'Exploited core wrapper design' presentation slideshows

Integrated Test Data Compression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing

Integrated Test Data Compression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing. Nicola Nicolici Electrical and Computer Engineering. Paul Theo Gonciari Bashir Al-Hashimi Electronic Systems Design Group. University of Southampton, UK. McMaster University, Canada.

600 views • 49 slides