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Status of Test Beam

Status of Test Beam. Analysis. Paul Nilsson, SPD General Meeting , May 21, 2003. Test Beam 2002 Analysis. Report on the status of the offline analysis. Results from threshold, delay and bias scans. Offline Analysis – Low Efficiency Problem?.

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Status of Test Beam

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  1. Status of Test Beam Analysis Paul Nilsson, SPD General Meeting , May 21, 2003 Test Beam 2002 Analysis Report on the status of the offline analysis. Results from threshold, delay and bias scans. P. Nilsson, SPD General Meeting

  2. Offline Analysis – Low Efficiency Problem? The data desynchronization causing event shifts has been corrected for in software, yielding close to perfect results. The period of the apparent event shifts matched EXACTLY the scaler setting in the trigger card. The trigger card will be investigated as soon as possible. P. Nilsson, SPD General Meeting

  3. Offline Analysis – Current Status • All necessary software/utilities developed • analyze • analyze2html • analysis database raw data to analyzed root tree root tree to web page provides easy web access via test beam homepage http://alice1.web.cern.ch/alice1/testbeam2002/index.asp • Analyzed files include threshold, delay, bias and angle • scans • Known problem with angle scans due to current • alignment algorithm and big run sets (~2M events) • Only minor changes required for next test beam P. Nilsson, SPD General Meeting

  4. Offline Analysis – TB Analysis Webpage Test Beam web contains a subset of the analyzed files (more will be added as soon as they are processed) P. Nilsson, SPD General Meeting

  5. Offline Analysis – Sample Analysis Webpage File information Efficiency vs. analysis parameter (e.g. delay) Cluster size distributions X-Resolution vs. analysis parameter Beam spots Y-Resolution vs. analysis parameter Residuals vs. event number Average cluster size vs. analysis parameter Noisy pixel reports P. Nilsson, SPD General Meeting

  6. Offline Analysis – Threshold Scans Ladder chip (14/7, chip 1): Efficiency vs. PRE_VTH P. Nilsson, SPD General Meeting

  7. Offline Analysis – Threshold Scans Ladder chip (14/7, chip 1): Resolutions vs. PRE_VTH X-Resolution (long direction) Average resolution: 0.124973 ± 0.000470 mm Resolution at max efficiency (98.766518%): 0.120588 ± 0.001438 mm (expected < 0.123 mm) Y-Resolution (short direction) Average resolution = 0.014799 ± 0.000028 mm Resolution at max efficiency (98.766518%): 0.013221 ± 0.000106 mm (expected < 0.0144 mm) P. Nilsson, SPD General Meeting

  8. Offline Analysis – Threshold Scans Ladder chip (14/7, chip 1): Average cluster size vs. PRE_VTH Ladder chip (14/7, chip 3): Average cluster size vs. PRE_VTH P. Nilsson, SPD General Meeting

  9. Offline Analysis – Delay Scans Ladder chip (14/7): Efficiency vs. delay ~45 ns P. Nilsson, SPD General Meeting

  10. Offline Analysis – Delay Scans Ladder chip (14/7): Resolutions vs. delay X-Resolution (long direction) Average resolution: 0.108570 ± 0.000346 Resolution at max efficiency (98.712952%): 0.107169 ± 0.001360 (expected < 0.123 mm) Y-Resolution (short direction) Average resolution = 0.015157 ± 0.000036 Resolution at max efficiency (98.712952%): 0.014538 ± 0.000116 (expected < 0.0144 mm) P. Nilsson, SPD General Meeting

  11. Offline Analysis – Delay Scans Ladder chip (14/7): Average cluster size vs. delay (Compare with efficiency vs. delay plot) P. Nilsson, SPD General Meeting

  12. Offline Analysis – Bias Scans Ladder chip 3 (14/7): Efficiency vs. bias voltage PRE_VTH = 185 PRE_VTH = 200 PRE_VTH = 220 P. Nilsson, SPD General Meeting

  13. Offline Analysis – Bias Scans Ladder chip (14/7, PRE_VTH = 220): Resolutions vs. bias X-Resolution (long direction) Average resolution: 0.108831 ± 0.000473 Resolution at max efficiency (98.998047%): 0.105374 ± 0.001371 (expected < 0.123 mm) Y-Resolution (short direction) Average resolution = 0.014098 ± 0.000039 Resolution at max efficiency (98.998047%): 0.012712 ± 0.000094 (expected < 0.0144 mm) P. Nilsson, SPD General Meeting

  14. Offline Analysis – Bias Scans Ladder chip 3 (14/7): Average cluster size vs. bias voltage PRE_VTH = 185 PRE_VTH = 200 PRE_VTH = 220 P. Nilsson, SPD General Meeting

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