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NTUU "KPI" 1898. OPTIMAL ELECTRONIC CIRCUITS and MICROSYSTEMS NETWORKED DESIGNER. Prof. ANATOLY PETRENKO National Technical University of Ukraine “Kiev Polytechnic Institute”, Tel./FAX +380 44 280 90 46, e-mail: [email protected]

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Optimal electronic circuits and microsystems networked designer

NTUU "KPI" 1898

OPTIMAL ELECTRONIC CIRCUITS and MICROSYSTEMS NETWORKED DESIGNER

Prof. ANATOLY PETRENKO

National Technical University of Ukraine

“Kiev Polytechnic Institute”,

Tel./FAX +380 44 280 90 46,

e-mail: [email protected]


Outline
Outline

  • Networked CAD tools

  • International co-operation Experience

  • ALLTED – All Technology Designer

  • Novel numerical methods

  • Results of solving the benchmark circuits

  • Optimization example

  • AND Logical Circuit on OET

  • Possible co-operation

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Networked cad tools
Networked CAD tools

  • Remote access to CAD tools and collectively execution the joint Projects;

  • Meeting different requirements to hardware of a server and a client ;

  • New level of functional cooperation via GRID infrastructure;

  • Possibilities for Small and Middle enterprises to take a part in international work force distribution developing competitive products.

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Allted all technology designer
ALLTED – All Technology Designer

Previous versions of this system (named SPARS, PRAM-01, PRAM-PK, PRANS for EC and SM computers) were used in the former Soviet Union as the branch Ministry of the Defense industry standard OST V3-4776-80 for circuit design automation and similar standards for the Ministries of General and Average Machinobuilding and Radio industry.

ALLTED is especially useful in the development of new products which combine various physical phenomena in one device

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International co operation experience
International co-operation Experience

  • Digital (Alpha Processor simulation)

  • Intel (Parallel computation, Formal verification, Layout extraction, VLSI Interconnects Model-Order Reduction ,ALOE to Cadence / Cadence toALOEconverters)

  • General Electric (MEMS Model design)

  • Motorola( Signal Processors implementation)

  • Sun ( Layout verification)

  • Panasonic (Remote Access to Networked Appliances )

  • Melexes (VLSI design with 0.25 u)

  • HPC –Germany ( RF circuits design)

  • EC Projects( Tempus, Inco- Copernicus)

  • STCU Projects( Remote Simulation, MEMS Design)

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Layout visualization
Layout visualization

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Allted all technology designer1
ALLTED – All Technology Designer

  • ALLTEDis an acronym forALLTEchnologyDesigner. It was developed not only for simulation and analysis, but for processing project procedures such as:

    • parametric optimization tasks;

    • optimal tolerance assignments;

    • centering availability regions;

    • yield maximization;

    • design of Nonlinear Dynamic Systems composed of either/and electronic, hydraulic, pneumatic, mechanical, electromagnetic, and other elements.

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Allted in distributed web environment
ALLTED in distributed Web environment

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Allted usage examples
ALLTED usage examples

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Allted usage examples1
ALLTED usage examples

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Allted usage examples2
ALLTED usage examples

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Allted usage examples3
ALLTED usage examples

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Allted usage examples4
ALLTED usage examples

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Allted usage examples5
ALLTED usage examples

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System on a chip
System on a Chip

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System on a chip1
System on a Chip

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Allted offers
ALLTED offers:

  • Faster simulation speed and improved numerical

    convergence;

  • Sensitivity analysis for frequency and transient analyses;

  • Comprehensive optimization procedure and optimal tolerances assignment ;

  • Alternative approach to the secondary response parameters determination (delays, rise and fall times, etc.);

  • Powerful user-defined modeling capability.

  • Original way of generating a system-level model of MEMS from FEM component equations.

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Novel numerical methods
Novel numerical methods

  • The new solution curve-search method for Steady

    State (DC) Analysis which provides the quick descent to the solution point region from any starting point

  • The Diagonal Modification Method which helps considerably preserve convergence of linearized equations solution without re-ordering when matrix element values change from one iteration to another iteration .

  • The Optimization Variable-order Methods which is equivalent to taking into consideration five terms of Tailor’s series for the Goal functionwhich considerably improve determination of a direction to the optimal point

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Novel numerical methods1
Novel numerical methods

  • The Implicit Linear Multi-step Variable-order Integration Method for Transient Analysis(TR) which uses high order back differences that allows to select the proper one resulting in minimization of solution time for prescribed accuracy.

  • The Optimal Tolerances Assignment Method which is based on applying Optimization procedures and takes into account the prescribed deviations of Controlled Output Parameters

  • Statistical Yield Maximization Method which provides “centering” the solution point in the region of acceptable solutions

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Dc method example 1
DC Method Example 1

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Tr solution approach
TR solution approach

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Intel award
INTEL AWARD

Конкурс исследовательскихпроектов области автоматизации

Проектирования интегральных схем

награждается

ПЕТРЕНКО АНАТОЛИЙ ИВАНОВИЧ

Национальный Технический Университет Украины «Киевский

политехнический институт

ПРОЕКТ

Разработка эффективных численных методов моделирования

и оптимизации схемотехнических решений для СБИС

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Results of solving the benchmark circuits of the microelectronics center in north carolina
Results of solving the benchmark circuits of the Microelectronics Center in North Carolina

Circuit ALLTEDPSPICEGain

Iteration Iteration

INPUT358 755 2.11

CHARGE4682 7625 1.63

FADD32 873 2280 2.61

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Charge circuit with bisim 49 models
CHARGE Circuit with BISIM 49 Models Microelectronics Center in North Carolina

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Allted and pspice v 9 2 outputs
ALLTED Microelectronics Center in North Carolina and PSPICE v.9.2 outputs:

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Fadd32 circuit 288 transistors
FADD32 Microelectronics Center in North Carolina Circuit (288 transistors)

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Allted and pspice v 9 2 outputs1
ALLTED and PSPICE v.9.2 outputs Microelectronics Center in North Carolina

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Simulation results obtained by allted and hspice
Simulation results obtained by ALLTED and HSPICE Microelectronics Center in North Carolina

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Mike2 circuit with bsim13 models
MIKE2 Circuit with bsim13 models: Microelectronics Center in North Carolina

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Allted and hspice outputs for mike2 bisim13
ALLTED and HSPICE outputs for Mike2_bisim13: Microelectronics Center in North Carolina

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Allted statistics of the transient analysis of mike 2
ALLTED Microelectronics Center in North Carolina statistics of the transient analysis of Mike 2

  • S t a t i s t i c s

  • Number of steps = 256

  • Number of iterations = 528

  • Number of steps per order:

  • order - 0 - = 26

  • order - 1 - = 46

  • order - 2 - = 90

  • order - 3 - = 71

  • order - 4 - = 19

  • order - 5 - = 4

  • order - 6 - = 0

  • Number of rejected steps = 23

  • HSPICE uses only 2-d order integration formula

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Optimization example 1 Microelectronics Center in North Carolina

Circuit: Operational Amplifier

RCA 3040 with 11 transistors

Task: calculate the resistances R1, R3

and R4 values in such a way, that the

output impulse amplitude on resistor

R11 would be equal to 8 V.

0.1       <=        R1       <=        10

0.1K    <=        R3       <=         10

0.1K    <=        R4       <=         10K

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Optimization example 1

Task file Microelectronics Center in North Carolina:

tr;

optim;

const DCERR=1.e-6;

const tmax=90, MINSTEP=1e-4, ERR=0.01, LERR=0.1, REVAL=3;

# TR OUTPUT parameters

fix T3=MINF(UR11);

fix T4=MAXF(UR11);

INT DURF=T4-T3;

const method=120;

varpar R1(0.01,10), R3(1,100), R4(1,100);

of DIF1 = F1(8/DURF);

plot Ur11;

Objective function

DIF1 = .3146487870E-07

R E S U L T S O F O P T I M I Z A T I O N

Variable parameters

R1 = .1000000000E+01

R3 = .6778549874E+01

R4 = .6778549874E+01 Directive F I X output characteristics

T3 = 2.47580528

T4 = 10.4756279

Directive I N T output characteristics

DURF = 7.99982262

Optimization example 1

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Optimization example 2
Optimization example 2 Microelectronics Center in North Carolina

Circuit: Active RC filter RAD

  • Task;

  • dc;

  • ac;

  • optim;

  • const lfreq=0.0025, ufreq=0.005,METHOD=152;

  • TF K1=V6/UE1;

  • plot MA.K1;

  • fix f1=MAXA(MA.K1);

  • fix f2=MAXF(MA.K1)

  • func f5=F7(1/f2);

  • of error=f5(1/f5);

  • varpar Alpha.OP1(3E1,4E3), Alpha.OP2(0.6E1,1E3);

  • limit Lim2=F2(0.003734/f1);

Constraints

RESULTS OF OPTIMIZATION

ERROR = 0.1786038652D-01

Variable parameters

ALPHA.OP1 = 0.3709765013D+04

ALPHA.OP2= 0.1000000000D+04

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Interactive tasks formation
Interactive Tasks formation Microelectronics Center in North Carolina

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Optimal tolerance assignment example: Microelectronics Center in North Carolina

Circuit: Operational AmplifierRCA 3040 with 11 transistors

Task: calculate the resistances R2, R3 and voltage source E2 tolerances values

for which the output minimal voltage UR11 changes +/- 5% of itsvalue.

task;

dc;

tr;

tolas;

const tmax=90 ,ERR=0.01,

LERR=0.1, REVAL=3;

FIX UM=minf(UR11);

const TOLERR=0.001;

control UM(5,5);

varpar E2(10),R2,R3(10);

O P T I M A L T O L E R A N C E S

***********************************

Parameter Nominal Tolerance

value % abs

E2 .1200000000E+02 +- 19.682 +- -.2361829758E+01

R2 .1000000015E+00 +- 4.614 +- .4613934550E-02

R3 .1000000000E+01 +- 3.697 +- .3696829081E-01

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Mixed Analyses example Microelectronics Center in North Carolina

Macromodel 2-input AND Cell(0,1,2,3);

j1(1,0)=f300(ut,rbx/uj1);

j2(2,0)=f300(ut,rbx/uj2);

e1(3,0)=f310(u1,u0,f1,d1,f0,d0,r1,r0,-1/ue1,ie1);

list m1.icand;

rbx=50; ut=1; u0=0.3; u1=2.4; f1=-1; d1=10;

f0=-1; d0=10; r1=0.1; r0=0.02;

Now we are going to provide possibilities

for users to access NetALLTED resources through the Internet for optimal

Microsystems design.

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The example of Micro-machined Ultrasonic Microelectronics Center in North Carolina

Transducer simulation

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And logical circuit on oet
AND Logical Circuit on OET Microelectronics Center in North Carolina

One-electron transistor model

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Microwave devices in allted

L Microelectronics Center in North Carolina

W

T

Er

H

Microwave Devices in ALLTED

  • Model of transmission linewith a negative inductance

Fig. 8 The

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Allted adaptation to a new application
ALLTED adaptation to a new application Microelectronics Center in North Carolina

  • New components mathematical models incorporating ( in equations form)

  • New graphical symbols for components, if any

  • New sections in library with components parameters

  • OF, LIMIT and FUNC libraries upgrading

    if any

  • Numerical procedures constants adjusting for new types of tasks

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Mems simulation level
MEMS Simulation level Microelectronics Center in North Carolina

System level

Circuit level

Components level

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Model order reduction

Model Order reduction Microelectronics Center in North Carolina

(Krylov- Arnoldi Method)


Circuit model reduction method
Circuit model reduction method Microelectronics Center in North Carolina

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Y transformation
Y/∆ transformation Microelectronics Center in North Carolina

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Y transformation1
Y/∆ transformation Microelectronics Center in North Carolina

Для складних 2-х і 3-х вимірних компонентів схемні моделі можуть мати дуже велику розмірність, ґтак що їхпорядок теж треба скорочувати

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Y transformation2
Y/∆ transformation Microelectronics Center in North Carolina

Для складних 2-х і 3-х вимірних компонентів схемні моделі можуть мати дуже велику розмірність, ґтак що їхпорядок теж треба скорочувати

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Microaccelerometer
Microaccelerometer Microelectronics Center in North Carolina

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The finite element model of the accelerometer
The finite element model of the accelerometer Microelectronics Center in North Carolina

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Eigenfrequencies of microaccelerometer
Eigenfrequencies of Microaccelerometer Microelectronics Center in North Carolina

n = 2; f = 1018,1 kHz

n = 1; f = 181,36 kHz

n = 3; f = 1018,1 kHz

n = 4; f = 3427,8 kHz

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Electrical circuit reduction results
Electrical Circuit Reduction Results Microelectronics Center in North Carolina

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Possible project tasks
Possible Project Tasks Microelectronics Center in North Carolina

  • ALLTED facilities Testing on Samsung Examples(optimization, tolerance assignment, yield maximization, DC conversion, RF design etc.)

  • Adaptation and enrichment of ALLTED component models Library (including new ones, say, for CCD , MEMS and IP Solutions),using semantic formats

  • Developing parallel numerical simulation algorithms for a supercomputer

  • Implementation of parallel ALLTED version in Grid environment and providing possibilities of remote its executing through Internet

  • Development of the methodology of IC energy consumption minimization based on ALLTED optimization procedures (say, by varying W and L of transistors and keeping the given frequency value).

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Thanks you very much
Thanks you very much ! Microelectronics Center in North Carolina

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