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Monitoring and Correction of Background Parameters in K± Events

A procedure to monitor background parameters for K± events in data and MC samples to ensure accurate tracking performance. Details include probability and shape of spurious hits, correction factors, and impact on tracking efficiency. Analysis of data and MC samples to study parameter effects on efficiency, trajectory, and momentum distributions.

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Monitoring and Correction of Background Parameters in K± Events

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  1. background parametrization of the K+- events Erika, Roberto, Vincenzo, Patrizia  different tracking performance for the K± events in the data and MC samples 4/11/06 P. de Simone

  2. a procedure runs to monitor the bck parameters each 1 pb-1 (probability and shape of the “spurious” hits around the RECONSTRUCTED K± tracks of double tagged Km2 events .. we expect a correction factor) remind … • Probbck-hits (layer 1 -> 12) • Probbck-1hit (layer 1 ->12) • Probbck-2hits (layer 1->12) • Dcellsbck-hit ± sDcells (layer 1->12) • Tshift ± sTshift • 2002 background parameters in DB2 • 2005 background parameters … in production • SIMKBCK  adds the bck hits in the MC hits list of the DHIT bank • “home-made” reconstruction of  20pb-1 of 2002 MC events to study IF and HOW this new background parametrization affects the MC efficiency 4/11/06 P. de Simone

  3. data sample MC sample rxy (cm) t (ns) data sample MC sample + SIMKBCK t (ns) rxy (cm) rxy vertex and t K± distributions they are affected by the K± tracking efficiency shorter is the kaon path lower is the efficiency multiply Probbck-hits by 2 … 3 … … 5 !!!! 4/11/06 P. de Simone

  4. data sample MC sample p (MeV) p (MeV) data sample MC sample + SIMKBCK p (MeV) p (MeV) pK±and psec distributions the bck parametrization does not affect in a significant way these distributions pK± psec 4/11/06 P. de Simone

  5. data sample MC sample + SIMKBCK data sample MC sample p (MeV) p (MeV) p (MeV) p*sec distribution the bck parametrization does not affect in a significant way this distribution p (MeV) 4/11/06 P. de Simone

  6. data sample MC sample + SIMKBCK t (ns) t (ns) etrk+vtx as a function of tK± 4/11/06 P. de Simone

  7. data sample MC sample + SIMKBCK data sample MC sample r (cm) r (cm) r (cm) r (cm) etrk+vtx as a function of rxy 4/11/06 P. de Simone

  8. next … • 2005 background parameters … in production • “home-made” reconstruction of  5 pb-1 of 2005 MC events  ready to determine the correction factor • we are confident to be ready for the 2005 MC production • .. but .. we need also .. a new production of the 2002 MC sample 4/11/06 P. de Simone

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