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Technion – Israel Institute of Technology Department of Electrical Engineering

JTool Poster. Instructor Amit Berman Students Evgeny Hahamovich Yaakov Aharon. Spring 2009. Technion – Israel Institute of Technology Department of Electrical Engineering. Project Objectives. Understanding Jitter analysis methodology and background

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Technion – Israel Institute of Technology Department of Electrical Engineering

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  1. JToolPoster Instructor Amit Berman Students Evgeny Hahamovich Yaakov Aharon Spring 2009 Technion – Israel Institute of Technology Department of Electrical Engineering

  2. Project Objectives • Understanding Jitter analysis methodology and background • Design and implement software for calculating Jitter parameters based on Agilent’s scope measurements • Analyze Jitter for user created, pre-known pattern • Analyze Jitter for high-speed printed circuit board • Compare the method to other popular jitter measurement tools

  3. Eye Diagram Block Diagram Data Input *.csv format Zero Crossing TIE Jitter Trend Jitter Separation DJ p-p TIE Filter Jitter FFT RJRMS PJRMS Initial Parameters Histogram PDF • Numerical Output • Graphical Output • Internal Function Conf. Level Shortening Jitter Extrapolation Bathtub Curve CDF TJ@BER

  4. JTool User interface Graphical User Interface implemented using “GUIDE” tool in MATLAB JTool

  5. JTool Results

  6. Correlation on High Speed BoardsData Pattern 1.25GHz (2.5Gbits) data pattern, Vp-p = 1.2V, Vcm = 0VSignal generated using Intel’s chip and boardSignal captured using DSO91304A Agilent Scope (different model)Fsample = 40Gsa/s, 2Mpts samples taken TIEP-P = 170 ps TIEP-P = 163 ps 6

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