'Logic block observer' presentation slideshows

Design for Testability

Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

675 views • 40 slides

Testing of Logic Circuits

849 views • 31 slides

Lecture 26 Logic BIST Architectures

Lecture 26 Logic BIST Architectures. Motivation Built-in Logic Block Observer (BILBO) Test / clock systems Test / scan systems Circular self-test path (CSTP) BIST Circuit initialization Loop-back hardware Test point insertion Summary. Motivation.

520 views • 27 slides