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Uchida Yoko Co., Ltd. Solution Sales Department CAD section

Flying Checker Data Creation System U-ART/FLY LINE. Uchida Yoko Co., Ltd. Solution Sales Department CAD section. Features of U-ART/FLY LINE. ●Japan’s Best-Selling System ・ Japan’s No.1 continuity testing data creation system ・ Sold 120 sets and used by 60 companies

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Uchida Yoko Co., Ltd. Solution Sales Department CAD section

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  1. Flying Checker Data Creation System U-ART/FLY LINE Uchida Yoko Co., Ltd. Solution Sales Department CAD section

  2. Features of U-ART/FLY LINE ●Japan’s Best-Selling System ・Japan’s No.1 continuity testing data creation system ・Sold 120 sets and used by 60 companies ●Comprehensive Testing Data Creation System ・Dedicated Fixture ・Universal Fixture ・Conductive Rubber Type Conversion Board ・Flying Checker ・Non-contact Type ・Defect Analysis System ●Accurate Test Point Output ・Accurate test point creation without omission ・Full consideration to resist data ・Various test point generation

  3. New Functions of U-ART/FLY LINE (1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output This new version of FLY LINE was created for the purpose of: Operation Improvement Reduction of Testing Data Creation Time Accurate Data Creation Specifically, desirable testing data creation time for a flying checker is 15 minutes to 1 hr, without any mistakes. Acquisition of FLY LINE operation is attained in about two days. And data can be processed with least processing. These were all aimed at upon creation of this new version.

  4. New Functions of U-ART/FLY LINE (1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output (1) Individualized Database 　　・Folder administration for each object 　　・Simplified data backup 　　・Blanket data administration by server Ｏｌｄ Ｎｅｗ pcb1 /home/data1 Pcb1 pcb2 pcb3 pcb4 ････ pcb2,pcb3,pcb4･･････ sample1 /home/data2 sample2,sample3,sample4

  5. New Functions of U-ART/FLY LINE (1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output (2) Improved Operation 　　・Layer Number　・・ ・・＞Layer Name Layer name is now displayed as a name specified, not a number. Layer name can be decided checking graphics of each input file. data1.gb=comp data2.gb=sold data3.gb=res-comp etc・・ 　　・Simplified Specification of Layer Attributes IVH specification, Cut data synthesis specification 　　・Revised Flow of Processing Vast reduction of processing flow Simplified operation

  6. Data Confirmation HIOKI Output Test Point Generation Intermediate Point Deletion (UDBC) Graphic Editing (UEDITN) Automatic Conversion Processing (FAP) Net Info. Creation (UARTNN) CAM Data Input (GT) Gerber Data NC Data Graphic Editing (UEDITN) Pad Conversion Net Creation Test Point Generation Intermediate Point Deletion Data Confirmation HIOKI Output CAM Data Input (GT) Gerber Data NC Data U-ART/FLY LINE Processing Flow

  7. Data 1Data 2Data 3 ＋ ＋ ＝ Data 1Data 2 ＝ ＋ New Functions of U-ART/FLY LINE (1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output (3) Full Compliance with Synthesized Data 　　・Net creation, test point generation, near-nets 　　・Up to 8 synthetic levels

  8. BulletOvalTablet New Functions of U-ART/FLY LINE (1) Individualized DB (2) Improved Operation (3) Full Compliance with Synthesized Data (4) Compliance with Special-Shaped AP (5) Checker Data Output (4) Compliance with Special-Shaped Aperture 　　・Tablet, Bullet, and Oval 　　・Graphic display, net creation, test point generation, and near-nets -- compliance with all 　　・RS274X custom aperture （５）Checker Data Output 　　・Stamp unit position specification

  9. Test Point Generation ① Accurate data generation for each tester type, without omission ●Full consideration to resist data ・Using resist-free data,whether there is copper leaf or not is automatically determined to assign contact probes to upper and lower fixtures. ・Considering partial resist-free data, a contact probe is assigned to the center of copper leaf left. ・When there is not enough copper leaf left for a contact probe positioning, a resist defect checkmark is output and displayed on graphics. ●Compliance with single test ・There are four methods of probe assignment for a single net. Output on both sides/Output on Component side/Output on Soldered side/No probe output ●Compliance with via (surface) test ・Via (surface) test is the mode of whether to assign a probe to a point that looks like a single via hole when looked at on a plane but it is an intermediate point that connects to other pad when looked at three-dimensionally. ●Various output methods of net end in inner layer ・There are four methods of probe assignment where patterns end in inner layer. 1.Inner layers are divided into either Component or Soldered side groups and probe assignment is performed accordingly. 2.Probes are output compulsorily on either Component or Soldered side. 3.Probes are output on both Component and Soldered sides. 4. No test points are output at all.

  10. Reference Test Point Generation ① ●Full consideration to resist data ●Compliance with single test ●Compliance with via (surface) test ●Various output methods of net end in inner layer

  11. Test Point Generation ② ●Loop patterns and paint（wide-area patterns） recognition ・Optimized contact probes are assigned to points related to loop lines and paint data, where recognition checkmarks for these data are output and displayed on graphics. ●Function of tracking back to previous net end points ・When a probe can not be output even at a net end point because of such a problem as resist defect, it tracks back to the previous net point(s) to search automatically where it can be output. ●Function of single point/zero point check ・When there is only one test point output or no test point output for some reasons at patterns connected, checkmarks are displayed on graphics.

  12. Reference Test Point Generation ② ● Loop patterns and paint（wide-area patterns） recognition ● Function of tracking back to previous net end points ● Function of single point/zero point check

  13. Test Data Output ●HIOKI 1115 X-Y C Hi Tester test data output ・Probe output in the center of effective surface of test point ・When a blade-typed probe is used and through-holes with 1.45Φ and more are test points, they are avoided automatically and probe output is shifted to the “ring” part of the hole. Shifting direction can be specified. ・In order to operate the flying checker at more agreeable speed, net information within the area specified for each net is output. Diameter: 1.45 Φ and more

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