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2009 IEEE BTW Update. Fort Collins, Colorado September 16, 2009. IEEE Board Test Workshop Update. Agenda iNEMI Test TIG Update 2010 Test Projects. Introductions. Board & Systems Test TIG Chair: Rosa Reinosa (HP) Co-Chair: James Grealish (Intel). Objective & Scope. Test

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2009 IEEE BTW Update

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2009IEEE BTW Update

Fort Collins, Colorado

September 16, 2009


IEEE Board Test Workshop Update

  • Agenda

    • iNEMI Test TIG Update

    • 2010 Test Projects


Introductions

  • Board & Systems Test TIG

  • Chair: Rosa Reinosa (HP)

  • Co-Chair: James Grealish (Intel)


Objective & Scope

  • Test

  • To improve the effectiveness of the test process and the quality of electronic products in a global manufacturing environment

  • Scope includes test technology and process improvement for boards and systems (e.g. automated inspection, electrical test, boundary scan, functional test, system test)


Test TIG Projects 2010

TEST TIG

Chair: Rosa Reinosa

Co-Chair: JJ Grealish

Board Flexure Initiative

Chair: Rosa Reinosa (HP)

Co-Chair: Alan McAllister (Intel)

Boundary Scan (Phase II)

Chair: Phil Geiger (Dell)

Co-Chair: Steve Butkovitch (Cisco)

BIST

Chair: Zoe Conroy

Co-Chair: TBD

Test Economic Model (Phase II)

Chair: TBD

Co-Chair: TBD


Summary of 2009 activities

Accomplishments

  • Completion of iNEMI 5 Year Test Technology Roadmap to be published by iNEMI

  • Completed gap analysis

  • Identified and reviewed proposals for 2010 projects

  • Completed Functional Test Coverage project


Board Flexure Initiative Project

2009 Update

  • New Spherical Bend Test Method Standard (IPC/JEDEC 9707) is being completed

  • Feedback from JEDEC and IPC 6-10d committees has been gathered

  • Proposal will go for ballot in IPC & JEDEC in Oct 2009

    Phase II

  • Starting in 2010

  • Goal: Update IPC 9702 (Monotonic Bend Test Method) and IPC 9704 (Strain Gauge Standard)


Boundary Scan Project

2009 Update

  • Industry Survey (completed)

  • Survey analysis (completed)

  • ITC paper (To be published)

  • Move forward recommendations

    Phase II

  • To be determined


Functional Test Coverage Project

2009 Update

  • Project has been completed

  • Webinar held on 8/12/09 (hosted by iNEMI)

  • Results will be made available to iNEMI participating companies

  • Completed in 2009


BIST Project

New in 2010

  • Currently in project definition phase

  • Need more companies to join

  • Chair: Zoe Conroy from Cisco ([email protected])

  • Introduced by Huawei

    Potential Project Steps:

  • Survey (current state of BIST in the industry)

  • BIST as an ICT alternative Investigation

  • Development of Related Standards

  • New BIST Board Level Standard Proposal

  • White Paper


iNEMI Test Cost Model (Phase II)

New in 2010

  • Seeking to optimize iNEMI Test Cost Model

  • Currently in project definition phase

  • Need more companies to join

  • Contact: Haley Fu if interested ([email protected])

  • Introduced by Huawei


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