'Scan chains compression' presentation slideshows

Integrated Test Data Compression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing

Integrated Test Data Compression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. Nicola Nicolici Electrical and Computer Engineering. Paul Theo Gonciari Bashir Al-Hashimi Electronic Systems Design Group. University of Southampton, UK. McMaster University, Canada.

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