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Phys. Rev. Lett. 49, 57 (1982)

First STM images. Phys. Rev. Lett. 49, 57 (1982). Phys. Rev. Lett. 50, 120 (1983). I T (z). F eff » 1.5 eV. mechanical contact. lg. F eff » 3.5 eV. -. J. K. Gimzewski and R. Möller, Phys. Rev. Lett. 36, 1284 (1987). Structural information from STM.

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Phys. Rev. Lett. 49, 57 (1982)

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  1. First STM images Phys. Rev. Lett. 49, 57 (1982) Phys. Rev. Lett. 50, 120 (1983)

  2. IT(z) Feff» 1.5 eV mechanical contact lg Feff» 3.5 eV - J. K. Gimzewski and R. Möller, Phys. Rev. Lett. 36, 1284 (1987)

  3. Structural information from STM (1x2) missing row reconstruction on Au(110) calculated LDOS at EF J. Tersoff. D. R. Hamann, Phys. Rev. Lett. 31, 805 (1985) T. Gritsch, D. Coulman, R.J.Behm, and G. Ertl, Surf. Sci. 257, 297 (1991)

  4. STM at semiconductors Si(111) 7x7 R.J. Hamers, R.M. Tromp, and J.E.Demuth, Phys. Rev. Lett. 56, 1972 (1986)

  5. STM at close-packed metal surfaces C. J. Chen, Phys. Rev. Lett. 65, 448 (1990) D. Wang et al., Phys. Rev. Lett. 23, 1685 (1981) J. Wintterlin et al., Phys. Rev. Lett. 62, 59 (1989) J. V. Barth et al., Phys. Rev. B 42, 9307 (1990)

  6. STM imaging of adsorbates Xe on Ni(110) apparent height: 1 Å van-der-Waals radius: 3.6 Å D. M. Eigler and E. K. Schweizer, Nature 344, 524 (1990) N. D. Lang, Phys. Rev. Lett. 56, 1164 (1986)

  7. Scanning Tunneling Spectroscopy InAs B. C. Stipe, M. A. Rezaei, and W. Ho, Phys. Rev. Lett. 82, 1724 (1999) Banin et al., Nature 400, 542 (1999)

  8. Atomic force microscopy G. Meyer and N. M. Amer, Appl. Phys. Lett. 56, 2101 (1990) T. R. Albrecht et al., J. Vac. Soc. A8, 3386 (1990)

  9. Scanning Near Field Optical Microscopy from: Kurt W. Kolasinski, Surface Science (Wiley 2002)

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