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NASA RTSX-SU Test Update

NASA RTSX-SU Test Update. May 10 th , 2006 Presented by Daniel Elftmann. NASA RTSX-SU Tests Overview. Definitions: Modified New Algorithm = Targets low current antifuses; increase soak time UMA (UMC Modified Algorithm) = Targets low current antifuses; increase soak time

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NASA RTSX-SU Test Update

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  1. NASA RTSX-SU Test Update May 10th, 2006 Presented by Daniel Elftmann

  2. NASA RTSX-SU Tests Overview Definitions: Modified New Algorithm = Targets low current antifuses; increase soak time UMA (UMC Modified Algorithm) = Targets low current antifuses; increase soak time SAL (S-Antifuse Loading) = Reduces peak currents by adding capacitance NASA2= Pattern that focuses on single and double cases of S-Antifuses and B-Antifuses

  3. KU3/4 - Testing Conditions • Operating Temperature • LTOL: TA = -55ºC TJ = -20ºC • HTOL: TA = 125ºC TJ = 146ºC • Stimulus for DUTs are generated by the NASA Driver card on each burn-in board • CLKA / CLKB = 8 MHz (HTOL) • CLKA / CLKB = 16 MHz (LTOL) • Power Supplies • NASA Driver card = 5.0V • VCCA = 2.5V to 3.0V (view Test Plan Summary) • VCCI = 4.0V

  4. KU3/4 - Test Plan Summary

  5. KU3/4 - Test Vehicle & Device Utilization • KU3/4 Test Vehicle Information Device: RTSX32SU – CQ208 Wafer Lot / Date code: D1JW21 / 0519 Per lot size: 150 + 2 (spares) + 1 (control unit) • Device Utilization • Post-Combiner device utilization: SEQUENTIAL Used: 1080 Total: 1080 (100.00%) COMB Used: 1800 Total: 1800 (100.00%) LOGIC Used: 2880 Total: 2880 (100.00%) (seq+comb) IO w/ Clocks Used: 34 Total: 170 CLOCK Used: 2 Total: 2 HCLOCK Used: 0 Total: 1 • IO Config (No internal pullup/down, all high slew) • 2 clkbufs – TTL • 12 outbufs – TTL • 10 outbufs – CMOS • 10 outbufs – PCI

  6. KU3/4 - Antifuse Utilization • Single S-Antifuses nets = 0 (SAL eliminated 1080 Single S-Antifuse nets) • Nets with Single B-Antifuse inputs = 896 • Critical K-Antifuse = 0

  7. KU3/4 - FIT Rate Calculations • High Perceptivity • Medium Perceptivity • Low Perceptivity (Note: Calculator can be obtained from Actel upon request)

  8. KU3/4 - Test Vehicle Design(Combinatorial Delay Circuit) • All Combinatorial (C-Cells) logic utilized in perceptive delay line circuits to achieve both high Single S-antifuse and Double S-Antifuse count • Single S-Antifuses will be eliminated by SAL Designer Software enhancement!!! • Common delay line input (CLKA) with 16 delay line outputs • Circuit is perceptive to shifts in delay for any utilized B-Antifuse or S-Antifuse

  9. KU3/4 - Combinatorial Delay Circuit ChipEdit Layout Type 1 SuperCluster 12 of these Type 2 SuperCluster 4 of these x 12 x 4 Cluster 1 Cluster 1 Cluster 2 Cluster 1 Delay line length 30 x 4 = 120 Delay line length 30 x 3 = 90

  10. KU3/4 - Test Vehicle Design(Sequential Delay Circuit) • Sequential (R-Cells) logic utilization to achieve high S-Antifuse count • Single S-Antifuse all eliminated by SAL Designer Software enhancement!!! • Circuit acts like dominoes • CLKB sets the line low by making CLR of Q1 active and propagates to the rest of the line • CLKB sets the line high by de-activating CLR of Q1, making SET active and propagates to the rest of the line • Common delay line input (CLKB) with 16 delay line outputs

  11. KU3/4 - Sequential Delay CircuitChipEdit Layout Type 1 SuperCluster 12 of these Type 2 SuperCluster 4 of these x 12 x 4 Cluster 1 Cluster 1 Cluster 2 Cluster 1 Delay line length 30 x 2 = 60 Delay line length 30 x 3 = 90

  12. KU3/4 - ATE Coverage • Static ICCI, ICCA, IPP, IKS, ISV • Delay measurements for falling & rising edges • 0.25 ns resolution • VIH &VIL • VOH &VOL • Input Leakage • Output Leakage

  13. KU3/4 – Current Status • KU3 • Device Programming – Completed • Programming yield = 158/160 (98.75%) • Yield loss was due to “Invalid Electronic Signature” • Tri-temperature Testing – Completed (All Passed) • Step 1 ( 0 to 250 hours LTOL) – Completed (All Passed) • Step 2 (250 to 500 hours LTOL) – In Progress (due on 05/13) • KU4 • Device Programming – In Progress

  14. KU3 (250 hrs LTOL) – ICCA • Measured ICCA for all KU3 Units can be seen in the graph below: • Delta ICCA for all devices post 250 hrs LTOL ranges from -800 uA to 280 uA

  15. KU3 (250hrs LTOL) – ICCI • Measured ICCI for all KU3 Units can be seen in the graph below: • Delta ICCI for all devices post 250 hrs LTOL ranges from -320 uA to 210 uA

  16. KU3 (250 hrs LTOL) – Delta Delay Distribution • Delta delay distribution for all delay lines post 250 hrs LTOL ranges from -0.5 ns to 0.5 ns

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