'Tt corner' presentation slideshows

Introduction to CMOS VLSI Design Lecture 21: Scaling and Economics

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Introduction to CMOS VLSI Design Lecture 21: Scaling and Economics

831 views • 61 slides

Introduction to CMOS VLSI Design Scaling and Economics

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REALITY

REALITY. Statistical Characterization of a High-K Metal Gate 32nm ARM926 Core Under Process Variability Impact. Memories and ssta. Local (Intra-die) Critical Path Delay Breakdown in ARM 926. 14% of clock period margin for intra-die variability:. 2.

521 views • 36 slides