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AGATA Core - upgraded front end electronics. Upgraded Charge Sensitive Preamplifier - new frequency compensation for Single & Dual Gain Core Reworked Dual Gain Core, reconfigurable: - either Single or Dual; either LV-CMOS or LVDS

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slide1

AGATA Core - upgraded front endelectronics

Upgraded Charge Sensitive Preamplifier

-new frequency compensation for Single & Dual Gain Core

Reworked Dual Gain Core, reconfigurable:

-either Single or Dual; either LV-CMOS or LVDS

Programmable Spectroscopic Pulser

-as a tool for self-calibrating energy, time, dead time, time

alignment, detector characterization etc.)

G. Pascovici for the AGATA Preamplifier and Detector Groups, Uppsala, 09.07.2008

motivation going on work
Motivation, going on work…
  • Follow-up on previous AGATA Week presentations:

- Wiring and Frequency Compensations,

B. Bruyneel and G. Pascovici, Orsay, 2007

- Dual Gain Core (e.g. with 5 MeV and 20 MeV ranges)

Dino Bazzacco’s request, Aug. 2007

- ToT Method (calibration and measurements),

Francesca Zocca et al, Padova, 2007

slide3

Transfer function at high frequency range

 Dominant pole compensation

See presentations of B. Bruyneel

& G. Pascovici

@ AGATA Week, Orsay, Jan, 2007

  • Return GND concept
  • for single & triple cryostat
  • Wires – inductivities …
slide4

Issue:

Front-End Electronics &

wiring in cryostat

Cold partWarm part

Core return GND

Cold partWarm part

slide5

AGATA Single & Dual Gain Core

reworked frequency compensations

tested with AGATA_Dummy-3D

internal network

compensation

Lead comp.

(1. OpAmp)

Cryostat wiring as part of the front-end electronics

external network

compensation

- minimum Miller effect (min.)

- lead compensation (min.)

- lead-lag compensation (adj.)

- dominant pole compensation (adj.)

AGATA Dummy 3Dcapsule + wiring

slide6

AGATA Single & Dual Gain Core

reworked frequency compensations

internal network

compensation

Lead comp.

(1. OpAmp)

Cryostat wiring as part of the front-end electronics

external network

compensation

- minimum Miller effect (min.)

- lead compensation (min.)

- lead-lag compensation (adj.)

- dominant pole compensation (adj.)

slide7

AGATA Single and Dual Core

frequency compensations

tr ~ 30-40 ns

Multiple frequency

compensations:

- minimum Miller effect

- lead compensation

- lead-lag compensation

- dominant pole compensation

* without dominant pole & lead-lag

compensation networks

* implemented dominant pole & lead-lag

compensation network

  • Comments:
  • Stability criteria not only oscillations,
  • rather it is circuit performance as
  • exhibited by peaking and ringing
  • the method of compensation depends
  • on the equivalent op amp type and
  • feedback, source and load networks

tr ~ 25 - 30 ns

a HF rejection with almost no extra

“price” paid for rise time !

slide8

Dual Core in ‘GP -Cryostat’

(cold)

  • Dual Corein‘GP - Cryostat’ (cold)
  • cryostat equipped with AGATA cold parts
  • and wiring (only 1.8 Ohm, no 48.5 Ohm!)

tr ~ 26.8 ns Ch.1 @ ~ 800 mV

~ 25.6 ns Ch.2 @ ~ 220 mV

  • Equivalent resolutions (if cold Cf ~1pF)
  • Ch1 ~ 1.15 keV @ ~ 150 keV
  • Ch2 ~ 1.25 keV @ ~ 150 keV
  • (6 µs shaping time Ortec 671 & IKP-MCA)
  • rise time ~ 26 -29 ns (+/- 2ns  10mV-1V)
  • no overshoots & undershoots
  • NB: flat top of ~ 500 ns (PSA  peaking)

tr ~ 29.2 ns Ch.1 @ ~ 220 mV

~ 29.2 ns Ch.2 @ ~ 60 mV

slide9

AGATA

Single / Dual Gain Core

Final Specifications

  • news - core front-end
  • Single or Dual Gain
  • Extended range~180 MeV
  • (both single and dual gain)
  • LV-CMOS or LV-DSfor the
  • INH-Ch1, INH-Ch2 and
  • Pulser Trigger-In
  • LV-CMOS for SHDN and
  • Pulser DAC CNTRL lines
  • Up-dated frequency
  • compensation for cryostat
  • wiring (dominant pole comp)
slide10

Time over Threshold (ToT) method

See Francesca Zocca, AGATA Week, Padova, Nov. 2007;

FreeDAC Workshop, Ljubljana, Mai, 2008

slide11

Fast Reset as tool to implement the “TOT” method

Analog Mode + DT1

Active Reset – OFF

Fast Reset circuitry

ToT ~ DT2

Active Reset – ON

  • very fast recovery from TOT mode of operation
  • fast comparator LT1719 (+/- 6V)
  • factory adj. threshold + zero crossing
  • LV-CMOS (opt)
  • LVDS by default
slide12

Dual Gain Core -the upgraded features and its structure

  • Linear Range: 2keV -180 MeV (far beyond the ADC limit !)
  • Two modes of operations:
  • a)Pulse Amplitudeb)Time Over Threshold(ToT)
  • (0-5 MeV); (0-20 MeV)(5-180 MeV); (20-180 MeV)

cold part

warm part

Ch 1 ~ 200 mV / MeV

C-Ch1

/C-Ch1

INH1

SDHN1

Pole /Zero Adj.

Fast Reset

(Ch1)

Differential

Buffer

(Ch1)

Common

Charge

Sensitive

Loop

+

Pulser

+

Wiring

36_fold segmented

HP-Ge detector + cold jFET

one

MDR

10m

cable

Ch 2 ~ 50mV / MeV

C-Ch2

/C-Ch2

INH2

SDHN2

Pole /Zero Adj.

Fast Reset

(Ch2)

Differential

Buffer

(Ch2)

Single Core

or

Dual Core

wiring

 FADC

Programmable

Spectroscopic

Pulser

Pulser CNTRL

slide13

Time over Threshold [ToT] method

F. Zocca, AGATA Week

Padova, Nov., 2007

Time over Threshold

Analog

Core Ch.1

Core Ch.1

Reset Threshold Ch.1

Analog

Time over Threshold

Core Ch.2

Core Ch.2

Reset Threshold Ch.2

5 MeV

20 MeV

180 MeV

slide14

Issue: INH-C1 and Core Ch2

X-talk on the transmission line

due to INH-C1 return GND …

X-talk ~ 9 mV (~ slow signals)

  • keeping INH-C as LV-CMOS
  • digital signal
  • Advantage:
  • -simple upgrade of the single
  • gain core to dual gain core
  • Disadvantage:
  • - relativelarge crosstalk  INH-C1 and 2.nd core signal
  • INH-C1 Core_Ch2

X-talk ~ 15 mV (~ fast signals)

slide15

AGATA Dual_Core LVDS transmission of digital INH and Pulser_In signals

AGATA Dual Core crosstalk test measurements

Ch2 (analog signal) vs. LVDS-INH-C1 (bellow & above threshold)

Core amplitude just below the INH threshold

Core amplitude just above the INH threshold

[email protected] INH_Threshold - (~ 4mV)

Ch1 @ INH_Threshold + (~ 4mV)

Ch2 @ INH_Threshold + (~ 1mV)

[email protected]_Threshold + (- 1mV)

LV_CMOS

LV_CMOS

INH_Ch1/+/

INH_Ch1/-/

tr ~ 1.65 ns

INH_Ch1/+/

tf ~ 2.45 ns

INH_Ch1/-/

(1) Core_Ch1, (2) Core_Ch2, (3) INH_Ch1(LVDS/-/, (4) INH_Ch1(LVDS/+/)

G.Pascovici, Dual_Core IReS Test Box, warm jFET, Feb.23, 2008

slide16

Dual Core in ‘GP-Cryostat’ (cold)

5 & 10 m LVDS transmission line

Trigger

tin ~ 1.0 ns

tr ~ 26.8 ns Ch.1 @ ~ 800 mV

~ 25.6 ns Ch.2 @ ~ 220 mV

5m cable

tr, tf ~ 1.5 ns

10 m cable

tr, tf ~ 1.5 ns

~ 22ns / 5m

  • Resolutions:
  • Ch1 ~ 1.15 keV @ ~ 150 keV
  • Ch2 ~ 1.25 keV @ ~ 150 keV
  • (6 µs shaping time Ortec 671 & IKP-MCA)
  • Rise time ~ 26-29 ns
  • NO overshoots & undershoots
  • Pulse shape: flat top of ~ 500 ns

tr ~ 29.2 ns Ch.1 @ ~ 220 mV

~ 29.2 ns Ch.2 @ ~ 60 mV

slide17

Rework to be done

in the FADCs

LV-CMOS to LVDS

LVDS to LV-CMOS

tin ~ 1.0 ns

tr, tf ~ 1.5 ns

10m cable

+ 1.22V

Tiny converter PCBs

to be installed in the

FADCs

LVDS- TX

LVDS- RX (2x)

slide18

Dual Gain Core -the upgraded features and its structure

  • Linear Range: 2keV -180 MeV (far beyond the ADC limit !)
  • Two modes of operations:
  • a)Pulse Amplitudeb)Time Over Threshold(ToT)
  • (0-5 MeV); (0-20 MeV)(5-180 MeV); (20-180 MeV)

cold part

warm part

Ch 1 ~ 100 mV / MeV

C-Ch1

/C-Ch1

INH1

SDHN1

Pole /Zero Adj.

Fast Reset

(Ch1)

Differential

Buffer

(Ch1)

Common

Charge

Sensitive

Loop

+

Pulser

+

Wiring

36_fold segmented

HP-Ge detector + cold jFET

one

MDR

10m

cable

N.B. The dual gain core

can be configured also as a

Single Core with LV-CMOS

digital signals

Ch 2 ~ 50mV / MeV

C-Ch2

/C-Ch2

INH2

SDHN2

Pole /Zero Adj.

Fast Reset

(Ch2)

Differential

Buffer

(Ch2)

Single Core

or

Dual Core

wiring

 FADC

Programmable

Spectroscopic

Pulser

Pulser CNTRL

slide19

Potential use of PSPfor self-calibrating

ParameterPotential Use / Applications

  • Pulse amplitudeEnergy, Calibration, Stability
  • Pulse FormTransferFunction in time

(rise time, fall time)domain, ringing (PSA)

  • Detector Bulk Capacities  Crosstalk input data

(also for Dummy Capacities)(Detector characterization)

  • Pulse FormTOT Method  (PSA)
  • Repetition Rate (c.p.s.)  Dead Time(Efficiency meas.)

(with periodical or statistical distribution)

  • Time alignment  Correlated time spectra
  • Segments calibration points Low energy calibration points

 Alignment of segment signals

slide20

Pulser Mode of operation

Pulser Specs and Measurements

  • Dynamic range:

- Core 0 to ~ 180 MeV (opt. ~ 90 MeV)

- Segments 0 to ~3 MeV (opt. ~ 1 MeV)

  • Rise Time Range: 20 ns - 60 ns (by default ~45 ns)
  • Fall Time Range: 100 µs - 1000 µs (by default ~150 µs)
  • Long Term Stability: < 10 / 24 h

- 4

slide21

Measurements:

  • GSI Single Cryostat (Detector S001)
  • Portable 16k channels MCA (IKP)
  • Resolution (acquisition time 12-14h):
  • - core 1.08 keV Pulser (Detector)
  • - cold dummy (V3): 0.850 keV
  • - segment Pulser: < 0.90 keV
  • - core @ 59.5 keV: 1.10 keV
  • - core @ 122.06 keV: 1.15 keV
slide22

Conclusions

  • A very low noise, very wide dynamic range
  • charge-sensitive pre-amplifier has been
  • developed and tested to be used with a
  • highly segmented and encapsulated HP-Ge
  • AGATA Detector
  • Furthermore its wide spectroscopic range
  • has been successfully extended by more
  • than one order of magnitude, by switching
  • (below the maximum of the ADC range) from
  • the standard amplitude spectroscopic
  • method to the new TOT technique
  • - two modes of operations  four sub-ranges,
  • namely: 0-5 (20) MeV and 5(20)-180 MeV
  • A very clean transfer function at very high
  • counting rates and adverse cryostat wiring
  • (useful set of 2D & 3D “Dummy - detectors”)
  • An accurate Programmable Spectroscopic
  • Pulser has been developed and imple-
  • mented in the AGATA front-end electronics
slide23

Conclusions

Single Core

Dual Core

  • A very low noise, very wide dynamic range
  • charge-sensitive pre-amplifier has been
  • developed and tested to be used with a
  • highly segmented and encapsulated HP-Ge
  • AGATA Detector
  • Furthermore its wide spectroscopic range
  • has been successfully extended by more
  • than one order of magnitude, by switching
  • (below the maximum of the ADC range) from
  • the standard amplitude spectroscopic
  • method to the new TOT technique
  • - two modes of operations  four sub-ranges,
  • namely:0-5 (20) MeV and 5(20)-180 MeV
  • A very clean transfer function at very high
  • counting rates and adverse cryostat wiring
  • (useful set of 2D & 3D “Dummy - detectors”)
  • An accurate Programmable Spectroscopic
  • Pulser has been developed and imple-
  • mented in the AGATA front-end electronics

Floating

motherboard

Floating

motherboard

Triple Ganil

Triple Milano

Floating

motherboard

Floating

motherboard

Triple Cryostat, one set of 12+1

warm CSPs

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