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### EECS 150 - Components and Design Techniques for Digital Systems Lec 26 - WrapUp

David Culler

Electrical Engineering and Computer Sciences

University of California, Berkeley

http://www.eecs.berkeley.edu/~culler

http://inst.eecs.berkeley.edu/~cs150

http://www.youtube.com/watch?v=Tb2Q1GGEYA4

Announcements

- Final Exam
- TUESDAY, DECEMBER 18, 2007 5-8P
- Location: 106 STANLEY
- Course Control Number: 26455
- Final Exam Group: 15
- TA office hours tues AM
- Review Sunday 12/16 5-7 @ 125 Cory
- Project Partner forms into HW box
- Project Presentations Friday as per SignUp
- No lecture thurs, no labs, no discussion
- Office Hours
- HW 10 in box wed

EECS 150, Fa07, Lec 26 - wrap

Recall: Day 1

EECS 150, Fa07, Lec 26 - wrap

Camera (optional)

i50choose

i50talk

notifications

Wireless Network

Internals

Audio

Hand input (limited)

Congratulations- You have accomplished a phenomenal task.

EECS 150, Fa07, Lec 26 - wrap

Deep Digital Design Experience

Fundamentals of Boolean Logic

Synchronous Circuits

Finite State Machines

Timing & Clocking

Device Technology & Implications

Controller Design

Arithmetic Units

Bus Design

Encoding, Framing

Testing, Debugging

Hardware Architecture

HDL, Design Flow (CAD)

Pgm Language

Asm / Machine Lang

CS 61C

Instruction Set Arch

Machine Organization

HDL

FlipFlops

Gates

Circuits

Devices

EE 40

Transistor Physics

Transfer Function

Day 1: What is EECS150 about?EECS 150, Fa07, Lec 26 - wrap

Day 1: We Will Learn in EECS 150 …

- Language of logic design
- Logic optimization, state, timing, CAD tools
- Concept of state in digital systems
- Analogous to variables and program counters in software systems
- Hardware system building
- Datapath + control = digital systems
- Hardware system design methodology
- Hardware description languages: Verilog
- Tools to simulate design behavior: output = function (inputs)
- Logic compilers synthesize hardware blocks of our designs
- Mapping onto programmable hardware (code generation)
- Contrast with software design
- Both map specifications to physical devices
- Both must be flawless …

EECS 150, Fa07, Lec 26 - wrap

Day 26: Ready to tackle ANY digital design

EECS 150, Fa07, Lec 26 - wrap

Tackling complex digital designs

- Step 1: Decompose the system into a collection of subsystems
- Each has top-down requirements and bottom-up constraints
- Interconnected through interfaces
- Often with particular protocols
- Potentially different clock domains
- Rate matching, buffering, timing
- For example…

EECS 150, Fa07, Lec 26 - wrap

CC2420 Clock domain

Network

AC97 Clock domain

For Example- Encodings
- Protocols
- Synchronization
- Commands
- Formats
- Specifications
- Datasheets

Display

Camera (optional)

Video encoder

Audio

Hand input (limited)

EECS 150, Fa07, Lec 26 - wrap

In Each: Datapath and Control

Datapath

Controller

- Datapath: Storage, FU, interconnect sufficient to perform the desired functions
- Inputs are Control Points
- Outputs are signals
- Controller: State machine to orchestrate operation on the data path
- Based on desired function and signals

Control Points

EECS 150, Fa07, Lec 26 - wrap

Tackling complex digital designs

- Step 1: Decompose the system into a collection of subsystems
- Each has top-down requirements and bottom-up constraints
- Interconnected through interfaces
- Often with particular protocols
- Potentially different clock domains
- Rate matching, buffering, timing
- For Each Subsystem
- Step2: Design the Datapath

EECS 150, Fa07, Lec 26 - wrap

A standard high-level representation for describing systems.

It follows from the fact that all synchronous digital system can be described as a set of state elements connected by combination logic (CL) blocks:

RTL comprises a set of register transfers with optional operators as part of the transfer.

Example:

regA regB

regC regA + regB

if (start==1) regA regC

Personal style:

use “;” to separate transfers that occur on separate cycles.

Use “,” to separate transfers that occur on the same cycle.

Example (2 cycles):

regA regB, regB 0;

regC regA;

Register Transfer Level DescriptionsEECS 150, Fa07, Lec 26 - wrap

A Register Transfer

C A

Sel 0; Ld 1

C B

Sel 1; Ld 1

A

B

Sel0

D

E

C

Sel

0

1

Sel1

Bus

Clk

Sel

Ld

Ld

C

Clk

A on Bus

B on Bus

One of potentially many source regs goes on the bus to one or more destination regs

Register transfer on the clock

Ld C

from Bus

?

EECS 150, Fa07, Lec 26 - wrap

MUX

MUX

MUX

rt

rs

rd

R4

rd

rs

R4

rt

R4

rs

rt

rd

MUX

BUS

Register Transfers - interconnect- Point-to-point connection
- Dedicated wires
- Muxes on inputs ofeach register
- Common input from multiplexer
- Load enablesfor each register
- Control signalsfor multiplexer
- Common bus with output enables
- Output enables and loadenables for each register

EECS 150, Fa07, Lec 26 - wrap

CO

ALU

CI

ALU

ALU

CI

AC

AC

AC

rt

R0

rs

rt

rd

rd

rs

rt

rd

R0

rs

R0

frommemory

frommemory

frommemory

Data Path (Bit-slice)- Bit-slice concept: iterate to build n-bit wide datapaths
- Data bit busses run through the slice

1 bit wide

2 bits wide

EECS 150, Fa07, Lec 26 - wrap

Approaching an ISA

Instruction Set Architecture

Defines set of operations, instruction format, hardware supported data types, named storage, addressing modes, sequencing

Meaning of each instruction is described by RTL on architected registers and memory

Given technology constraints assemble adequate datapath

Architected storage mapped to actual storage

Function units to do all the required operations

Possible additional storage (eg. MAR, MBR, …)

Interconnect to move information among regs and FUs

Map each instruction to sequence of RTLs

Collate sequences into symbolic controller STD

Lower symbolic STD to control points

Implement controller

18

EECS 150, Fa07, Lec 26 - wrap

Instruction Types

Data Manipulation

Add, subtract

Increment, decrement

Multiply

Shift, rotate

Immediate operands

Data Staging

Load/store data to/from memory

Register-to-register move

Control

Conditional/unconditional branches in program flow

Subroutine call and return

19

EECS 150, Fa07, Lec 26 - wrap

Hardware Necessary To Implement Instructions

Standard FSM Elements

State register

Next-state logic

Output logic (datapath/control signaling)

Moore or synchronous Mealy machine to avoid loops unbroken by FF

Plus Additional ”Control" Registers (in DP)

Instruction register (IR)

Program counter (PC)

Inputs/Outputs

Outputs control elements of data path

Inputs from data path used to alter flow of program (test if zero)

20

EECS 150, Fa07, Lec 26 - wrap

FSM Controller for CPU

Putting it all togetherand closing the loop

the famousinstructionfetchdecodeexecutecycle

reset

instructionfetch

Fetch

instructiondecode

Decode

add

instructionexecution

add

21

EECS 150, Fa07, Lec 26 - wrap

Representing Numbers

- What can be represented in N bits?
- 2N distinct symbols => values
- Unsigned 0 to 2N - 1
- 2s Complement -2(N-1) to 2(N-1) - 1
- ASCII -10(N/8-2) - 1 to 10(N/8-1) - 1
- But, what about?
- Very large numbers? (seconds/century) 3,155,760,000ten (3.15576ten x 109)
- Very small numbers? (secs/ nanosecond) 0.000000001ten (1.0ten x 10-9)
- Bohr radius 0.000000000052917710m (5.2917710 x 10-11)
- Rationals 2/3 (0.666666666. . .)
- Irrationals 21/2 (1.414213562373. . .)
- Transcendentals e (2.718...), π (3.141...)

EECS 150, Fa07, Lec 26 - wrap

2s Complement Overflow

How can you tell an overflow occurred?

Add two positive numbers to get a negative number

or two negative numbers to get a positive number

-1

-1

+0

+0

-2

-2

1111

0000

+1

1111

0000

+1

1110

1110

0001

0001

-3

-3

+2

+2

1101

1101

0010

0010

-4

-4

1100

+3

1100

+3

0011

0011

-5

-5

1011

1011

0100

+4

0100

+4

1010

1010

-6

-6

0101

0101

+5

+5

1001

1001

0110

0110

-7

-7

+6

+6

1000

0111

1000

0111

-8

-8

+7

+7

-7 - 2 = +7!

5 + 3 = -8!

EECS 150, Fa07, Lec 26 - wrap

Computer Arithmetic

- Circuit design for unsigned addition
- Full adder per bit slice
- Delay limited by Carry Propagation
- Ripple is algorithmically slow, but wires are short
- Carry select
- Simple, resource-intensive
- Excellent layout
- Carry look-ahead
- Excellent asymptotic behavior
- Great at the board level, but wire length effects are significant on chip
- Digital number systems
- How to represent negative numbers
- Simple operations
- Clean algorithmic properties
- 2s complement is most widely used
- Circuit for unsigned arithmetic
- Subtract by complement and carry in
- Overflow when cin xor cout of sign-bit is 1

EECS 150, Fa07, Lec 26 - wrap

Combinational Multiplier: accumulation of partial products

A1

B1

A1 B0

A0 B1

A0

B0

A0 B0

A3

B3

A2 B0

A2 B1

A1 B2

A0 B3

A2

B2

A2 B0

A1 B1

A0 B2

A3 B1

A2 B2

A1 B3

A3 B3

A3 B2

A2 B3

S7

S6

S4

S5

S3

S2

S1

S0

EECS 150, Fa07, Lec 26 - wrap

CPA

Another RepresentationBuilding block: full adder + and

4 x 4 array of building blocks

EECS 150, Fa07, Lec 26 - wrap

Digital Number Systems

- Positional notation
- Dn-1 Dn-2 …D0 represents Dn-1Bn-1 + Dn-2Bn-2 + …+ D0 B0 where Di { 0, …, B-1 }
- 2s Complement
- Dn-1 Dn-2 …D0 represents: - Dn-12n-1 + Dn-22n-2 + …+ D0 20
- MSB has negative weight
- Binary Point is effectively at the far right of the word

-1

+0

-2

1111

0000

+1

1110

0001

-3

+2

1101

0010

-4

1100

+3

0011

-5

1011

0100

+4

0000…

1010

-6

0101

+5

1001

0110

-7

+6

1000

0111

EECS 150, Fa07, Lec 26 - wrap

-8

+7

Circuits for Fixed-Point Arithmetic

- Adders
- identical circuit
- Position of the binary point is entirely in the interpretation
- Be sure the interpretations match
- i.e. binary points line up
- Subtractors
- Multipliers
- Position of the binary point just as you learned by hand
- Mult two n-bit numbers yields 2n-bit result with binary point determined by binary point of the inputs
- 2-k * 2-m = 2-k-m

+

*

EECS 150, Fa07, Lec 26 - wrap

Sb

Ea

Eb

1.Ma

1.Mb

8

8

8

24

24

24

Sr

Er

1.Mr

Let’s build an FP function unit: multCtrl?

*

EECS 150, Fa07, Lec 26 - wrap

Sb

Eb

Ea

1.Ma

1.Mb

8

8

8

24

48

24

48

shifter

inc

?

24

Sr

Er

1.Mr

What is the range of mantissas?Adder(8)

Ctrl?

Multiplier(24)

-127

Unnorm?

Round

EECS 150, Fa07, Lec 26 - wrap

Cascaded Carry Lookahead

4 bit adders with internal carry lookahead

second level carry lookahead unit, extends lookahead to 16 bits

One more level to 64 bits

EECS 150, Fa07, Lec 26 - wrap

BA

30

74

30

74

30

30

BA

Ax

10

BAx

54

54

32

10

76

54

32

76

10

30

10

54

6

0

2

4

0

4

2

1

6

5

3

7

76

54

32

10

74

64

30

20

70

60

50

40

Parallel Prefix (generalizing CLA)- Compute all the prefixes Fi = Fi-1 op Fi-2 op … op F0
- Assume associative and commutative

70

B

A

EECS 150, Fa07, Lec 26 - wrap

Decoder

Word Line

Memory

cell

2n word

lines

what happensif n and/or m isvery large?

n Address

Bits

m Bit Lines

Basic Memory Subsystem Block Diagram- RAM/ROM naming convention:
- 32 X 8, "32 by 8" => 32 8-bit words
- 1M X 1, "1 meg by 1" => 1M 1-bit words

EECS 150, Fa07, Lec 26 - wrap

N

2

words

N

x M bit

SRAM

WE_L

OE_L

D

M

Write

Hold Time

Read Access

Time

Read Access

Time

Write Setup Time

Typical SRAM TimingOE determines direction Hi = Write, Lo = ReadWrites are dangerous! Be careful! Double signaling: OE Hi, WE Lo

Write Timing:

Read Timing:

High Z

D

Data In

Data Out

Data Out

Junk

A

Write Address

Read Address

Read Address

OE_L

WE_L

EECS 150, Fa07, Lec 26 - wrap

DRAM WRITE Timing

RAS_L

CAS_L

WE_L

OE_L

- Every DRAM access begins at:
- The assertion of the RAS_L
- 2 ways to write: early or late v. CAS

A

256K x 8

DRAM

D

9

8

DRAM WR Cycle Time

CAS_L

A

Row Address

Col Address

Junk

Row Address

Col Address

Junk

OE_L

WE_L

D

Junk

Data In

Junk

Data In

Junk

WR Access Time

WR Access Time

Early Wr Cycle: WE_L asserted before CAS_L

Late Wr Cycle: WE_L asserted after CAS_L

EECS 150, Fa07, Lec 26 - wrap

Array

DRAM with Column bufferR

O

W

D

E

C

O

D

E

R

…

11

A0…A10

(2,048 x 2,048)

Storage

W

ord Line

Cell

Sense

Amps

Column Latches

MUX

Pull column into fast buffer storage

Access sequence of bits from there

EECS 150, Fa07, Lec 26 - wrap

Use more parity bits to pinpoint bit(s) in error, so they can be corrected.

Example: Single error correction (SEC) on 4-bit data

use 3 parity bits, with 4-data bits results in 7-bit code word

3 parity bits sufficient to identify any one of 7 code word bits

overlap the assignment of parity bits so that a single error in the 7-bit work can be corrected

Procedure: group parity bits so they correspond to subsets of the 7 bits:

p1 protects bits 1,3,5,7 (bit 1 is on)

p2 protects bits 2,3,6,7 (bit 2 is on)

p3 protects bits 4,5,6,7 (bit 3 is on)

1 2 3 4 5 6 7

p1 p2 d1 p3 d2 d3 d4

Bit position number

001 = 110

011 = 310

101 = 510

111 = 710

010 = 210

011 = 310

110 = 610

111 = 710

100 = 410

101 = 510

110 = 610

111 = 710

p1

p2

p3

Hamming Error Correcting CodeNote: number bits from left to right.

EECS 150, Fa07, Lec 26 - wrap

d2

d3

d4

d5

d6

d7

d8

p4

p2

p1

p3

Example: 8 bit SEC- Takes four parity bits
- In power of 2 positions
- Rest are the data bits
- Bits with i in their address feed into parity calculation for pi
- What to do with bit 0?

1

2

3

4

5

6

7

8

9

10

11

12

+

EECS 150, Fa07, Lec 26 - wrap

Example: Ethernet CRC-32

Application

(HTTP,FTP, DNS)

7

Transport

(TCP, UDP)

4

Network

(IP)

3

Data Link

(Ethernet, 802.11b)

2

Physical

1

EECS 150, Fa07, Lec 26 - wrap

General Model of Synchronous Circuit

- In general, for correct operation:

for all paths.

- How do we enumerate all paths?
- Any circuit input or register output to any register input or circuit output.
- “setup time” for circuit outputs depends on what it connects to
- “clk-Q time” for circuit inputs depends on from where it comes.

T time(clkQ) + time(CL) + time(setup)

T clkQ + CL + setup

EECS 150, Fa07, Lec 26 - wrap

Inverter:

NAND gate:

s

g

d

s

Gate Switching BehaviorWhen does it start? How quickly does it switch?

EECS 150, Fa07, Lec 26 - wrap

Xilinx Virtex-E Floorplan

- Configurable Logic Blocks
- 4-input function gens
- buffers
- flipflop

- Input/Output Blocks
- combinational, latch, and flipflop output
- sampled inputs

- Block RAM
- 4096 bits each
- every 12 CLB columns

EECS 150, Fa07, Lec 26 - wrap

Logic Gate Delay

What are typical delay values?

Delays in flip-flops

Both times contribute to limiting the clock period.

Limitations on Clock Rate- What must happen in one clock cycle for correct operation?
- Assuming perfect clock distribution (all flip-flops see the clock at the same time):
- All signals must be ready and “setup” before rising edge of clock.

EECS 150, Fa07, Lec 26 - wrap

Timing Methodologies

- Rules for interconnecting components and clocks
- Guarantee proper operation of system when strictly followed
- Approach depends on building blocks used for memory elements
- Focus on systems with edge-triggered flip-flops
- Found in programmable logic devices
- Many custom integrated circuits focus on level-sensitive latches
- Basic rules for correct timing:
- (1) Correct inputs, with respect to time, are provided to the flip-flops
- (2) No flip-flop changes state more than once per clocking event

EECS 150, Fa07, Lec 26 - wrap

Construct D flipflop from two D latchesMaster-Slave Structure

clk’

clk

clk

clk’

clk

clk’

clk’

clk

EECS 150, Fa07, Lec 26 - wrap

master stage

R

Q'

R

Q'

P'

R

S

Q

S

Q

S

P

CLK

Master-Slave Structure- Break flow by alternating clocks (like an air-lock)
- Use positive clock to latch inputs into one R-S latch
- Use negative clock to change outputs with another R-S latch
- View pair as one basic unit
- master-slave flip-flop
- twice as much logic
- output changes a few gate delays after the falling edge of clock but does not affect any cascaded flip-flops

CLK

CLK’

EECS 150, Fa07, Lec 26 - wrap

D

0

R

Q

Clk=1

Q’

S

0

D’

D

(neg) Edge-Triggered Flip-Flops- More efficient solution: only 6 gates
- sensitive to inputs only near edge of clock signal (not while high)

holds D' when

clock goes low

negative edge-triggered D flip-flop (D-FF)

4-5 gate delays

must respect setup and hold time constraints to successfullycapture input

holds D whenclock goes low

characteristic equationQ(t+1) = D

EECS 150, Fa07, Lec 26 - wrap

D

Q

Q

a

b

Two-phase non-overlapping clocks- Sequential elements partition into two classes
- phase0 ele’ts feed phase1
- phase1 ele’ts feed phase0
- Approximate single phase: each register replaced by a pair of latches on two phases
- Can push logic across (retiming)
- Can always slow down the clocks to meet all timing constraints

a

b

c/l

clk1

clk-0

in

clk0

clk1

EECS 150, Fa07, Lec 26 - wrap

Tackling complex digital designs

- Step 1: Decompose the system into a collection of subsystems
- Each has top-down requirements and bottom-up constraints
- Interconnected through interfaces
- Often with particular protocols
- Potentially different clock domains
- Rate matching, buffering, timing
- For Each Subsystem
- Step 2: Design the Datapath
- Step 3: Design the Controller

EECS 150, Fa07, Lec 26 - wrap

In Each: Datapath and Control

Datapath

Controller

- Datapath: Storage, FU, interconnect sufficient to perform the desired functions
- Inputs are Control Points
- Outputs are signals
- Controller: State machine to orchestrate operation on the data path
- Based on desired function and signals

Control Points

EECS 150, Fa07, Lec 26 - wrap

Review: Two Kinds of FSMs

- Moore Machine vs Mealy Machine

Output (t) =

G( state(t), Input )

Output (t) = G( state(t))

Input

Input

state

Combinational

Logic

state

state(t+1) = F ( state(t), input)

state(t+1) = F ( state(t), input(t))

Input / Out

State

Input

State / out

EECS 150, Fa07, Lec 26 - wrap

111

001

In = 1

In = 0

In = 0

100

110

In = 1

Review: Finite State Machine Representations- States: determined by possible values in sequential storage elements
- Transitions: change of state
- Clock: controls when state can change by controlling storage elements
- Sequential Logic
- Sequences through a series of states
- Based on sequence of values on input signals
- Clock period defines elements of sequence

EECS 150, Fa07, Lec 26 - wrap

ns

Review: Formal Design ProcessLogic equations from table:

OUT = PS

NS = PS xor IN

- Circuit Diagram:
- XOR gate for ns calculation
- DFF to hold present state
- no logic needed for output

- Review of Design Steps:

1. Circuit functional specification

2. State Transition Diagram

3. Symbolic State Transition Table

4. Encoded State Transition Table

5. Derive Logic Equations

6. Circuit Diagram

FFs for state

CL for NS and OUT

Take this seriously!

EECS 150, Fa07, Lec 26 - wrap

0

1

0

one1[0]

0

1

1

include all signals

that are input to state

and output equations

two1s

[1]

Compute: output = G(state)

next state = F(state, in)

Moore Verilog FSM: combinational partalways @(In or CurrentState) begin

NextState = CurrentState;

Out = 1’b0;

case (CurrentState)

STATE_Zero: begin // last input was a zero if (In) NextState = STATE_One1; end

STATE_One1: begin // we've seen one 1 if (In) NextState = STATE_Two1s; else NextState = STATE_Zero; end

STATE_Two1s: begin // we've seen at least 2 ones Out = 1; if (~In) NextState = STATE_Zero; end

default: begin // in case we reach a bad state

Out = 1’bx;

NextState = STATE_X;

end

endcase

end

EECS 150, Fa07, Lec 26 - wrap

0

1

0

one1[0]

0

1

1

two1s

[1]

Moore Verilog FSM: state part// Implement the state register

always @ (posedge Clock) begin if (Reset) CurrentState <= STATE_Zero; else CurrentState <= NextState;

end

endmodule

Note: posedge Clock requires NONBLOCKING ASSIGNMENT.

Blocking Assignment <-> Combinational Logic

Nonblocking Assignment <-> Sequential Logic (Registers)

EECS 150, Fa07, Lec 26 - wrap

State Reduction:

Motivation:

lower cost

fewer flip-flops in one-hot implementations

possibly fewer flip-flops in encoded implementations

more don’t cares in NS logic

fewer gates in NS logic

Simpler to design with extra states then reduce later.

Example: Odd parity checker.

Two machines - identical behavior.

FSM OptimizationEECS 150, Fa07, Lec 26 - wrap

Algorithmic Approach to State Minimization

- Goal – identify and combine states that have equivalent behavior
- Equivalent States:
- Same output
- For all input combinations, states transition to same or equivalent states
- Algorithm Sketch
- 1. Place all states in one set
- 2. Initially partition set based on output behavior
- 3. Successively partition resulting subsets based on next state transitions
- 4. Repeat (3) until no further partitioning is required
- states left in the same set are equivalent
- Polynomial time procedure

EECS 150, Fa07, Lec 26 - wrap

present next state output state 00 01 10 11 S0' S0' S1 S2 S3' 1 S1 S0' S3' S1 S3' 0 S2 S1 S3' S2 S0' 1 S3' S1 S0' S0' S3' 0

S1

present next state output state 00 01 10 11 S0 S0 S1 S2 S3 1 S1 S0 S3 S1 S4 0 S2 S1 S3 S2 S4 1 S3 S1 S0 S4 S5 0 S4 S0 S1 S2 S5 1 S5 S1 S4 S0 S5 0

S0-S1

S1-S3

S2

S2-S2

S3-S4

S0-S1

S3-S0

S3

S1-S4

minimized state table

(S0==S4) (S3==S5)

S4-S5

S0-S0

S1-S0

S1-S1

S3-S1

S4

S2-S2

S2-S2

S3-S5

S4-S5

S0-S1

S1-S1

S3-S4

S0-S4

S5

S1-S0

S4-S0

S4-S5

S5-S5

S0

S1

S2

S3

S4

Minimized FSM- Implication Chart Method
- Table of all pairs of stats
- 1st Eliminate incompatible states based on outputs
- Fill entry with implied equivalents based on next state
- Cross out cells where indexed chart entries are crossed out

EECS 150, Fa07, Lec 26 - wrap

State Assignment Strategies

- Possible Strategies
- Sequential – just number states as they appear in the state table
- Random – pick random codes
- One-hot – use as many state bits as there are states (bit=1 –> state)
- Output – use outputs to help encode states
- Heuristic – rules of thumb that seem to work in most cases
- No guarantee of optimality – another intractable problem

EECS 150, Fa07, Lec 26 - wrap

Tackling complex digital designs

- Step 1: Decompose the system into a collection of subsystems
- Each has top-down requirements and bottom-up constraints
- Interconnected through interfaces
- Often with particular protocols
- Potentially different clock domains
- Rate matching, buffering, timing
- For Each Subsystem
- Step 2: Design the Datapath
- Step 3: Design the Controller
- Step 4: Compose them back together

EECS 150, Fa07, Lec 26 - wrap

Design Process

Specification

Manual Design and Coding

- Start with Some Specification
- This Class:
- Lab Write Ups
- Industry:
- Contract Restrictions
- High and Low-Level Specifications from Architects and Designers
- Convert the Design to HDL
- This Class:
- You design Microarchitecture
- Write Verilog using components provided by the TA’s or the Standard Library and also from scratch
- Industry:
- Verilog or VHDL using standard components or previous designs

HDL

RTL Synthesis

Netlist

Logic Optimization

Netlist

Physical Design

Layout

Implemetation

Final Product

EECS 150, Fa07, Lec 26 - wrap

Design Process

Specification

Manual Design and Coding

- Convert HDL into RTL and Optimize Design
- This Class:
- Synplify Pro
- Industry:
- Other Synthesis tools
- 2 & Multi-Level Logic Optimization
- Convert the Netlist into a Layout
- This Class:
- Xilinx Map & PAR
- Industry:
- Place and Route Tools
- Technology Mapping
- Convert Layout to Final Product
- This Class:
- Download to Board..Configure FPGA
- Industry:
- Send Layout to Fab
- Make Masks
- Manufacture Chips

HDL

RTL Synthesis

Netlist

Logic Optimization

Netlist

Physical Design

Layout

Implemetation

Final Product

EECS 150, Fa07, Lec 26 - wrap

Testing

- How do I know what that what I designed is really what I got back???
- Specification to HDL
- Verification
- Formal Verification
- Simulation - such as Model Sim
- HDL to Layout
- Equivlance testing
- Tool Verification

EECS 150, Fa07, Lec 26 - wrap

w2

w3

a

b

c

f

d

Fault Detected

Test

w1 w2 w3

000

001

010

011

100

101

110

111

c/1

X

a/0

XXX

b/1

X

c/0

X

d/0

X

a/1

XXX

b/0

X

d/1

X

XX

f/0

XXXXX

f/1

XXX

Fault Model- Simple example

Test

Set

EECS 150, Fa07, Lec 26 - wrap

Really putting it together

- Fault Models are used to generate interesting input vectors and their corresponding output vectors
- A subset of these vectors are selected to make a sufficiently short sequence of tests with a reasonable amount of coverage
- Vectors are combined to together to create scan patterns that test for faults by using shift register tests or using the BIST engine.
- At the Fab the sequence of test patterns are run on every wafer using a tester to sort the good chips from the bad chips.
- After packaging the chip another (similar) set of test is run on the packaged chip.

EECS 150, Fa07, Lec 26 - wrap

55 W-hour battery stores the energy of

1/2 a stick of dynamite.

If battery short-circuits,

catastrophe is possible ...

EECS 150, Fa07, Lec 26 - wrap

Largest contributing component to CMOS power consumption is switching power:

Factors influencing power consumption:

n: total number of nodes in circuit

: activity factor (probability of each node switching)

f: clock frequency (does this effect energy consumption?)

Vdd: power supply voltage

What control do you have over each factor?

How does each effect the total Energy?

Controlling Energy Consumption: What Control Do You Have as a Designer?EECS 150, Fa07, Lec 26 - wrap

Day 1: CS 150: Concepts/Skills/Abilities

- Basics of logic design (concepts)
- Sound design methodologies (concepts)
- Modern specification methods (concepts)
- Familiarity with full set of CAD tools (skills)
- Appreciation for differences and similarities (abilities) in hardware and software design
- Hands-on experience with non-trivial design

New ability: perform logic design with computer-aided design tools, validating that design via simulation, and mapping its implementation

into programmable logic devices;

Appreciating the advantages/disadvantages hw vs. sw implementation

EECS 150, Fa07, Lec 26 - wrap

Per Person

1:106

Mainframe

Mini

1:103

Workstation

PC

Laptop

1:1

PDA

Cell

103:1

Mote!

years

Broad Technology TrendsToday: 1 million transistors per $

Moore’s Law:# transistors on cost-effective chip doubles every 18 months

Bell’s Law: a new computer class emerges every 10 years

http://www.youtube.com/watch?v=AlPqL7IUT6M

EECS 150, Fa07, Lec 26 - wrap

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