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FEI4 CLKGEN

FEI4 CLKGEN. Andre Kruth FE-I4 CLKGEN Jan. 25 th 2010. Test Bench. CLKGEN TOP. Layout FEI4 CLKGEN. SimRes nom PEX C+CC. 80MHz single-ended CLK. 320MHz single-ended CLK. VSS current. SimRes nom PEX C+CC. Acquiring 320MHz. Acquiring 80MHz. SimRes slow PEX C+CC. 80MHz single-ended.

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FEI4 CLKGEN

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  1. FEI4 CLKGEN Andre Kruth FE-I4 CLKGEN Jan. 25th 2010

  2. Test Bench

  3. CLKGEN TOP

  4. Layout FEI4 CLKGEN

  5. SimRes nom PEX C+CC 80MHz single-ended CLK 320MHz single-ended CLK VSS current

  6. SimRes nom PEX C+CC Acquiring 320MHz Acquiring 80MHz

  7. SimRes slow PEX C+CC 80MHz single-ended 80MHz 320MHz 320MHz single-ended VSS current

  8. SimRes fast PEX C+CC 80MHz single-ended 80MHz 320MHz 320MHz single-ended VSS current

  9. Locking to 25ns +/- 0.5ns Reference CLK 80MHz mean 320MHz mean

  10. Additionally … I checked that Adber‘s biasing gives me the biasing currents I need.

  11. Thanks for your attention!

  12. BACKUP

  13. Type II PFD-CP PLL fref=40MHz fout=40/80/160/320MHz Simple loss of lock detection X only on demonstrator

  14. Vctrl Settling

  15. Loss of Lock Detection @ SET Settling of Vctrl Settling of Vctrl Settling of Vctrl Settling of Vctrl • Settling time < 1.5  μs (all corners) from extracted simulation • Nominal settling time to 2 % envelope t=653 ns • Settling time < 1.5  μs (all corners) from extracted simulation • Nominal settling time to 2 % envelope t=653 ns • Settling time < 1.5  μs (all corners) from extracted simulation • Nominal settling time to 2 % envelope t=653 ns • Settling time < 1.5  μs (all corners) from extracted simulation • Nominal settling time to 2 % envelope t=653 ns

  16. Measurement Data Measurement Data >5.6 >5.6 >5.6 ns ns ns mV mV mV >5.6 >5.6 ns ns mV mV 284 284 284 284 284 T= 6.25ns T= 6.25ns T= 6.25ns - - Eye diagram of 160 MBit/s serialized data stream MBit/s serialized data stream using 80 using 80 MHz PLL clock output with on MHz PLL clock output with on - - chip digital chip digital test logic test logic • Measurement Data • Eye diagram of 160 MBit/s serialized data stream using 80 MHz PLL clock output with on-chip digital test logic • Clock jitter and duty cycle measurements • Measurement Data • Eye diagram of 160 MBit/s serialized data stream using 80 MHz PLL clock output with on-chip digital test logic • Clock jitter and duty cycle measurements T= 6.25ns T= 6.25ns >5.6 ns >5.6 ns 284 mV 284 mV Pulser 81134A time jitter rms 2 ps, Scope TDS5104B 5 GS/s, 1 GHz *Measurement setup and equipment limit accurarcy Pulser 81134A time jitter rms 2 ps, Scope TDS5104B 5 GS/s, 1 GHz *Measurement setup and equipment limit accurarcy

  17. Measurements on Demonstrator Pulser 81134A time jitter rms 2 ps, Scope TDS5104B 5 GS/s, 1 GHz *Measurement setup and equipment limit accurarcy

  18. PLL TOP

  19. PFD

  20. CP

  21. VCO

  22. DIV16

  23. DIV2

  24. CONV_BUF

  25. MUX

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