Tib module performance at x5 test beam preliminary studies
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TIB module performance at X5 Test beam – preliminary studies. G.Segneri et al. Universita` and INFN - Pisa. Test Beam meeting – October 23 2003. Outline. Detector behavior under different bias voltages Studies on Detector Response Uniformity. Voltage scan for TIB Detectors.

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TIB module performance at X5 Test beam – preliminary studies

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TIB module performance at X5 Test beam – preliminary studies

G.Segneri et al.

Universita` and INFN - Pisa

Test Beam meeting – October 23 2003


Outline

  • Detector behavior under different bias voltages

  • Studies on Detector Response Uniformity


Voltage scan for TIB Detectors

  • Study of the detector properties (noise, charge, S/N, cluster width and response function) as a function of the applied voltage

    Used runs:

    TIB peak: 1198, 99, 1202, 03, 04, 14, 15 -120 GeV m

    TIB dec.: 30020, 24, 27, 33, 36, 39, 42, 46 – 120 GeV p, 25 ns beam


Beam Position in TIB Modules

pion beam

muon beam


TIB Voltage scan -peak

  • Peculiar behaviour at 300 V – hysteresis effect?


TIB Voltage scan – peak (II)


TIB Voltage scan – dec.


TIB Voltage scan – dec. (II)

  • 20% increase in S/N ratio for Vbias = 2Vfd


Response Function


Cluster Shape

Dec. mode

Vbias=200V

Peak mode

Vbias=200V

Peak mode

Vbias=450V

Dec. mode

Vbias=450V


TIB Voltage scan under controlled environmental conditions

p beam

Run numbers:

T<23 oC: 30133, 37, 40, 42, 45, 47, 50

R.H.<20%: 30154, (62-66), (69-74)

120 GeV muon beam

T<23 oC


TIB Voltage scan under controlled environmental conditions (II)

  • Performance reproducible under controlled RH condition

  • signal and noise depend on RH but not their ratio


Voltage Scan for TOB Detectors

Used runs: 30145, 47, 51, 63, 64, 65 – 120 GeV m, 25 ns beam – deconvolution mode


TOB mod # 8

TOB mod # 7

TOB mod # 9

TOB mod # 10

TOB mod # 11

TOB mod # 12


TOB Voltage scan

  • Noise constant above 200 V

  • Charge collection improvement at very high voltage


TOB module voltage scan (II)

  • 25% decrease in S/N for Vbias = Vfd


TOB module voltage scan (III)

  • Less 10% of charge loss at Vbias/Vdepl>1.5

  • Constant cluster width above Vbias=300 V


Comparison TIB/TOB

  • 95% of S/N highest value at 1.7 (1.5) Vdepl for TOB (TIB) modules


Sensor Uniformity Studies

  • Study of the TIB sensor properties (noise, charge, S/N, respone function) as a function of the cluster position

    Used runs:

  • Run 1351-3: peak mode, pion beam, approx. 500,000 events

  • Run 1484: dec mode, 25 ns pion beam, approx. 1,500,000 events


Groups of 16 strips


Groups of 8 strips

Groups of 16 strips


Conclusions

  • TIB and TOB modules behave as expected except

    in some runs to be understood

  • Dependence on RH to be investigated more deeply (next talk?)

  • Uniformity of detector performance as a function of the position was successfully tested in high statistics runs

  • Work still in progress…


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