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Piotr Bielówka

Industrial GEM production at Techtra. Piotr Bielówka. ul. Muchoborska 18 PL 54-424 Wrocław Phone: +48 71 798 5885 Phone/Fax. +48 71 798 5886 E -mail: techtra@techtra.pl www.techtra.pl. 22 nd Nov, 2011, RD51. Introduction Micro-Chemical-Vias technology Gem technology

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Piotr Bielówka

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  1. Industrial GEM production at Techtra. PiotrBielówka ul. Muchoborska 18 PL 54-424 Wrocław Phone: +48 71 798 5885 Phone/Fax. +48 71 798 5886 E-mail: techtra@techtra.pl www.techtra.pl 22nd Nov, 2011, RD51

  2. Introduction Micro-Chemical-Vias technology Gem technology Gem-Vievdetector for NDT 22nd Nov, 2011, RD51 Wroclaw Technology Park

  3. „Microvia Technology” licence (2002) Technology sutaible for: • Multilayer PCB • GEM foils 22nd Nov, 2011, RD51 Eldos site

  4. Kapton processing machinery + + = MCV production line based on CERN technology 22nd Nov, 2011, RD51

  5. Vias cleaning machinery Single-jet acid etching bath, CERN. Multi-jet acid etching bath, Techtra

  6. MCV test board Problemswith MCV (ELDOS): Unknown technology Denseacid spray needed Flexiblefoil 22nd Nov, 2011, RD51

  7. „Use of GEM Technology” licence (2004) GEM foil, CERN. 22nd Nov, 2011, RD51

  8. Photolithography machines set in Techtra Kapton etching device moved from Eldos to WPT. PCB laminator Exposure Unit 22nd Nov, 2011, RD51

  9. First GEMs made by Techtra. GEM Vias. magnification of 200x GEM Vias. magnification of 500x 100x100 mm framed GEM 22nd Nov, 2011, RD51

  10. Quality: optical and electrical tests. Geometry inspection 22nd Nov, 2011, RD51

  11. GEM cross section: Techtra GEM test results and a double Gaussian. ProblemswithGEMs (Techtra): Limited market for foils. No industrial application. 22nd Nov, 2011, RD51

  12. „Manufacturing and commercialization of GEM and GEM-Based products” (2009) GEM radiograph, CERN 22nd Nov, 2011, RD51

  13. Towards the „GEM-View” detector GEM implementation The very first prototype 22nd Nov, 2011, RD51

  14. GEM-VIEW: Direct Data Radiodetector dedicated to Non-Destructive Testing Commercially available: GEM-VIEW DDR detector, TTA Techtra. 22nd Nov, 2011, RD51

  15. In comparision with the existing solutions, the main advantages of the GEM-VIEW include: • resistance to ageing effects • on-line operation • high resolution • universal applications • low costs 22nd Nov, 2011, RD51

  16. Radiographs made with GEM-VIEW

  17. Plans for the future: • improving „GEM-View” technology • ”single mask” technology • large GEM foils TTA Techtra Sp. z o.o. ul. Muchoborska 18 PL 54-424 Wrocław Tel. +48 71 7985885 Web: www.techtra.pl E-mail: techtra@techtra.pl Thank you foryour attention 22nd Nov, 2011, RD51

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