'Circuit performance' presentation slideshows

Chapter 3

Chapter 3. Fault-Tolerant Design. What is this chapter about?. Gives Overview of Fault-Tolerant Design Focus on Basic Concepts in Fault-Tolerant Design Metrics Used to Specify and Evaluate Dependability Review of Coding Theory Fault-Tolerant Design Schemes Hardware Redundancy

1.54k views • 118 slides

Low-Power Design Techniques in Digital Systems

Low-Power Design Techniques in Digital Systems. Prof. Vojin G. Oklobdzija University of California. Outline of the Talk. Power trends in VLSI Scaling theory and predictions Research efforts in power reduction Efficiency measures and design guidelines Latches and Flip-Flops for Low-Power

1.53k views • 82 slides

Transistor and Circuit Design Optimization for Low-Power CMOS By M.Chang , C.Chang,C.Chao,K.Goto,M.Leong,L.Lu,and C.Di

Transistor and Circuit Design Optimization for Low-Power CMOS By M.Chang , C.Chang,C.Chao,K.Goto,M.Leong,L.Lu,and C.Diaz. Presented By: Mozammel Haque For the Low-Power High-Sped VLSI ELEC 5705Y W-2009. Contents. ? Introduction ? Low power techniques ? Procedures/ Discussion

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Sub-wavelength Lithography: An Impact of Photo Mask Errors on Circuit Performance

533 views • 25 slides

IE121 Presentation

IE121 Presentation. Group Member Panita Suthiwongsing 5310750129 Kittiwat Watanasungsuit 5310750731 Penpitcha Rungruangpan 5310755698. SEMICONDUCTOR. MENU. - Overview - Structure - Properties on both advantages and limitations - Applications. SEMICONDUCTOR MANUFACTURING.

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Single Event Upsets in Digital VLSI Circuits

Single Event Upsets in Digital VLSI Circuits. EYES Summer Internship Program 2007 University of New Mexico Vinay Jain Dr. Payman Zarkesh-Ha Final Year Undergraduate Assistant Professor ECE

442 views • 20 slides

Single Event Upsets in Digital VLSI Circuits

Single Event Upsets in Digital VLSI Circuits. EYES Summer Internship Program 2007 University of New Mexico Vinay Jain Dr. Payman Zarkesh-Ha Final Year Undergraduate Assistant Professor ECE

324 views • 20 slides

EE 466: VLSI Design

EE 466: VLSI Design. Lecture 03. The inversion layer charge Q I represents the total mobile electron charge on the surface and its expression at the source end of the channel is:

431 views • 19 slides

Degradation Effects in A-Si:H Thin Film Transistors and Their Impact on Circuit Performance

FDC. Degradation Effects in A-Si:H Thin Film Transistors and Their Impact on Circuit Performance. D.R. Allee, L.T. Clark, R. Shringarpure, S.M. Venugopal, Z.P. Li, and E.J. Bawolek Flexible Display Center Arizona State University. Purpose.

349 views • 19 slides

On the Decreasing Significance of Large Standard Cells in Technology Mapping

On the Decreasing Significance of Large Standard Cells in Technology Mapping. Jae-sun Seo, Igor L. Markov, Dennis Sylvester, and David Blaauw ICCAD 2008. Outline. Introduction Experimental Results Analysis of single paths Evaluating utility of large cells in technology mapping Conclusion.

246 views • 17 slides

Op-amps: Part II

Op-amps: Part II. Active Filters in Real-World Applications. Entanglement and Decoherence in a Trapped-Ion Quantum Register by David Kielpinski , UC-Boulder, PhD Thesis, 2001. Heart Monitor. Ella Clare, March 24, 2013 2 lb 8 oz. Non-inverting active filters. Non-inverting LPF (Boost).

280 views • 14 slides

10% Worst Performing Circuits Reliability Program SWEDE Conference San Antonio, TX May 10, 2007 Kenton M. Brannan, P.E.

10% Worst Performing Circuits Reliability Program SWEDE Conference San Antonio, TX May 10, 2007 Kenton M. Brannan, P.E. kenton.brannan@centerpointenergy.com. Historical Approach Enhanced Process Identification of Probable 10% Circuits Circuit Evaluation & Improvements

295 views • 13 slides

High-Performance Microprocessor Design

High-Performance Microprocessor Design. Outline. Introduction Technology scaling Power Clock Verification. Introduction. Alpha has historically been at the forefront of processor performance Clean architectural design Clever micro-architectural design Aggressive circuit design

320 views • 6 slides

WPE Report

WPE Report Mark Basel Paul Humphries Summary Continue on new corner methodology Not move forward for now with asymmetric issue Help Desk Short term, send email to CMC Long term, Wiki & email list server Advanced stress effect Presentation by IBM

546 views • 5 slides