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Alec Stanculescu, Fintronic USA Alex Zamfirescu, ASC MAPLD 2004 September 8-10, 2004

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Alec Stanculescu, Fintronic USA Alex Zamfirescu, ASC MAPLD 2004 September 8-10, 2004 Design Verification Method for Radiation Hardness using Simulation Farms. Fintronic USA. Summary. Problem Addressed Solution Proposed Conclusion

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Presentation Transcript
Alec Stanculescu, Fintronic USA

Alex Zamfirescu, ASC

MAPLD 2004

September 8-10, 2004

Design Verification Method for

Radiation Hardness using

Simulation Farms


Fintronic USA

  • Problem Addressed
  • Solution Proposed
  • Conclusion
  • Proposed Plan
  • Circuits malfunction due to radiations
    • Transient errors may lead to Soft errors if an erroneous data is latched
    • Cumulative effects may lead to permanent ( hard) errors (total dose)
problem addressed
Problem Addressed
  • Reduce the cost of assessing the behavior of very large circuits under different radiation conditions by providing fast feedback to circuit designers regarding:
    • statistics of faults
    • reliability
    • nature of degradation
solution proposed
Solution Proposed
  • Simulate radiation effect by injecting faults in the simulation based on the radiation failure susceptibility of the library cells used
  • Use efficiently a simulation farm
  • Automate the analysis of results
radiation failure susceptibility
Radiation Failure Susceptibility
  • For each cell, for each wire, record
    • <time window> <fault_info_triplet>+
  • <fault_info_triplet> ::=

<p of a given fault-type occurring in the given window>,

<type of fault>,

<p of at most one fault of the given type occurring in the given window>;

where p stands for probability

creation of radiation failure susceptibility data
Creation of Radiation Failure Susceptibility Data
  • Calibration of Simulation
    • High correlation between simulation results and manufactured circuit
  • Calibration Methods
    • Test all cells at various radiation environments
calibration methods
Calibration Methods
  • Fabricate all supported cells on tested chip – selection of tests may affect calibration
  • Use existing circuits for testing
  • Use an un-hardened version of the actual circuit
  • Use transistor susceptibility based on specific measurements
finfarm verilog simulation farm
FinFarm:Verilog Simulation Farm
  • Enables one engineer to manage many simultaneous simulations
    • Network of computers
    • Farming methodology
    • Farming tools
  • Current farms use between 10 and more than 1000 licenses
farming methodology
Farming Methodology
  • Un-partitioned circuits
      • small footprint & 64-bit simulation helps
  • Split stimulus
  • Simultaneous verification of alternative components
  • Program feedback-based verification
farming tools
Farming Tools
  • Perform automated
    • simulation launching
    • simulation queuing
    • collection & reporting of simulation results
    • collection & merging of code coverage results
  • Perform real-time monitoring
  • Perform programmed re-launching of simulations
finfarm usage
FinFarm™ Usage
  • Regression Testing
  • Extensive Exploration of Design Space
      • Evaluation of Reusable IPs
      • Analysis of Design Trade-Offs: Power, Size, Speed and search for optimal solution using feedback loop
  • Radiation Hardening
rad hard simulation
Rad. Hard. Simulation
  • Describing effects on circuit by a given radiation environment, using VCD-F format (VCD fault format)
  • VCD-F Reader injects corresponding faults in simulation
  • Launching simultaneous simulations using simulation farm
  • Collecting and processing results
vcd f format
VCD-F Format
  • VCD IEEE std 1364 results
  • VCD-F specifies random faults, i.e. values are replaced by:
    • Fault types
    • Randomization info
vcd f reader
VCD-F Reader
  • VCD-F Reader injects faults in simulation.
  • Nature of faults: permanent, transient
  • Kind of faults: stuck at, bridging, cross talk, gate rupture, value toggle, timing, etc.
simulation launching
Simulation Launching
  • Save simulations at various check points, just before inserting faults
  • Re-start simulation at latest checkpoint before the injected fault which caused errors
  • Launch simultaneous simulations on FinFarm™
collecting and processing results
Collecting and Processing Results
  • Record results databases
  • Compare Results Databases
  • Isolate circuits containing at least one error, for detailed analysis
  • List of possible fault type
  • Produce reports
summary of solution
Summary of Solution
  • Cells are measured once and results are stored in IEEE standard
  • Use Monte Carlo technique to establish radiation susceptibility of complex ICs using simulation
  • Fast feedback to designers
  • Major cost reduction
proposed plan
Proposed Plan
  • Establish a radiation assessment lab
  • Create oversight task force
    • Government
    • Industry
    • Academia
  • Createstandards for describing
    • Radiation failure susceptibility of cells
    • Distribution of faults in circuits in time