1 / 17

X-Ray Crystallography

X-Ray Crystallography. The most important technique for mineralogy Direct measurement of atomic arrangement Direct measurement of what was originally deduced from crystal faces. X-Rays. Electromagnetic radiation – similar to visible light l = 0.02 to 100 Å = 0.002 to 10 nm

babu
Download Presentation

X-Ray Crystallography

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. X-Ray Crystallography • The most important technique for mineralogy • Direct measurement of atomic arrangement • Direct measurement of what was originally deduced from crystal faces

  2. X-Rays • Electromagnetic radiation – similar to visible light • l = 0.02 to 100 Å • = 0.002 to 10 nm • Visible light = 400 to 750 nm

  3. Fig. 6-6 l (nm) f (hertz) }X-Rays Visible light spectrum Full range of electromagnetic radiation 1 nm = 10-9 m

  4. X-Ray generation • Heat filament, which discharges electrons • Electron accelerated with 20 to 100 kV toward “target” • Target is Cu or Mo (also Co, Fe and Cr) Full spectrum of X rays Very hot – requires continuous circulation of cooling water Fig. 8-2

  5. X-Ray generated Ka the most intense (highest energy) • Continuous spectrum of X-ray energy (wavelengths) are produced without electrons changing shells • Characteristic spectrum when incoming electrons dislodge electrons from outer shells • Electrons drop from either M shell (Kb) or L shell (Ka) X-rays Kb Electrons Ka Target material - Cu Fig. 8-3

  6. Use of X-rays requires single wavelength • Similar to monochromatic visible light • Wavelength critical for measurement • Acts like a “ruler” • Must filter out the continuous spectrum, and leave only one of the characteristic spectrum • Typically Ka peak – most intense • Referred to as Cu – Ka radiation

  7. Filtering • Use a monochrometer • Typically a thin piece of Ni or Be foil • Foil allows most Cu-Ka radiation to pass • Blocks most wavelengths except Ka Absorption edge, Ni filters out these wavelengths X-rays pass through filter l = 1.5418 Å X-rays blocked by filter

  8. Detection • Variety of detectors • Scintillation counters (light flashes) • Gas proportional counters • Detectors are arranged so that X-rays reflected off of mineral surfaces can be recorded Arrangement of X-Ray diffractometer Detector X-ray generation Sample

  9. X-Ray diffraction • Wavelength of X rays 1 to 2 Å • Cu Ka = 1.5418 Å • About the same length as spacing of atoms in minerals l = 1.5418 Å Typically 1 to 2 Å Called d spacing

  10. X-Ray diffraction Reflects waves in phase, only if angle is such at that the additional distance pqr traveled by wave 2 is an integer number of wavelengths (here 1 wavelength) pqr = nl pq = d sin  l

  11. Bragg Equation pqr = nl pq = d sin  pqr = 2pq = 2d sin  = nl l Bragg Equation Planes of atoms

  12. Example • Halite – {111} planes have d spacing of 3.255 Å • Cu Ka radiation, l = 1.5418 Å • Solving Bragg equation shows •  = 13.70º for n = 1 •  = 28.27º for n = 2 •  = 45.27º for n = 3 •  = 71.30º for n = 4 When X-rays reflect off mineral at these angles, they will interfere constructively – cause a peak in energy at the detector

  13. Multiple possible atomic planes {110}, {100}, {001} etc. • Orienting a single grain unlikely to reflect X-rays off of any of these planes • Better to use multiple grains with random orientations • With enough planes (1000’s), there will be enough parallel to create reflections. • Powder Diffraction method

  14. Powder Diffraction • Sample crushed to small size, typically < 0.05 mm • Placed on glass slide or hollow holder • Sample placed in X-Ray diffractometer • Blasted with X-rays as sample and detector rotate from around 2º to 70º

  15. Strip recorder records intensity of signal from detector Intensity of reflection Degrees 2 

  16. Data reduction All peaks, d spacings relative intensity, reflecting plane 4 major peaks, d spacing • Powder diffraction files • Cards with the intensity and d spacing for all minerals

  17. Take rock, sediment, mineral sample • Grind sample • Mount • Measure all d spacings • Compare with the powder diffraction files

More Related