'Youngsoo shin' presentation slideshows

Lithographic Defect Aware Placement Using Compact Standard Cells Without Inter-Cell Margin

Lithographic Defect Aware Placement Using Compact Standard Cells Without Inter-Cell Margin. Seongbo Shim, Yoojong Lee, and Youngsoo Shin. Outline. Introduction Defect probability computation Defect probability aware placement Experimental Results Conclusion. Introduction.

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