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Lecture 31 System Test (Lecture 22alt in the Alternative Sequence)

Lecture 31 System Test (Lecture 22alt in the Alternative Sequence)

Lecture 31 System Test (Lecture 22alt in the Alternative Sequence). Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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366 views • 22 slides
Lecture 31 System Test

Lecture 31 System Test

Lecture 31 System Test. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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340 views • 22 slides
Lecture 31 System Test

Lecture 31 System Test

Lecture 31 System Test. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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227 views • 22 slides
VLSI Testing Lecture 12: System Diagnosis

VLSI Testing Lecture 12: System Diagnosis

VLSI Testing Lecture 12: System Diagnosis. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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651 views • 20 slides
VLSI Testing Lecture 12: System Diagnosis

VLSI Testing Lecture 12: System Diagnosis

VLSI Testing Lecture 12: System Diagnosis. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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211 views • 20 slides
VLSI Testing Lecture 14: System Diagnosis

VLSI Testing Lecture 14: System Diagnosis

VLSI Testing Lecture 14: System Diagnosis. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

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206 views • 20 slides
ELEC 7770 Advanced VLSI Design Spring 2007 VLSI System DFT

ELEC 7770 Advanced VLSI Design Spring 2007 VLSI System DFT

ELEC 7770 Advanced VLSI Design Spring 2007 VLSI System DFT. Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr07. SOC Design: A DFT Problem.

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298 views • 15 slides

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