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Dr. Wayne Burleson. Wayne Burleson Professor Ph.D., University of Colorado, 1989 IEEE Fellow Embedded Security, Hardware Security On-Chip Variability Sensors VLSI Circuit Design VLSI Architectures for DSP, Graphics, Wireless,. PUF. Test Chip in 45nm SOI.

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dr wayne burleson
Dr. Wayne Burleson

Wayne Burleson

Professor

Ph.D., University of Colorado, 1989

IEEE Fellow

Embedded Security, Hardware Security

On-Chip Variability Sensors

VLSI Circuit Design

VLSI Architectures for DSP, Graphics, Wireless,

PUF

Test Chip in 45nm SOI

DPA Workstation with Smartcard fixture

Physical Unclonable Function and

True Random Numbers from SRAM

Phase Encoder

Thermal

Sensor

Process

Sensor

Droop Detector

PUF

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