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ATML Status Aug 2006 Issue 8

ATML Status Aug 2006 Issue 8. An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committee. ATML.

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ATML Status Aug 2006 Issue 8

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  1. ATML StatusAug 2006Issue 8 An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committee

  2. ATML • ATML’s mission is to define a collection of XML-based schemas that allows ATE and test information to be exchanged in a common format adhering to the XML standard • ATML defines a framework through which different architectures using XML can be implemented. • defines the components from which users can build their architectures, whilst being interoperable with other compliant architectures. • Show examples of the net centric services by which this information can be exchanged across different ATS platforms as part of a maintenance process • defines the XML format that these elements will take. • The ATML specifications will define: • How to define XML schemas that represent ATE and test information • A set of XML schemas supporting the exchange of specific ATE and test information • Example services that can be used for exchanging ATE and test information in a distributed net-centric environment. • A set of services supporting the exchange of specific ATE and test information in specific common areas.

  3. ATML FrameworkIEEE Std. 1671 Test Station (1671.6) Instrument Description (1671.2) Test Adaptor (1671.5) Diagnostics (1232) UUT Description (1671.3) Test Configuration (1671.4) Test Description (1671.1) Started MAI (1636.2) Draft Test Results (1636.1) Candidate Draft Standard

  4. SCC20 & ATMLOrganisations • The IEEE SCC20 is the standards organisation through which the ATML components (Documents) will be published under various IEEE standards. • The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML. • The ATML group provides draft schemas and associated documents, examples, use cases, requirements and trials any ATML components • Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components

  5. SCC-20 Organization for 2006 Incorporating the ATML Components SCC-20 Steering & Administrative Chair: Les Orlidge (AAI) - Vice Chair: John Sheppard (JHU) Secretary - Dave Droste (DRS TEM) Administrative/Procedural (ADMIN) Mike Seavey (Northrop-Grumman) John Sheppard JHUX) Liaisons John Sheppard (CS), Joe Stanco & Mark Kaufman (I&M), Joe Stanco (AES), Bill Ross (DoD), Malcolm Brown (MoD), Les Orlidge(NDIA) Hardware Interfaces (HI) Co-Chair - Mike Stora (SysIntech) Co-Chair - Dave Droste (DRS TEM) Diagnostic and Maintenance Control (DMC) Co-Chair - Tim Wilmering (Boeing) Co-Chair - Mark Kaufman (NSWC/Corona Div) Test Description (TAD) Co-Chair - Keith Ellis (ApSys) Co-Chair – Ion Neag (Reston Software) Test Information Integration (TII) Co-Chair – Chris Gorringe (EADS Test & Service) Co-Chair – Mike Seavey (Northrop Grumman) IEEE-P1552 Structured Architecture for Test Systems (SATS) IEEE-P1522 Testability & Diagnosability IEEE-1641 Signal and Test Definition (STD) IEEE-P1671 ATML Overview and Architecture Capability descriptions IEEE-P1505 Receiver-Fixture Interface (RFI) IEEE-1232 AI-ESTATE IEEE-716 C/ATLAS IEEE-P1505.1 Common Test Interface Pin Map IEEE-P1636 Software Interface for Maintenance Information Collection Analysis (SIMICA) IEEE-771 Guide to the Use of ATLAS IEEE P1671.3 UUT Description IEEE-1445 Digital Test Interchange Format (DTIF) IEEE-P1641.1 Signal and Test Definition User Guide Key Assigned within SCC20 IEEE P1671.4 Test Configuration IEEE P1671.1 Test Description IEEE-1546 DTIF Guide SCC20 IEEE Std IEEE- P1671.6 Test Station IEEE-P1636.1 Test Results and Session Information IEEE P1671.2 Instrument Description ATML IEEE Stds with PARS Expected Location IEEE- P1671.5 Test Adapter IEEE-P1636.2 Maintenance Action Information Expected ATML Components without PARS Note: 1671 dot numbers for the components are defined within the 1671 framework document

  6. SCC-20 ATML PARs StatusAll Approved • Project Authorisation Request (PAR) need to be approved by the IEEE NESCOM prior to any SCC-20 working group being established. • ATML Framework PAR 1671 Approved • Diagnostics PAR 1232 Existing & Update for ATML • SIMICA PAR 1636 Expires 12/06 • Test Results PAR 1636.1 Approved • MAI PAR 1636.2 Approved • Test Description PAR 1671.1 Approved • Instrument Description PAR 1671.2 Approved • UUT Description – PAR 1671.3 Approved • Test Configuration - PAR 1671.4 Approved • Test Station &Test Adapter - PAR 1671.6, 1671.5 Approved

  7. ATML Objectives & Goals • To have the P1671 • standard written, reviewed and a ballot called by mid-2006 √ • to submit as a standard by Q4 2006 √ • To have Candidate schemas for early ’06 • Q1 • Test Results √ • Instrument Description √ • UUT Description √ • Test Adaptor √ • Test Station √ • Test Configuration √ • Q2 • Test Description √ • Diagnostics (AI-ESTATE 1232) rev 2 • To have Draft Schemas available by Late ‘06 and candidate schemas for ’07 • MAI (Maintenance Action Information) • To have all ATML 1671 Canditate schemas available for trial use on the network • http://grouper.ieee.org/groups/scc20/ATML/√ • To have all the ATML 1671 Candidate Standards drafted End `06 • To have the remaining 1671 Standards in Ballot during `07

  8. ATML P1671 Standards Revisions

  9. ATML/IEEE Schedule(TII) • TII Sub-committee • Operating Instructions (April 2005) √ • ATML Framework 1671 (Chris Gorringe/Mike Seavey) • IEEE Par Approved (Nov 2004) √ • ATML Framework Draft (Review April 2005) √ • ATML Framework Requirements (Review April 2005) √ • ATML Framework Draft Document (H) (Oct 2005) √ • ATML Framework IEEE Editorial & Rev 2 (Jan 06) √ • ATML Framework Ballot (May 2006) √ • ATML Standards Submitted to RevCon (July 2006) √ • Capability (Dan Pleasant) • Requirements (Sept 2005) √ • Draft Schema Snippet – Component (May 2006) √ • Finalize inputs to other groups (Jun 2006) √ • Schema – Component Added to Hardware Common (Aug 2006) √

  10. ATML/IEEE Schedule(TII Cont) • UUT Description 1671.3 (John Ralph) • Requirements (April 2005) √ • Draft Schema (Review June 2005) √ • Draft 2 Schema review (Jan 2006) √ • Candidate Schema (Mar 2006) √ • Draft Document (Oct 2006) √ • Ballot Date (End 2006) • Test Configuration 1671.4 (Tim Davis) • Start (April 2005) √ • Requirements (July 2005) √ • Draft Schema (Review Oct 2006) √ • Candidate Schema (July 2006) √ • Draft Document (Oct 2006) • Ballot date (2007) • Test Station P1671.6 & Test Adapter P1671.5 (Tamara Einspanjer) • Requirements (July 2005) √ • Draft Schema (Jan 2006) √ • Final Schema (Apr 2006) √ • Candidate Schemas (Jul 2006) √ • Draft Standard (End 2006) √ • Ballot date (2007)

  11. ATML ScheduleTAD • Test Description P1671.1 (Ion Neag) • Draft Schema review (Oct 2005) √ • Draft Schema (Jan 2006) √ • Draft 10 Schema (May 2006) √ • Candidate Schema (Aug 2006) √ • PAR (Oct 2005) √ • Draft Standard (Nov 2006) • Ballot Date (May 2007) • Instrument Description P1671.2 (Teresa Lopes) • Draft Schema review (July 2005)√ • Final Draft Schema (Apr 2006) √ • Candidate Schema (Jun 2006) √ • PAR (Oct 2005) √ • Draft Standard (End 2006) • Ballot Date (Jan 2007)

  12. ATML Schedule(DMC) • Test Results 1636.1 (John Ralph) • ATML Candidate (Dec 2004) √ • PAR Approved (Mar 2005) √ • DMC Requirements Document (Review April 2005) √ • 1636.1 Draft (Review April 2005) √ • Draft 2 posted with DMC (Oct 2005) √ • Draft 4 Ready for BALLOT (May 2006) • Ballot process not yet started • Draft 4.x Added Express Model Annex (Aug 2006) • Test Results Ballot Process (May 1st 2006) • MAI (Mukund Modi, Joe Stanco) • P1636.2 MAI Draft (TDA) • Ballot (Jan 2009)

  13. ATML Meeting Schedule • Bi-Weekly Teleconferences • 4 Meetings a year plus additional break-out working group as necessary • Synchronise with SCC20/01 meetings • Jan 17-19th Orlando (LM) √ • Late April SCC20 Pax River √ • Aug 14-17th Santa Rosa (Agilent) √ • ATC2006 Anaheim – SCC20, TII Management Only • Mid Oct (17th-19th), Boston (Possibly) • Provisional Mid Jan `07 Orlando

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