Purpose. To provide an implementation of IEEE 1149.1 that eliminates timing violations without the need for iterations in layoutIn addition show how this implementation can allow scan to be easily inserted for high-coverage manufacturing test. Outline. The timing issues and difficulties as a result of implementing JTAG from the IEEE 1149.1 specificationAn alternate JTAG implementationAdvantages and disadvantages of the alternate implementationExperimental results.
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