Lar40 cold electronics wbs 130 05 03 04
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LAr40 Cold Electronics WBS 130.05.03.04. Craig Thorn. Outline. Scope & Requirements Electronics specifications Technical overview Data rates Zero-suppression Electronics overview Front-end (analog) ASIC Digital (ADC, buffer, mux ) ASIC Cryogenic operation of CMOS ASICs

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LAr40 Cold Electronics WBS 130.05.03.04

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Lar40 cold electronics wbs 130 05 03 04

LAr40 Cold Electronics WBS 130.05.03.04

Craig Thorn

Far Site Review, December 6-9, 2011


Outline

Outline

  • Scope & Requirements

    • Electronics specifications

  • Technical overview

    • Data rates

    • Zero-suppression

    • Electronics overview

    • Front-end (analog) ASIC

    • Digital (ADC, buffer, mux) ASIC

    • Cryogenic operation of CMOS ASICs

    • Electronics details and specifications

  • Schedule

  • Summary

Far Site Review, December 6-9, 2011

Craig Thorn


Scope requirements

Scope & Requirements

  • Scope: Can use WBS definitions (http://lbne2-docdb.fnal.gov:8080/cgi-bin/ShowDocument?docid=2163) for scope. Note that WBS#’s are out of date, also be sure text reflects current reference design choice.

  • Requirements: Get from Anne Heavey, DOORS output. (http://lbne2-docdb.fnal.gov:8080/cgi-bin/ShowDocument?docid=3747) Anne should have the outputs by Dec. 1st.)

Far Site Review, December 6-9, 2011

Craig Thorn


Electronics parameters

Electronics Parameters

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Total Event Rate For Noise

With Zero-suppression

  • White (Series) Noise: SNR

    • Noise is 600 e rms

    • MIP is 10000 e (1 attn length , 5 mm spacing)

    • Threshold at 0.3 MIP: noise is 5 sigma

    • (for these conditions 0.1% of points on a MIP track are lost)

    • Probability of > 5 sigma is 2.8 x 10-7

    • Read nearest neighbor wires + 2 leading & trailing samples

    • Rate per APA is 3 x 5 x 2560 x 150 kHz x 12 x 2.8 x 10-7 = 0.02 Mb/s

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Practical Maximum Data Rate of LAr20

Radioactive contaminants

  • Ar39: Mean beta energy of 220 keV, endpoint 565 keV, 1.4 kBq/m3

  • Kr85: Mean beta energy of 251 keV, endpoint 687 keV, 0.16 – 0.48 kBq/m3

  • K40, Co60, Th232, U238: in construction materials, gammas only, atten length <15 cm

  • Arspallation by cosmics: no cross section data, but not significant in WARP data

The energy spectrum observed with the 2.3 liter WARP detector (Data) can be reproduced by

an internal component dominated by Ar39 and Kr85b emission inside the liquid argon.

an external component dominated by interactions of g-rays coming from U238, Th232, Co60 and K40 radioactivity of the materials surrounding the liquid argon

P. Benetti et al., NIM A 574 (2007) 83

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Practical Maximum Data Rate of LAr20

Radioactive contaminants

  • Ar39

    • Decay rate is 122 kHz/APA

    • Mean ionization is ~0.3 MIP

    • Threshold @ 0.5 MIP, detected rate is 34 kHz

    • Mean range of betas is 0.28 mm

    • Read 3 wires and 10 samples

    • Mean rate is 3 x 8 x 34,000 x 12 = 9.8 Mb/s

  • Kr85

    • Decay rate is ~28 kHz/APA

    • Mean ionization is ~0.4 MIP

    • Threshold @ 0.5 MIP, detected rate is 8 kHz

    • Mean range of betas is 0.39 mm

    • Read 3 wires and 5 samples

    • Mean rate is 3 x 8 x 8,000 x 12 = 2.3 Mb/s

  • Co60

    • Only near SS APA frames since attenuation length is ~10 cm

    • add ~0.2Mb/s (range of Compton electron is 1.3 cm)

Calculation of 220 keV electrons in LAr from CASINO

www.gel.usherbrooke.ca/casino/index.html

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Data Rates - Summary

  • Zero-suppression at FE reduces total volume of data to transmit

  • Buffering on FE ASIC allows data to be transmitted at lower rate than sampling rate

  • Readout rate must be high enough to avoid event “collisions” in one FE buffer

  • With optimal zero-suppression, radioactivity, cosmics, and series FE noise give rates of

    • 9.8 Mb/s for Ar39 betas

    • 2.3 Mb/s for Kr85 betas

    • 0.6 Mb/s for Co60, Th & U gammas

    • 0.02 Mb/s for FE series noise*

    • 0.8 Mb/s for cosmic muons (1 Gb/s near surface**)

    • Total is ~14 Mb/s (2 Gb) per APA at 800 (0) feet (cf. limit of 300Mb/s for copper, 3Gb/s for optical transmission per line)

  • *For an enc of 600 RMS e-, a threshold at 3000 e- and 1 us shaping (zero-crossing rate of 150kHz). For a 1/e drift time of 2.4 ms, a drift of 3.7 m and a wire pitch of 5 mm, this threshold is 0.3 MIP.

  • **Cosmic muon rate is 12 kHz (26 muon per drift, mean track length 2 m)

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Zero Suppression – APA Trigger

  • Trigger derived from the logic OR of all collecting wires on an APA

  • All channels on an APA continuously writing to the buffer until no signal from any collecting wire

  • Baseline samples are compacted into smaller words (4bits)

  • Not efficient: little data reduction

  • Data volume is not sensitive to “noise” (thermal, induced, radioactivity, cosmics, …)

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Zero Suppression – Chip Trigger

  • Trigger derived from the logic OR of all channels in a chip

  • All channels on a chip continuously writing to the buffer until no signal from any channel of a chip

  • Baseline samples are compacted into smaller words (4bits)

  • Data volume is sensitive to “noise”

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Zero Suppression – Channel Trigger

  • Trigger is derived from a single channel

  • Write enable is applied to the i, i+1, and i-1wires to cover any shared, below threshold signals

  • Read ahead and after the write enable gate to capture the below threshold leading/trailing edges of a waveform

  • Minimum data volume

  • Data volume is less sensitive to “noise”

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

FEE Design Guidelines & Constraints

some factors relevant to the design of final in-LAr readout architecture

back-end redundancy

lifetime

power dissipation

compression

sparsification

neighboring

smart threshold

derandomization(deep memory)

reliability

zero suppression

low multiplexing, low clock frequency

↕ (conflict)

high multiplexing, high clock frequency

flexibility

number of feed-throughs

dead time

token-passing

(design option)

programmability (design, operation)

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

LAr TPC - Cold CMOS Electronics

Block Diagram – Lar40 Reference Design

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

LAr TPC - Cold CMOS Electronics

Block Diagram – LAr40 Alternate Design

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

LAr TPC Front-End ASIC

  • 16 channels

  • charge amplifier (adj. gain)

  • high-order filter (adj. time constant)

  • ac/dc, adjustable baseline

  • test capacitor, channel mask

  • ADC (12-bit, 2 MS/s)

  • compression, discrimination

  • multiplexing and digital buffering

  • LV or CM digital interface

  • pulse generator, analog monitor

  • temperature sensor

  • LAr environment (> 20 years at 88K)

  • estimated total size ~ 6 x 8 mm²

  • estimated power ~ 10 mW/channel


Lar40 cold electronics wbs 130 05 03 04

Analog ASIC

  • 16 channels

  • charge amplifier, high-order filter

  • adjustable gain: 4.7, 7.8, 14, 25 mV/fC

  • (charge 55, 100, 180, 300 fC)

  • adjustable filter time constant

  • (peaking time 0.5, 1, 2, 3 µs)

  • selectable collection/non-collection mode

  • (baseline 200, 800 mV)

  • selectable dc/ac coupling (100µs)

  • rail-to-rail analog signal processing

  • band-gap referenced biasing

  • temperature sensor (~ 3mV/°C)

  • 136 registers with digital interface

  • 5.5 mW/channel (input MOSFET 3.9 mW)

  • single MOSFET test structures

  • ~ 15,000 MOSFETs

  • designed for room (300K) and cryogenic (77K) operation

  • technology CMOS 0.18 µm, 1.8 V

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Signal Measurements

Bandgap Reference

variation ≈ 1.8 %

Temperature Sensor

~ 2.86 mV / °K

Pole-zero cancellation at 77K

to be addressed in next revision

Adjustable gain, peaking time and baseline

maximum charge 55, 100, 180, 300 fC

Far Site Review, December 6-9, 2011


Lar40 cold electronics wbs 130 05 03 04

Analog ASIC - Signal Measurements

Warm tests for MicroBooNE

Crosstalk < 0.7%

Noise ~ 250e- w/o Cdet w. tp=1μs @RT

Noise < 1000e-w. Cdet=150pF & tp=1μs @ RT

Far Site Review, December 6-9, 2011


Lar40 cold electronics wbs 130 05 03 04

FEE ASIC Evaluation

Noise, Gain, and Shaping Time

Far Site Review, December 6-9, 2011


Lar40 cold electronics wbs 130 05 03 04

Analog ASIC - Noise Measurements

Layout Detail

Qmax=300fC

Input MOSFET

L = 270 nm

W = 10 mm

(50µm x 200)

gm,77K ≈ 90 mS (11 Ω)

gm,300K ≈ 45 mS (22 Ω)

Input Line

L ≈ 1 mm

W = 3.5 µm

(M3 + M4)

R77K ≈ 3 Ω

R300K ≈ 12 Ω

Dynamic Range > 3,000

  • Measurements affected by:

  • input line parasitic resistance

    • ~ 150 e- at 77 K (~ 590 e- at 300K )

    • addressed in next revision

  • CINdielectric noise (not present in wire)

    • ~ 60 e- at 77 K

ASIC version #3 designed and fabricated, currently being tested


Lar40 cold electronics wbs 130 05 03 04

Issues Addressed in Version 2

  • Analog front-end

    • input MOSFET optimization→MOSFET width doubled

    • noise from resistance of input lines→line width doubled

  • Start-up failures in some bias circuit →start-up circuits added

  • (due to new BGR biasing circuits)

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

Residual Issues in Version 2

  • CMP damage in AC/DC circuit (found in a few samples)

  • Some packaging issues

  • DC PSR can be improved

no baseline stabilization possible, due to constraint on measurement time

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

CMP Damage

DC

Only possible explanation: high series resistance (up to open)

metal 5

metal 6

AC

metal 5 interconnect line

switch

to buffer

(metal 6)

risk of CMP damage

from filter

Resistor

Capacitor

280µm

1,100µm


Lar40 cold electronics wbs 130 05 03 04

CMP Damage

Damage due to discharge from Chemical-Mechanical Polishing (CMP) during fabrication

DC

damaged

channel

good

channel

good

channel

damaged

channel

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

FE ASIC Version 3

LArASIC3

LArASIC2

size 6010 x 5707 µm²

bias circuit for high PSR

LArASIC3 sent for fabrication on July 25th

Received and under evaluation

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

ADC - Architecture

Clockless low power ADC stage

Demonstrated in ASIC for SNS, see De Geronimo, et al., IEEE Trans NSS, 54 (2007) 541

  • Current mode ADC

  • dual stage6-MSBs in 150ns, 6-LSBs in 250ns

  • single trigger conversion per stage

  • 12-bit resolution

  • 2 MS/s conversion rate

  • power dissipation 3.6 mW at 2 MS/s

  • power-down option for low rate applications

    • wake up in few tens of ns

  • layout size: 0.23 mm x 1.25 mm

ADC cell

Far Site Review, December 6-9, 2011

Craig Thorn


Lar40 cold electronics wbs 130 05 03 04

ADC - Preliminary Results

300 K

16-channel

ADC+buffer

6mm

77 K

4.3 mm

ADC output - 1.4 V sine

ADC output - 500mV dc

σ=1.1LSB

  • operation verified at room and cryogenic temperatures

  • differential non-linearity limited by timing design error in control circuit

  • integral non-linearity limited by mismatch (linear → common centroid)

Craig Thorn

ASIC revision designed and fabricated; under evaluation


Schedule install by others

Schedule (install by others)

  • Schedule provided by Ken

CD-1: 6/2012

CD-0: 1/2010

CD-2: 9/2013

CD-3: 12/2014

Designs

Beneficial Occupancy: 10/2018

Construction

Checkout

Far Site Review, December 6-9, 2011

Craig Thorn


Milestones

Milestones

Far Site Review, December 6-9, 2011

Craig Thorn


Summary

Summary

  • CMOS performs better at cryogenic temperatures

  • Defined and predictable design for cryogenic T is possible

  • Low-noise at cryogenic T demonstrated

    • ENC < 1,000 e- at 200pF ~5mW/ch.

    • characterization and modeling of CMOS 180nm

  • Long lifetime at cryogenic T possible with guidelines

  • Critical building blocks - front-end & ADC - developed

  • Future work

    • Improve cryogenic static models

    • Optimize ADC

    • Merge, add zero-suppression & buffering, and finalize

Far Site Review, December 6-9, 2011

Craig Thorn


Backup information

Backup Information

Far Site Review, December 6-9, 2011


Lar40 cold electronics wbs 130 05 03 04

ASIC Architecture

ae re ck flgwi

bias, pulser, logic, registers

8x

analog

8x

ADC

thr/

trig

cmp

mem

3K

mux

8:1

da

taa,tab

section a

section b

8x

analog

8x

ADC

thr/

trig

cmp

mem

3K

mux

8:1

db

tba,tbb

  • two independent 8-channel sections (a and b)

    • ADC max 2MS/s, 12-bit, calibrated for zero at baseline

    • mem can store one full-depth event (3K) per channel

wo

  • da, db = data out

  • taa, tab, tba, tbb = triggers in/out (edge channels)

  • ae = acquisition enable (sync/reset acquisition at positive edge)

  • re = readout enable

  • ck = clock 32 or 64 MHz

    • rck (readout clock) 32 or 64 MHz

    • tck (timestamp & ADC clock) 2MHz

    • cck (test pulse clock) 8 kHz

    • wck (write clock) 8 MHz

  • flg = flag (full indicator, stops acquisition, restarts at 3/4 buffer empty)

  • wi, wo = configuration in/out

  • event stored in mem if: (i) above threshold or (ii) external trigger from neighbor (or FPGA)


Lar40 cold electronics wbs 130 05 03 04

Data Format

max block size 4096-bit

0 (16)

amplitude data

time2 (10)

time1 (10)

addr (12)

1 (16)

id (4)

end

start

  • variable block length, max 4096 bit

  • block-start: 16 ones

  • address 12-bit

    • 5-bit hard-assigned + 7-bit soft-assigned

    • all 0 and all 1 not allowed

  • timestamp 20-bit (2 x 10-bit)

    • associated to threshold crossing

    • Gray-code, 500 ns (2 MHz), ~500 ms full scale

    • all 0 and all 1 not allowed

  • block id (same timestamp) 4-bit

    • resets at each new timestamp

    • all 0 and all 1 not allowed

  • amplitude data 14-bit or n-bit

    • compress if below compression-threshold (programmable)

    • first bit: compression id (0 = compressed data, 1 = full data)

    • second bit: polarity (0 = negative, 1 = positive)

    • next bits: amplitude (12 for uncompressed, n-2 for compressed)

    • max amplitude length 4096 - 68 = 4028 bit (~288x14-bit)

    • can be broken to next block as needed

    • all 0 and all 1 not allowed

  • block-end: 16 zeros

Craig Thorn


Cost estimate

Cost Estimate

Far Site Review, December 6-9, 2011

Craig Thorn


Labor vs m s

Labor vs M&S

Far Site Review, December 6-9, 2011

Craig Thorn


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