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Analysis strategy of high multiplicity data. Toshiyuki Gogami 24/Feb/2011. Contents. Introduction Status of multiplicity and rate Origin of multiplicity of HKS Simple simulation Tracking Problems and strategy to improve Development DC hit wire selection with KTOF

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contents
Contents
  • Introduction
    • Status of multiplicity and rate
  • Origin of multiplicity of HKS
    • Simple simulation
  • Tracking
    • Problems and strategy to improve
    • Development
      • DC hit wire selection with KTOF
  • Outlook & Summary
a nalysis process
Analysis process

HES

This talk

HKS

tracking

tracking

x , x’ , y , y’

at Reference plane

x , x’ , y , y’

at Reference plane

F2T function

F2T function

x’ , y’ , p

at Target

x’ , y’ , p

at Target

particle ID

(select K+)

Missing Mass

tune

tune

p : Λ , Σ0 ,12ΛB

Angle : Sieve slit

multiplicity of typical layer of chamber
Multiplicity of typical layer of chamber

HES

HKS

~1.13

~2.24

~4.94

~1.28

Multiplicity is high for HKS

hit wires in kdc1
Hit wires in KDC1

KDC1

Overhead view

Overhead view

Misidentification chance in hit wires selection increase !

low

high

low

high

REAL DATA

REAL DATA

Black : hit wires

Blue : selected wires

Red : track

Black : hit wires

Blue : selected wires

Red : track

CH2

52Cr

singles rate summary
Singles rate summary

HKS

Up to ~30 [MHz]

HKS trigger

~ 10[kHz]

HES

Up to ~15 [MHz]

COIN 2.0 [kHz]

HES trigger

~ a few[MHz]

rate dependences
Rate dependences
  • Why residuals get worse with rate (Multiplicity) ?
    • Hardware ?
    • Tracking is worse ?
    • Parameters ?

Linear dependence

Quadratic dependence

ktof multiplicity
KTOF multiplicity

~2.7

~1.8

~6.5

~3.8

Multiplicity of KDC are not only high

but also TOF counters are! (for heavy target )

CH2 , 76314

52Cr , 77124

background event from nmr port
Background event from NMR port

9Be , 38.4 [μA]

9Be , 38.4 [μA]

KDC1

KDC1

x [cm]

KDC2

KDC2

These particles come from NMR port

Overhead view

y [cm]

KDC1

KDC1

KDC2

KDC2

Side view

z [cm]

9Be , 38.4 [μA]

HKS dipole magnet

Background events

Β ≈ 1

e- , e+

NMR port

Events on HKS optics

b g mix rate real data
B.G. mix rate (real data)

b

a

B.G mix rate =

* hks ntulpe

e simulation
e+ simulation
  • To see
    • Number of event
    • Angle & momentum

of e+ generated in target

SIMULATION

target thickness dependence simulation
Target thickness dependence(Simulation)

SIMULATION

H2O

52Cr

9Be

12C

CH2

10B

7Li

Consistent with B.G. mix rate !

angle and momentum distribution of positrons
Angle and momentum distribution of positrons

HKS cannot accept positrons directly !

SIMULATION

Generate these event in HKS GEANT

(Next page)

e e background in geant simulation
e , e+ background in GEANT simulation
  • Generated particle : e+
  • Distribution : spherical uniform
  • Momentum : 860 – 1000 [MeV/c]
  • Angle : 0 – 2 [mrad]
  • 1000 events

e+ generated in target make HKS dirty

Correlation

B.G. mix rate (Real data)

Number of e+ (Simulation)

KDC1

KDC2

e- , e+

Vacuum chamber

(sus304)

NMR port

(sus304)

basic tracking procedure
Basic tracking procedure

Real data

52Cr target

CH2 target

Good TDC

High multiplicity

Pattern recognition

Black : hit wires

Blue : selected wires

Red : track

KDC1

Solve left right

Select good combination

Combination selection with TOF counters

Reduce hit wire combinations (h_tof_pre.f)

Track fit

new tracking scheme
New tracking scheme
  • Hit wire selection with TOF
    • 1X & 2X
    • Grouping
  • Pre-PID
    • Cherenkov detectors

Good TDC

High multiplicity

Pattern recognition

Reduce hit wires to analyze

Solve left right

Select good combination

Combination selection with TOF counters

Reduce hit wire combinations (h_tof_pre.f)

Track fit

dc hit info selection with tof xx
DC hit info. selection with TOF (xx’)

Just applied to xx’-layers for test

Gravity

CUT

Particle direction

~17%

Selective region

Maximum gradient

~8%

CUT

Minimum gradient

Procedure in “h_dc_tofcut.f”

Get KTOF1X & 2X hit counter information

Make combination of 1X and 2X hit counter if those two are in same group (grouping)

Determine cut conditions on KDC1 & KDC2

Select Hit wires in KDC and Reorder them

check works of the code
Check works of the code

Gravity

  • GREEN region

Selective region

  • RED markers

Selected hit wires

  • BLACK markers

Rejected hit wires

Particle direction

Seems to work well

results of tof cut with grouping
Results of TOF cut withgrouping

Residual

before

after

CH2 , 2.0 [μA] , 76315

Same

σ 150 [μm]

σ 150 [μm]

Multiplicity

CH2 , 2.0 [μA] , 76315

x’

x’

x

x

Shift

~1.2

~2.3

result of tof cut with grouping
Result of TOF cut withgrouping

Original code

KDC

allowance

select

Pure Selective region

allowance

With “h_dc_tofcut.f”

Optimal allowance

Number of K+ ~2[%] up

Good tracks hid by background appear !

Too strict

apply to u v layer
Apply to u,v-layer

v v’-layer

Selective region determined by 1X and 2X

Applied to uu’ and vv’ layers , too.

Convert

xx’-layer

check works of the code1
Check works of the code

KDC1

KDC2

v v’

v v’

uu’

uu’

  • GREEN regionSelective region
  • RED markers & linesSelected hit wires
  • BLACK markers & lines Rejected hit wires

particle

particle

x x’

x x’

results of tof cut with grouping all layers
Results of TOF cut withgrouping (all layers)

Residual

before

after

CH2 , 2.0 [μA] , 76315

σ 150 [μm]

σ 150 [μm]

Same

Multiplicity

  • Multiplicity of uu’vv’-layers
  • CH2
    • ~20% reduction
  • 52Cr
    • ~5-10% reduction
results of tof cut with grouping all layers1
Results of TOF cut withgrouping (all layers)

CH2

TOF cut works well

Faster !

Increase !

52Cr

Faster !

52Cr

Increase !

Parameters ?

outlook
Outlook
  • Tracking
    • HKS
      • Pre-PID before pattern recognition of KDC
        • Rough cut of π+ , p , e with Cherenkov
      • Improvement of hit wire combination selection
        • Still we have β 1 background particles
      • Optimize TDC and ADC cut
        • Reduce KTOF multiplicity  DC hit wire selection with TOF should be better.
    • HES
  • Parameter check
    • Different parameters should be used for heavy target
summary
Summary
  • Status of Multiplicity and rate
    • Higher in HKS than HES
    • Strongly dependent on target in HKS
  • Origin of high multiplicity and rate
    • Should be e- , e+
      • Because of simulation results and its beta
  • Development of Tracking for high multiplicity target
    • TOF cut with grouping works well
      • Analysis time is faster by 10%.
      • Multiplicity is decreased by 5~50%.
      • Number of K+ is increased by 25% for 52Cr target.
      • Residual is still bad for 52Cr.

Need to study

hks detectors
HKS detectors

June 2009 in JLab Hall-C

1 [m]

  • HKS trigger
    • CP = 1X ×1Y × 2X
    • K = WC ×AC
    •  CP × K

π+

K+

p

~18 [kHz]

(8 [μA] on 52Cr)

K+

p, π+

Drift chambers

-KDC1,KDC2-

  • Cherenkov detectors -AC,WC-
  • Aerogel (n=1.05)
  • Water (n=1.33)

TOF walls -2X,1Y,1X-

(Plastic scintillators)

σ ≈ 250 [μm]

TOF σ ≈ 170 [ps]

Strangeness 2010 at KEK

hes detectors
HES Detectors

HES D magnet

Drift chambers

- EDC1 , EDC2 -

TOF walls - EH1 , EH2 -

(Plastic scintillators)

σ ~ 300 [ps]

Time Of Flight

HES trigger

EH1 ×EH2

~2 [MHz]

(8 [μA] on 52Cr)

e

Strangeness 2010 at KEK

d ata summary

E05-115 ( 2009 Aug – Nov )

Data summary

Physics Data

Λ

Λ

Λ

Λ

(@36μA)

Λ

Calibration Data

22nd Indian-summer school (SNP2010)

a nalysis process1
Analysis process

HES

HKS

tracking

tracking

x , x’ , y , y’

at Reference plane

x , x’ , y , y’

at Reference plane

450.8 [mg/cm2]

2.0 [μA]

38 [hours]

p(e,e’K+)Λ

p(e,e’K+)Σ0

σ = 2 [MeV/c2]

(NOT TUNED)

F2T function

F2T function

x’ , y’ , p

at target

x’ , y’ , p

at target

particle ID

(select K+)

Missing Mass

tune

tune

p : Λ , Σ0 ,12ΛB

Angle : Sieve slit

multiplicit y and tracking
Multiplicity and Tracking
  • Tracking
    • Resolution
    • Number of event

Multiplicity

affect

trackin g for high multiplicity
Tracking for high multiplicity

52Cr target

CH2 target

particle

KDC1 tracking

particle

Blue : selected wires

Black: hit wires

mean ~ 2 hit

mean ~ 6 hit

CH2 target

52Cr target

Multiplicity of typical layer

Traditional JLab Hall-C tracking code cannot handle with high multiplicity data.

Tracking eff.

CH2

52Cr

Developing new code

Multiplicity

Strangeness 2010 at KEK

multiplicity of typical layer in chamber
Multiplicity of typical layer in chamber

layer

10

6

52Cr target

CH2 target

mean ~ 1 hit

mean ~ 1 hit

HES

6

6

layer

52Cr target

CH2 target

mean ~ 6 hit

mean ~ 2 hit

HKS

Multiplicity is high in HKS

angular and momentum distribution of e
Angular and momentum distribution of e+

HKS should not accept e+ directory.

HKS detectors

HKS D-magnet

m ultiplicity
Multiplicity

KDC wire configuration

Multiplicity is higher for heavy target

v’

CH2 , 2.0 [μA]

K+

v

52Cr , 7.6 [μA]

x’

x

u’

z

y

u

Multiplicity distribution

x

y

x

number of tracks
Number of tracks

KDC1

TOP view

TOP view

Black : hit wires

Blue : selected wires

Red : track

Black : hit wires

Blue : selected wires

Red : track

CH2

52Cr

pattern recognition in kdc
Pattern recognition in KDC

Space point

KDC wire configuration

v’

150°

K+

v

x’

90°

x

x

y

Test point

Space point

u’

z

y

30°

u

x

y

x

x

nfom h dc tofcut f for all layers
NFOM (“h_dc_tofcut.f” for all layers)

Allowance applied to uuvv’ layers

new tracking scheme1
New tracking scheme

2nd loop

  • Hit wire selection with TOF
    • 1X & 2X
    • Grouping
  • Pre-PID
    • Cherenkov detectors

Good TDC

High multiplicity

Pattern recognition

Reduce hit wires to analyze

Solve left right

Select good combination

Combination selection with TOF counters

Reduce hit wire combinations (h_tof_pre.f)

Track fit

dc hit info selection with tof
DC hit info. selection with TOF

Particle direction

Gravity

CUT

Hit

~8%

~17%

Selective region

Maximum gradient

CUT

Minimum gradient

htracking h dc tofcut f
HTRACKING / h_dc_tofcut.f

Particle direction

Gravity

Just applied to x,x’-layers for test

Procedure in “h_dc_tofcut.f”

Get KTOF1X & 2X hit counter information

Make combination of 1X and 2X hit counter if those two are in same group (grouping)

Determine cut conditions on KDC1 & KDC2

Select Hit wires in KDC and Reorder them