health Monitoring A Capability Improvement Program. Tom Odom VCD Technologies San Dimas, California. Topics. History of the Technology Magneto-Optics Prototype ExMOD Detectors Detector Fabrication Proposed Technology Improvements Risk Analysis & Mitigation Conclusions.

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static event health monitoring a capability improvement program

Static Event Health MonitoringA Capability Improvement Program

Tom Odom

VCD Technologies

San Dimas, California

topics
Topics
  • History of the Technology
  • Magneto-Optics
  • Prototype ExMOD Detectors
  • Detector Fabrication
  • Proposed Technology Improvements
  • Risk Analysis & Mitigation
  • Conclusions
history of the technology
History of the technology
  • Bubble Memories
    • Developed in the 1970’s as an alternative to magnetic tape data storage
    • Photo lithographically defined magnetic domains on a single crystal wafer.
    • Used Large Scale Integration processes developed for the semiconductor industry
  • Light Modulation Devices
    • Developed for Military applications in the 1980’s.
    • Used Single Crystal Magneto-Optic wafers to modulate light in nano-second time frames.
    • Missile tracking applications
    • Image Projection
  • Magneto-Optic Static Event Detectors (MOSED)
history of the technology continued
History of the technology, (continued)

Switched pixel

  • Magneto-Optic Static Event Detectors (MOSED)
    • Invented and demonstrated in 1990’s
    • Created to aid in the detection of ESD events.
    • Magnetic fields created by the ESD transient changes the properties of the Magneto-Optic thin film deposited on a single crystal substrate
    • Devices can be remotely reset
    • Effect is observed using a polarizing microscope

Un-Switched pixel

magneto optics
Magneto-Optics
  • Magneto-Optic Effects
    • Kerr Effect for Magneto-Optic Recording
    • Faraday Effect for Light Modulation and memory devices
        • Also known as the Magneto-Optic Effect, was the first experimental evidence that light and magnetism are related
        • Result of ferromagnetic resonance in association with a magnetic field
        • Resonance causes waves to be decomposed into circularly polarized rays which propagate at different speeds (circular birefringence)
        • Upon re-combining, owing to the differences in propagation speed, a net phase offset and a resulting rotation of the angle of linear polarization results.
magneto optics continued
Magneto-Optics, (continued)
  • A magnetic field, caused by ESD transient, Changes the way light is polarized in the M-O Material
  • Polarization changes are permanent until device is externally reset
  • Effect is observed using a polarizing microscope
prototype exmod detectors
Prototype ExMOD Detectors

TO-5 packaged Detector

  • Manufactured from Prototype Magneto-Optic wafers
  • Uses mature Semiconductor wafer processing techniques and materials

0.030

3.00

Over 6000 die can be produced from a 3 inch diameter wafer

0.020

detector fabrication
Detector Fabrication
  • M-O Thin film is grown over non magnetic substrate wafer
  • Wafer is patterned and etched in the sequences shown below
  • M-O devices are characterized and tested to determine electro-optic performance
prototype detectors advantages of the old technology
Prototype DetectorsAdvantages of the old Technology
  • Resettable: The device can be reset as many times as desired so long as the current remains below protection level.
  • Static Memory: The device remains permanently switched after an ESD event until reset. Alternatively, the device can be observed continuously to record the time and threshold of the event.
  • Small Size: The die can be as small as 500mm x 750mm.
  • External Readout: The device can be read without physical contact, using a polarizing microscope/optical system.
  • External Reset: The sensing device can be reset with an external non-contact device.
  • Solid State: Operates at extreme temperatures and environments.
  • Fast Switching: Provides discharge detection of fast ESD pulses generated by HBM, CDM, and MM events.
  • Polarity Sensitivity: If required, the device can distinguish the polarity of the ESD event.
  • Sensitivity Levels: High or low threshold devices will be available.
  • Pulse Resolution: Current devices can detect ESD events down to 300mA.
  • Custom Configuration: Available for customer specific applications with associated engineering development.
prototype detectors disadvantages of the old technology
Prototype DetectorsDisadvantages of the old Technology
  • Difficult to view
    • Expensive microscopes are required to view the event
    • Dual Polarizer analyzers required
  • Difficult for customer to Assemble
  • High Cost of Fabrication at low volume
  • Customer acceptance of new technology
proposed technology improvements for ctma ncms cost share
Proposed Technology Improvements for CTMA / NCMS Cost share
  • Detector Device Improvements
    • Replace multi-domain detector (14 individual sensors) with a single, active, domain
    • Add a redundant domain for Readout verification

Increase domain size to increase readout signal strength and simplification

Active Domain

Redundant domain

proposed technology improvements for ctma ncms cost share1
Proposed Technology Improvements for CTMA / NCMS Cost share

Alternative Two Cell Structure to discriminate polarity

proposed technology improvements for ctma ncms cost share2
Proposed Technology Improvements for CTMA / NCMS Cost share

Readout Reset Device Improvements

Replace the polarizing microscope with an autonomous reader.

The new reader will consist of the following components & subsystems

  • Polarized light source
  • Magnifier
  • Charge coupled device (CCD) camera or other sensing device
  • Optical elements that cross polarize incoming and reflected light
  • Processor
  • Result indicator

To read the MOSED, a Reader is placed above and in proximity to the MOSED to determine its state of polarization

To reset the device , a permanent or electro-magnet device is integrated with the readout device

Example of Readout Device concept

risk analysis mitigation
Risk Analysis & Mitigation
  • Multiple Deliveries
    • MOSED Device in discrete package
    • Static Sensitive Test devices integrated with the new SED to characterize performance
    • Multiple threshold devices for wide range of ESD sensitive devices
  • Diverse Applications
    • Surge Suppression device will be co-developed
      • Use state-of-the-art surge suppression technology
      • Couple with MOSED to identify existence of surge
  • Government Review and Concurrence throughout development cycle
    • Multiple workshops to obtain government input
    • Reduces risk of redesign to meet user needs
conclusions
Conclusions
  • Detection of ESD events can benefit the life cycle of electronic devices
    • Manufacturers can improve on processes that historically have damaged, destroyed or degrade devices.
    • End users can improve their handling of ESD sensitive devices, resulting in improved reliability in the field.
    • Depot repair facilities can improve their ability to minimize field returns thereby providing added value to their repair/replacement functions.
  • The Existing MOSED technology can be improved to overcome deficiencies in a risk-controlled CTMA cost share development program
    • Provides Government and industry users with cost effective tools necessary to detect, analyze and control ESD events
    • Dual Use technology improvements will result in significant cost savings for government and industry.