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$Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride$

Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride

Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride J. D. Perreault 1,2 , A. D. Cronin 2 , H. Uys 2 1 Optical Sciences Center, University of Arizona, Tucson AZ, 85721 USA 2 Physics Department, University of Arizona, Tucson AZ, 85721 USA. Abstract.

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$Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride$

Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride

?. x. z. z. Na. optical phase front. 100 nm period diffraction grating. 60 ? m diameter hot wire detector. 10 ? m collimating slits. .5 ? m skimmer. supersonic source. negative lens. van der Waals Diffraction Theory.

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Uys2 1optical sciences center - PowerPoint PPT Presentation

Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride

Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride