PDF-4. Integral Index. A similarity index for comparing diffraction patterns. This presentation is best viewed in Slide Show Mode. Note. What is the Integral Index?.
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A similarity index for comparing diffraction patterns
The first step in utilizing the Integral Index method is to create search criteria based on non-whole pattern data. This effectively narrows down the entire database into a more meaningful form.
ICDD 742 101,810
ICSD-FIZ 70,447 317
NIST 4,952 171
LPF 106,963 0
Since database patterns have been processed to eliminate background and noise, the same needs to be done to the experimental data.
Two functions are provided to accomplish this:
Smooth noisy patterns for consistent results.
Remove background noise and air
scatter for more accurate peaks.
Use Preview to view peaks and the graph’s Zoom feature to correctly identify peaks.
Select OK to complete the processing of the full pattern and calculate Integral Indexes.
Get the most out of the data by using other tools and features:
Compare sets of data to determine patterns and attributes of your results.
Right-click on any field and select graph fields…
Print a report using the menu on the results form or click on the printer icon.
Using the results form menu, or by right clicking on an entry, you can display a graph overlaying the selected pattern over the experimental pattern.
Determine the experiment’s range and set the range accordingly to correctly display diffraction graphs.
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