html5-img
1 / 1

Fingering Instability

Fingering Instability.

stian
Download Presentation

Fingering Instability

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Fingering Instability A thin gold film under annealing on a silica substrate can develop “fingers” at the perimeter of the film. The perimeter retracts to leave behind longer “fingers”, which eventually pinch off to reduce the surface energy of the system. New “fingers” then form at the film edge and the process continues until the entire film disintegrates. To maintain the structure integrity of annealed thin films, this fingering instability must be understood. The retraction of a straight film edge via capillarity-driven surface diffusion has been analyzed in two dimensions by Wong et al [Acta mater. 48, 1719 (2000)]. They found that a retracting film is thickened at the edge followed by a valley before the film thickness becomes uniform. We study the three-dimensional linear stability of this two-dimensional film profile and find one unstable mode of perturbation. The growth rate of the perturbation is determined as a function of the wavelength of the perturbation and the speed of the receding edge. The results show that a straight film edge becomes wavy when perturbed. The wavelength lm of the fastest growing perturbation agrees with the distance between adjacent “fingers” observed in a gold-film experiment. “Fingers” can also form during annealing at the retracting edges of cracks in sapphire, and our predicted lm compares well with the measured finger spacing. • Kan, W. and H. Wong "Fingering instability of a retracting solid film edge," J. Applied Phys.97, 043515 (2005).

More Related