100+ Wafer level testing PowerPoint (PPT) Presentations, Wafer level testing PPTs

Wafer level testing - PowerPoint PPT Presentation

Automated Wafer-Level Testing of Critical MEMS Parameters using Optical Vibration Measurement

Automated Wafer-Level Testing of Critical MEMS Parameters using Optical Vibration Measurement. Marco Meinig 1 , Eric Lawrence 2 , Steffen Kurth 1 , Heinrich Steger 3 1 Fraunhofer ENAS, Chemnitz, Germany; 2 Polytec Inc., Irvine, CA; 3 Polytec GmbH, Waldbronn, Germany. Outline.

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448 views • 25 slides

OEE and Production Yield Improvements on WLCSP Devices: Case Study Using a Novel Probe Design

OEE and Production Yield Improvements on WLCSP Devices: Case Study Using a Novel Probe Design. Ranauld Perez Johnstech International Minneapolis, Minnesota, USA. Objectives. Share technical insights about a novel approach for production testing of WLCSP devices

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506 views • 15 slides

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Wafer level testing - PowerPoint PPT Presentation

Automated Wafer-Level Testing of Critical MEMS Parameters using Optical Vibration Measurement

OEE and Production Yield Improvements on WLCSP Devices: Case Study Using a Novel Probe Design