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Preparation for silicon sensor arrival

Preparation for silicon sensor arrival. sensor delivery schedule aggressive expect 130 L2-L5 sensors each in July and August sensor lot/batch will likely be in the order of 50-70 from 9/2003 until 4/2004 270 L2-L5 sensors each month

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Preparation for silicon sensor arrival

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  1. Preparation for silicon sensor arrival • sensor delivery schedule aggressive • expect 130 L2-L5 sensors each in July and August • sensor lot/batch will likely be in the order of 50-70 • from 9/2003 until 4/2004 270 L2-L5 sensors each month • first L0/L1 (110 pcs) sensors in October 2003 (but effectively later) Frank Lehner U Zurich

  2. Silicon sensor arrival - preparation • We have a detailed QA plan with established procedures • All people involved in that business should check on http://www.physik.unizh.ch/~lehnerf/dzero/qa/qa.html • QA document v4.0 • definition of tests • general procedures for testing • Sensor QA part flow v2.0 • detailed part flow for testing • timing estimates • Procedures for visual inspection v1.0 • Guidelines for clean room and sensor S&H v2.0

  3. Sensor arrival - preparation • Key tests: • initial registration into DB • checking paperwork from vendor • inserting vendor info into “vendor information spreadsheet” -> perl script -> database • visual inspection • follow visual inspection guidelines • use traveler form during inspection (form attached to visual inspection guide line) • insert visual inspection comments into “key test spreadsheet” • I-V and C-V • data go into “key test spreadsheet” • all L2-L5 sensor key tests at FNAL • Technician for DB and visuals: Nina Ronzhina • Physicists for IV & CV: Md Mao/R.Lipton

  4. Sensor arrival – preparation • 10% L2-L5 full strip test (FST) at KSU (35%) & SB (65%) • sensors selected for FST by RD and FL • FST information goes into “full strip test spreadsheet” -> perl -> database • 5% sensors are subject to long term bias test at FNAL (Md. Mao/R. Lipton) • selection based on visual inspection and I-V results from key tests • initially 10% sensors per batch will be mechanically measured on OGP at FNAL • agreement what to measure: thickness, flatness, cut tolerances 2x (sides and ends) • sensors which show chips/cracks at edges have to be measured • not yet an agreement on data format

  5. Sensor arrival – preparation • irradiation test at KSU • 1.5% of the sensors (irradiation on baby detector) • two irradiation steps up to 2.5·E13 10 MeV p/cm2 • irradiate roughly half of the baby detectors which are at KSU anyway for FST tests • L0 & L1 baby detectors have to be shipped from UR to KSU for irradiation (do we need a higher dose for them?)

  6. Sensor QA plan

  7. Sensor arrival – preparation questions • Questions: • Is Nina trained for visual inspection? • Is the visual inspection station in Lab A ready? • When do we have the vendor information and key test spreadsheet ready? • Do we have dry boxes for sensor storage at FNAL? • Are the programs for the mechanical measurements on the OGP written? • Is the output format defined?

  8. L0/L1 PRR preparation • L0/L1 PRR will be on August 8th, 9 a.m. CT • documents & infos posted on http://www.physik.unizh.ch/~lehnerf/dzero/prr/prr_l1.html • following documents are prepared or have to be prepared/finalized • Note on electrical characterization of L1 sensors • editor: Marcel • status: 1st version exists • plots and results are there, need only additional layout work • I will finalize it • Note on irradiation of L1 sensors • editor: Frank • status: 2nd version • plots and results are there • however results on strip capacitance are a very weak point, went up from 1.1 pF/cm to 1.5 pF/cm • no reults on coupling capacitor value after irradiation • no results on strip capacitance versus HV after irradiation

  9. L0/L1 PRR preparation • Note on comparison of strip measurements between SB and KSU • editor: Bob • status: 2nd version exists (from July) • gives a very nice overview, shows the overall good agreement between KSU and SB on many measurements with some exceptions though • to be included in electrical sensor characterization note or separate note ?? • Note on fluence determination and dosimetry checks at KSU irradiation facility • editor: Tim • status: 2nd version exists (from July) • contains leakage current vs. fluence plots which are also in the other note • foil activation double check between FNAL & KSU within ~20%

  10. L0/L1 PRR preparation • older note on L2 irradiation document for L2-L5 PRR from March 6, 2003 • editor: Regina & Tim • status: unchanged • do we need an update of this at all? • other existing notes: • quality assurance document v4.0 • visual inspection guidelines v1.0 • sensor S&H document v2.0 • generally in good shape …

  11. L0/L1 PRR preparation • all documents released to PRR by July 25 (i.e. two weeks in advance) • everybody, please read and send comments in to all notes by latest July 20 • again, the notes are posted on: • http://www.physik.unizh.ch/~lehnerf/dzero/prr/prr_l1.html

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