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Automatic generation of software -based functional failing test. Giovanni Squillero. GOAL. To propose a methodology for automatically devising a functional failing test for a microprocessor, without any information about the underlying microarchitecture. Outline. Background

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Automatic generation of software based functional failing test

Automatic generation of software-based functional failing test

Giovanni Squillero


Automatic generation of software based functional failing test

GOAL

  • To propose a methodology for automatically devising a functional failing test for a microprocessor, without any information about the underlying microarchitecture

giovanni.squillero@polito.it


Outline

Outline

  • Background

  • (Functional) failing tests

  • Proposed methodology

  • Experimental evaluation

  • Conclusions

giovanni.squillero@polito.it


Background

Background

giovanni.squillero@polito.it


Automatic generation of software based functional failing test

  • “Very few chips ever designed function or meet their performance goal the first time”

    • R. McLaughlin, S. Venkataraman, C. Lim (2009)

giovanni.squillero@polito.it


Background1

Background

Pre-silicon

DESIGN

Post-silicon

Tape out

PROTOTYPE

giovanni.squillero@polito.it


Functional failing test

Functional failing test

AF56ED90

AF96FB90

giovanni.squillero@polito.it


Framework

Framework

XML

µGP

asm

giovanni.squillero@polito.it


Language specification

Language Specification

  • Integer instructions

  • Legacy x87

  • Single-instruction/multiple-data (SIMD)

    • MMX, SSE, SSE2, SSE3, SSSE3, SSE4, …

  • Threads

  • L1 cache hit/miss

XML

giovanni.squillero@polito.it


Feedback

Feedback

optimization

evaluation

  • Main loop:

    • Execute the program in safe condition and record signature

    • Increase frequency and/or decrease core voltage and execute the program until a different signature is detected

       Record critical status

Candidate test

Frequency/Voltage

Results

slave

master

giovanni.squillero@polito.it


Experimental evaluation

Experimental evaluation

  • Possible comparison:

    • State of the art Stability Tests from the overclockers community

IEEE Computer, 2004

giovanni.squillero@polito.it


Target system

Target system

  • Intel Pentium Dual-Core E2180

    • 2007

    • Dual core (2 threads)

    • SSE 3

    • Water cooling

giovanni.squillero@polito.it


Target system1

Target system

  • Intel Core i7-950

    • 2009

    • Quad core (8 threads)

    • Simultaneous multithreading

    • SSE 4.2

    • Water cooling

giovanni.squillero@polito.it


Undervolting @2 93 ghz

Undervolting (@2.93 GHz)

giovanni.squillero@polito.it


Undervolting @3 82 ghz

Undervolting (@3.82 GHz)

giovanni.squillero@polito.it


Overclocking @1 2500 v

Overclocking (@1.2500 V)

giovanni.squillero@polito.it


Overclocking @1 24375 v

Overclocking (@1.24375 V)

giovanni.squillero@polito.it


Humies claim d

HUMIES CLAIM (D)

  • The result is publishable in its own right as a new scientific result independent of the fact that the result was mechanically created

giovanni.squillero@polito.it


Humies claim e

HUMIES CLAIM (E)

  • The result is equal to or better than the most recent human-created solution to a long-standing problem for which there has been a succession of increasingly better human-created solutions

giovanni.squillero@polito.it


Humies claim g

HUMIES CLAIM (G)

  • The result solves a problem of indisputable difficulty in its field

giovanni.squillero@polito.it


Automatic generation of software based functional failing test

Giovanni Squillero

Politecnico di Torino

Dipartimento di Automatica e Informatica

Corso Duca degli Abruzzi, 24

I-10129 Torino

ITALY

Tel: +39-011564.7186

Fax: +39-011564.7099

http://www.cad.polito.it/staff/squillero/

giovanni.squillero@polito.it

giovanni.squillero@polito.it


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