'Test modes' presentation slideshows

Chapter 14 Memory System

Chapter 14 Memory System. HCS12 Memory System. It has three internal memory blocks: Program memory (EPROM or flash memory) Data memory (SRAM) Data EEPROM Many HCS12 members also support external memory. External memory can be SRAM, EPROM, EEPROM, or flash memory.

1.48k views • 130 slides

Chapter 3 DC and Parametric Measurements

Chapter 3 DC and Parametric Measurements. Continuity Purpose of Continuity Testing ATE to Test Head connection. Purpose of Continuity Testing Electromechanical relays. Continuity Continuity Test Technique On chip protection diodes

553 views • 37 slides

Users Council Webinar February 3, 2014

533 views • 35 slides

MC68HC11 System Overview

MC68HC11 System Overview. MC68HC11 System Overview. System block diagram (A8 version). 68HC11: major features. HCMOS Technology (low power / high speed) On-chip RAM, ROM, EEPROM Basic core functions of MC6801 --improved instruction set functionality

444 views • 31 slides

JDSU HST-3000

JDSU HST-3000. ETSI ISDN BRA &PRA Product Overview. JDSU HST-3000. ETSI ISDN PRA SW. Testing requirements. E1 and ISDN services are the cornerstone of telecom world Migration from circuit-switched to packet-switched network infrastructure Work group consolidation

621 views • 28 slides

Status Report of the VIAQ (Vehicle Interior Air Quality) Informal Working Group

Transmitted by the Chair and Secretary of VIAQ. Informal document GRPE-78-29 78 th GRPE, 8-11 January 2019 Agenda item 12. Status Report of the VIAQ (Vehicle Interior Air Quality) Informal Working Group. GENEVA, January 9 th 2019. Chair: Andrey KOZLOV, Russian Federation

177 views • 17 slides