'Cell margin seongbo shim' presentation slideshows

Lithographic Defect Aware Placement Using Compact Standard Cells Without Inter-Cell Margin

Lithographic Defect Aware Placement Using Compact Standard Cells Without Inter-Cell Margin. Seongbo Shim, Yoojong Lee, and Youngsoo Shin. Outline. Introduction Defect probability computation Defect probability aware placement Experimental Results Conclusion. Introduction.

512 views • 33 slides