Quality System and Calibrations. “ Realizing and Disseminating the SI meter ”. Ted Doiron Quality Manager. Quality System and SIM Calibration Performance New Capabilities. NIST Quality System.
Quality System and Calibrations
“Realizing and Disseminating the SI meter”
NIST Quality System
In October 1999, the directors of the national metrology institutes (NMIs) of thirty-eight Member States of the Metre Convention signed a Mutual Recognition Arrangement (MRA) for national measurement standards and for calibration and measurement certificates issued by national metrology institutes.
SISTEMA INTERAMERICANO DE METROLOGÍA (SIM)
(INTERAMERICAN METROLOGY SYSTEM)
Based on ISO 17025
Primary standard for laboratory accreditation world-wide.
PED Quality Manual is quite small – 61 pages with no secondary SOPs.
In preparation for 2009 audit, PED had an outside trainer present the standardized 5 day training course for assessors.
Technical assessment by metrology students at Butler County Community College.
The quality event log captures complaints, compliments, intercomparisons, and virtually any other events that happen.
The system has been very stable, and the activity of the system impressed our assessors, since it is documentation that we actually use the Quality System.
Current status (2005) of Quality Systems of MRA Signatories
SIM is the final arbiter of the successful implementation of a ISO 17025 based Quality System. The results of the 2009 NIST internal assessments were rejected by SIM in the Fall of 2009. The submission of details of NIST support for calibration systems, international comparisons and documentation of assessor qualifications resulted in acceptance.
The number of division calibration staff has been roughly constant, although there have been more turnover in the last few years. The primary change has been that an increasing calibration load is handled by engineers rather than technicians.
The change from fairly simple comparators to more complex automated measuring machines has driven the trend.
There are calibrations in each group, but the primary method for providing traceability in 821.13 and 821.14 is SRMs.
821.11 has begun to develop new calibrations for the first time in decades.
Turnaround has continued to be a problem. We have had fewer gages and more folders and more income, which is a result of a slow change in the types of gages we calibrate. An increasing part of our workload are one of a kind gages measured on CMMs. These are more complex and expensive, but less efficient types of calibration.
On the bright side, we no longer lie as much about estimated calibration time.
The AML has proven to be an excellent environment for dimensional measurements. The improvements in temperature control has lowered uncertainties in key areas, and the reliability of the electrical system and general cleanliness has allowed for much longer unattended measurements, increasing our efficiency.
The control chart for the M48 and 1020 mm step gage shows dramatic improvement in the long term reproducibility, and nearly no linear dependence which implies superior temperature control.
The tape tunnel has undergone significant upgrades, including new instruments for tape calibrations, ranging systems, and special tests like a mile of optical fiber.
Studies of thermal management of manual calibrations found that while thermal isolation is good, lots of air is better. Nearly all workstations have fans.
Surface finish calibrations will have upgraded instrumentation with new AMETEK / Taylor-Hobson Form Talysurf PGI 1240
Clockwise from bottom left:
Nikon Nexiv 6555 multisensor CMM (video & triangulation)
Moore M48 CMM was installed in AML
Mitutoyo UMAP was purchased at end of CRADA
Mahr/Federal long waybed micrometer for sphere diameter and large cylinders
New Taylor Hobson - Form Talysurf will take over most surface roughness, and large step height calibrations, as well as measuring hardness indenters, and bullet signature profiles for the standard bullets project (SRM 2460).
NIST Microform Calibration System for Rockwell diamond indenters: (1) stylus tip; (2) Rockwell indenter; (3) rotary stage; (4) x-y stage.
Fluid flow nozzles and cylinders for Calculable Capacitor
Sub-mm volume standards
James Webb Space Telescope
Spheres for BFRL
ABFO No. 2 Bite Mark Rulers