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Asia-Pacific EMC-Week in Singapore, May 2008. IC-EMC a Demonstration Freeware for Predicting Electromagnetic Compatibility of Integrated Circuits. Alexandre BOYER, Etienne SICARD alexandre.boyer@insa-toulouse.fr http://www.ic-emc.org. Credits. European project MEDEA+ “Parachute” (2005-2007)

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ic emc a demonstration freeware for predicting electromagnetic compatibility of integrated circuits

Asia-Pacific EMC-Week in Singapore, May 2008

IC-EMC a Demonstration Freeware for Predicting Electromagnetic Compatibility of Integrated Circuits

Alexandre BOYER, Etienne SICARD

alexandre.boyer@insa-toulouse.fr

http://www.ic-emc.org

slide2

Credits

  • European project MEDEA+ “Parachute” (2005-2007)
  • European project PIDEA+ “EMCPack” (2006-2008)
  • National project EPEA (2007 – 2010)
summary
Summary

1. EMC of IC issues

2. What is IC-EMC

3. IBIS interface

4. Emission Prediction

5. Near Field Prediction

6. Susceptibility Prediction

7. Conclusion

1 emc of ic issues

Tools

Training

Design Guidelines

1. EMC of IC Issues

EMC validated before fabrication

IC-EMC

DESIGN

Architectural

Design

Design Entry

Design Architect

EMC Simulations

Compliance ?

FABRICATION

NO GO

EMC compliant

GO

2 what is ic emc
2. What is IC-EMC

Why is it free?

  • Developed within projects like MEDEA+ “Parachute” (2005-2007), PIDEA+ EMCPack (2006-2008), EPEA (2007-2010)
  • Promotes and defends the “European” vision of EMC of ICs
  • Trainings in industry and university

Why is it non-confidential?

  • Standard-based tool : IBIS (IEC 62014-1), ICEM (IEC 62014-3), ICIM (IEC 62433-4),
  • Integrated Circuit parameters & models from ITRS roadmap
  • Demonstrator for industrial
2 what is ic emc1
2. What is IC-EMC

A demonstrator for predicting EMC of integrated circuits

  • A simple tool dedicated to predict EMC of ICs
    • An electric circuit schematic editor
    • An interface to WinSpice analog simulator
    • A set of post-processing tools
  • A library of EMC/IC elements
  • A set of EMC-related goodies
slide7

Post-processing tools

Spice Simulation

Near-field simulation

Impedance simulation

Main analysis

Spectrum analysis

Immunity simulation

IBIS interface

2. What is IC-EMC

Electric circuit schematic editor

IC, package and PCB model

Basic symbols

slide8

I/O model display

IBIS file editor

Package viewer

3. IBIS Interface

I/O Buffer Information Specification file editor

Very important for :

  • I/O emission prediction
  • I/O immunity prediction
slide9

R, L, C extraction

3. IBIS Interface

Package parasitic evaluation

4 emission prediction

Near-field emission

Conducted emission 1/150 

Radiated emission GTEM

4. Emission Prediction

Target measurement methods (IEC 61967)

  • Predict conducted mode, radiated and near-field emission
  • Non-confidential and based on standards (ICEM model – IEC 62433-2)
  • Targeted range : 1 MHz – 10 GHz
  • Mature handling of emission prediction in IC-EMC
4 emission prediction1
4. Emission Prediction

Emission spectrum prediction

Simulation

Measurements

Core

Model

Package

Model

Probe

Model

Test board

Model

Frequency

measurements

Time-domain

measure

Analog Time Domain Simulation

Fourier Transform

Fourier Transform

Compare dBµV vs. Frequency

4 emission prediction2

dBµV

  • Emission spectrum

measurement

simulation

MHz

4. Emission Prediction

Emission spectrum analysis

ICEM model

slide13

IBIS

IC size

Pin location

Measurements

Lead inductances

Electrical schematic

Near field scan at a given frequency and altitude

R,L,C

Tuning

Fourier Transform of I(t)

IC-EMC

H[x,y,z] of I(f)

Scan Measurement/Simulation

5. Near-field Prediction

LeadPlacement

PackageRLC

Core noiseModel (ICEM)

Time domain Simulation

WinSPICE

slide14

Measurement

Simulation

16 bit microcontroller

-15.2

-16.1

-8.2

-8.6

-9.3

-8.1

5. Near-field Prediction

ICEM model

6 susceptibility prediction
6. Susceptibility Prediction

Target measurement methods (IEC 62132)

Radiated immunity in GTEM

Direct Power Injection

Near-field Immunity

  • Only for harmonic disturbances, not for transient immunity
  • Predict conducted, radiated mode and near-field susceptibility
  • Non-confidential and based on standards (IBIS, ICIM)
  • Targeted range : 1 MHz – 10 GHz
slide16

Aggressed IC

Model (ICEM)

Package

and IO model (IBIS)

RFI and coupling path model (Z(f))

Set RFI frequency

IC-EMC

Increase V aggressor

WinSPICE

Increase RFI frequency

Time domain simulation

Susceptibility threshold simulation

Criterion analysis

IC-EMC

Extract forward power

6. Susceptibility Prediction

Susceptibility simulation flow

6 susceptibility prediction1

DPI on IO model

16 bit microcontroller

simulation

measurement

Susceptibility threshold simulation

6. Susceptibility Prediction
slide18

7. Conclusion

  • An environment for EMC prediction at IC level and trainings has been developed
  • The tool is free and is based on standard
  • Conducted and radiated emission successfully predicted on several ICs
  • Conducted susceptibility successfully predicted on several ICs
  • Positive feedback from trainees concerning the tool usage for the illustration of EMC concepts (80 – 90 % satisfaction rate)
  • The demonstration tool and manual are online at www.ic-emc.org
slide19

Publications

  • E. Sicard "Issues in Electromagnetic Compatibility of integrated circuits: Emission and Susceptibility", in Microelectronics Reliability, Volume 45, Issues 9-11 , September-November 2005, Pages 1277-1284
  • S. Bendhia, M. Ramdani, E. Sicard, Electromagnetic Compatibility of Integrated Circuits, book published by Springer, Dec. 2005, 0-387-26600-3
  • E. Sicard, G. Peres "A Novel Software Environment for Predicting the Parasitic Emission of Integrated Circuits", proceedings of EMC Compo 05, Munich, Nov. 28-30, 2005
  • E. Sicard, "IC-EMC, a software for analysing EMC of integrated circuits", 2005 IEEE EMC Symposium, 8-12 Aug @ Navy Pier in Chicago, Computer demonstration session.
  • A. Boyer, S. Bendhia, E. Sicard, “Modeling of a Mixed Signal Processor Susceptibility to Near-Field Aggression”, proceedings of the IEEE International Symposium on EMC, Hawaii, Jul 2007.
  • A. Boyer, M. Fer, L. courau, E. Sicard, “Modeling of the Susceptibility of 90 nm Input Output Buffer”, Asia Pacific EMC Week in Singapore, May 2008