Tib module performance at x5 test beam preliminary studies
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TIB module performance at X5 Test beam – preliminary studies. G.Segneri et al. Universita` and INFN - Pisa. Test Beam meeting – October 23 2003. Outline. Detector behavior under different bias voltages Studies on Detector Response Uniformity. Voltage scan for TIB Detectors.

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TIB module performance at X5 Test beam – preliminary studies

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Tib module performance at x5 test beam preliminary studies

TIB module performance at X5 Test beam – preliminary studies

G.Segneri et al.

Universita` and INFN - Pisa

Test Beam meeting – October 23 2003


Outline

Outline

  • Detector behavior under different bias voltages

  • Studies on Detector Response Uniformity


Voltage scan for tib detectors

Voltage scan for TIB Detectors

  • Study of the detector properties (noise, charge, S/N, cluster width and response function) as a function of the applied voltage

    Used runs:

    TIB peak: 1198, 99, 1202, 03, 04, 14, 15 -120 GeV m

    TIB dec.: 30020, 24, 27, 33, 36, 39, 42, 46 – 120 GeV p, 25 ns beam


Beam position in tib modules

Beam Position in TIB Modules

pion beam

muon beam


Tib voltage scan peak

TIB Voltage scan -peak

  • Peculiar behaviour at 300 V – hysteresis effect?


Tib voltage scan peak ii

TIB Voltage scan – peak (II)


Tib voltage scan dec

TIB Voltage scan – dec.


Tib voltage scan dec ii

TIB Voltage scan – dec. (II)

  • 20% increase in S/N ratio for Vbias = 2Vfd


Response function

Response Function


Cluster shape

Cluster Shape

Dec. mode

Vbias=200V

Peak mode

Vbias=200V

Peak mode

Vbias=450V

Dec. mode

Vbias=450V


Tib voltage scan under controlled environmental conditions

TIB Voltage scan under controlled environmental conditions

p beam

Run numbers:

T<23 oC: 30133, 37, 40, 42, 45, 47, 50

R.H.<20%: 30154, (62-66), (69-74)

120 GeV muon beam

T<23 oC


Tib module performance at x5 test beam preliminary studies

TIB Voltage scan under controlled environmental conditions (II)

  • Performance reproducible under controlled RH condition

  • signal and noise depend on RH but not their ratio


Voltage scan for tob detectors

Voltage Scan for TOB Detectors

Used runs: 30145, 47, 51, 63, 64, 65 – 120 GeV m, 25 ns beam – deconvolution mode


Tib module performance at x5 test beam preliminary studies

TOB mod # 8

TOB mod # 7

TOB mod # 9

TOB mod # 10

TOB mod # 11

TOB mod # 12


Tob voltage scan

TOB Voltage scan

  • Noise constant above 200 V

  • Charge collection improvement at very high voltage


Tob module voltage scan ii

TOB module voltage scan (II)

  • 25% decrease in S/N for Vbias = Vfd


Tob module voltage scan iii

TOB module voltage scan (III)

  • Less 10% of charge loss at Vbias/Vdepl>1.5

  • Constant cluster width above Vbias=300 V


Comparison tib tob

Comparison TIB/TOB

  • 95% of S/N highest value at 1.7 (1.5) Vdepl for TOB (TIB) modules


Sensor uniformity studies

Sensor Uniformity Studies

  • Study of the TIB sensor properties (noise, charge, S/N, respone function) as a function of the cluster position

    Used runs:

  • Run 1351-3: peak mode, pion beam, approx. 500,000 events

  • Run 1484: dec mode, 25 ns pion beam, approx. 1,500,000 events


Tib module performance at x5 test beam preliminary studies

Groups of 16 strips


Tib module performance at x5 test beam preliminary studies

Groups of 8 strips

Groups of 16 strips


Conclusions

Conclusions

  • TIB and TOB modules behave as expected except

    in some runs to be understood

  • Dependence on RH to be investigated more deeply (next talk?)

  • Uniformity of detector performance as a function of the position was successfully tested in high statistics runs

  • Work still in progress…


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