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Lecture 27 Memory and Delay-Fault Built-In Self-Testing

Lecture 27 Memory and Delay-Fault Built-In Self-Testing. Definitions Static RAM March Test BIST SRAM BIST with a MISR Neighborhood Pattern Sensitive Fault (NPSF) DRAM BIST Transparent testing Complex examples Delay fault BIST Summary. Definitions.

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Lecture 27 Memory and Delay-Fault Built-In Self-Testing

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VLSI Testing Lecture 8: Memory Test

VLSI Testing Lecture 8: Memory Test. Memory organization Memory test complexity Faults and fault models MATS+ march test Address Decoder faults Summary References. RAM Organization. Test Time in Seconds (Memory Cycle Time 60ns). Size Number of Test Algorithm Operations. n 2

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Address decoder faults - PowerPoint PPT Presentation

Lecture 27 Memory and Delay-Fault Built-In Self-Testing

Lecture 27 Memory and Delay-Fault Built-In Self-Testing

VLSI Testing Lecture 8: Memory Test