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THROUGHPUT OF A NORMAL INCIDENCE SPECTROMETER DESIGN IN DIFFERENT WAVELENGTH RANGES

THROUGHPUT OF A NORMAL INCIDENCE SPECTROMETER DESIGN IN DIFFERENT WAVELENGTH RANGES. Luca Teriaca Max Planck Institut für Sonnensystemforschung. Expected throughput for spatially resolved observations. Reflectance of SiC mirrors. Bare and KBr-coated MCPs. Grating diffraction efficiency

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THROUGHPUT OF A NORMAL INCIDENCE SPECTROMETER DESIGN IN DIFFERENT WAVELENGTH RANGES

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  1. THROUGHPUT OF A NORMAL INCIDENCE SPECTROMETER DESIGN IN DIFFERENT WAVELENGTH RANGES Luca Teriaca Max Planck Institut für Sonnensystemforschung

  2. Expected throughput for spatiallyresolved observations.

  3. Reflectance of SiC mirrors

  4. Bare and KBr-coated MCPs

  5. Grating diffraction efficiency (SUMER) λ (nm) efficiency (%) 77 17 100 28 122 28 efficiencies at higher orders are taken equal to that of the first order

  6. 1165 – 1265 Å: Quiet Sun

  7. 1165 – 1265 Å: Quiet Sun

  8. 1165 – 1265 Å: Quiet Sun

  9. 1165 – 1265 Å: Active Region

  10. 1165 – 1265 Å: Active Region

  11. 1165 – 1265 Å: Active Region

  12. 950 – 1050 Å: Quiet Sun C III H I Ly γ H I Ly β O VI Si XII Si XII

  13. 950 – 1050 Å: Quiet Sun C III H I Ly γ H I Ly β O VI Si XII Si XII

  14. 950 – 1050 Å: Active Region Fe XVI Si XII Si XII

  15. 950 – 1050 Å: Active Region Fe XVI Si XII Si XII

  16. 700 – 800 Å: Quiet Sun O III O II O V Ne VIII O IV N IV S V Mg IX

  17. 700 – 800 Å: Quiet Sun O III O II O V Ne VIII O IV N IV S V Mg IX

  18. 700 – 800 Å: Active Region O III O II O V Ne VIII O IV N IV S V Fe XVI Mg IX

  19. 700 – 800 Å: Active Region O III O II O V Ne VIII O IV N IV S V Fe XVI Mg IX

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