1 / 49

Algorithms for emittance evaluation

Algorithms for emittance evaluation. Emittance measurements. Slit-grid devices. Trusted method Wire current resolution 1pA Integration time 1us..Nsec Spatial resolution ~100um Measurement time minutes. Slit-grid control software. Pepper-pot measurements without scintillating screen.

gayora
Download Presentation

Algorithms for emittance evaluation

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Algorithms for emittance evaluation

  2. Emittance measurements

  3. Slit-grid devices • Trusted method • Wire current resolution 1pA • Integration time 1us..Nsec • Spatial resolution ~100um • Measurement time minutes

  4. Slit-grid control software

  5. Pepper-pot measurements without scintillating screen

  6. Use of optical registration

  7. An example of optimal resolution ratio for single shot operation

  8. Dedicated algorithms and outputs

  9. Scattering effects in screens, holes and slits

  10. Pepper-pot calibration • Pinhole effective radius calibration • Estimation of the light scattering effect in the screen • Pinholes zero position calibration with low-emittance light beam

  11. Use of multiple profile monitors

  12. Use of variable quadrupole strengths

  13. Longitudinal emittance measurements Timo Milosic. Thursday. 10:50

  14. Ellipses and linear optics

  15. Canonical distributions

  16. Universal algorithms • Mostly exist for two-dimensional phase space • Applicable for any measurement type • Data transformation: applying of linear optics element, resampling etc. • Noise and fraction reduction • Data healing tools • 2-D emittance calculation

  17. Use of KV-plane for the emittance estimation

  18. Use of statistical momentums

  19. Use of optimal fitting methods

  20. Use of parametric data fit

  21. A comparison of different methods

  22. Errors estimation • Noise added to the data value • Errors due to the model simplification • Limitation of the parameterized model • Limited accuracy of parameters of involved beam optics elements • Non-ideal registration equipment (non-linearity, aberrations, cross talk,… )

  23. Typical output of the emittance evaluation results

  24. Typical preliminary data evaluation in 2-D space

  25. An example of an interactive tool for 2-D emittance evaluation

  26. Few nice output plots which good to have for report and publications • For standalone applications – OpenGL primitives library • To save some time one may use TeeChart • Tools based on MATLAB or MathCAD could be easily adapted to any new ideas. License cost is critical.

  27. Typical preliminary data evaluatin in 2-D space

  28. A data manipulation possibilities are always demanded

  29. The basic evaluation uses only first order integration algorithms Main calculations in EmitView are executed on the data matrix. Each element of this matrix owned an elementary current. In the assumption that the current density is uniformly distributed on the surface of elementary cell, this current is equal to product Ii,k=Ji,k*dx*dy. Where J is the current density in the phase space coordinates. Thresholds and KV levels are defined as a percentage of the maximum elementary current value. Captured current and KV plane are defined as a part of full current, which is sum of all elementary currents. RMS emittance for defined KV level is calculated by formula . Statistical parameters for given formula are calculated for current density weighted elementary cells. Only cells with current higher then KV level are taking into account.

  30. Pepper pot algorithms • Image processing technique • Limited spatial resolution • 4- dimensional phase space

  31. Pepper-pot ‘classical’ data preparation EMITTANCE MEASUREMENTS AT THE NEW UNILAC PRE-STRIPPER USING A PEPPER-POT WITH A PC-CONTROLLED CCD-CAMERA. M.Dolinska et al. DIPAC 1999, Chester. UK.

  32. Noise cancellation

  33. Local spot filtering

  34. Parametric nonlinear data fitting

  35. Image evaluation cycle

  36. Horizontal profile

  37. An example of a heavy ion beam investigation Beam divergence as a function of applied potential 7kV 10kV 14kV

  38. An example of a heavy ion beam investigation(2)

  39. An example of a heavy ion beam investigation(3)

  40. An example of a heavy ion beam investigation(4)

  41. Parametric nonlinear data fitting

More Related