# TES key development Issues - PowerPoint PPT Presentation

1 / 6

TES key development Issues. Energy resolution Aim for 1 eV type resolution for E < 1 keV Field of view Increase of pixel size to typically 5/3 – 5/2 arc sec ≡ 416 - 625 μ m (settle on 500 μ m) Increase of pixels above 32 x 32 elements (wait for array and read-out developments going-on)

I am the owner, or an agent authorized to act on behalf of the owner, of the copyrighted work described.

TES key development Issues

Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author.While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server.

- - - - - - - - - - - - - - - - - - - - - - - - - - E N D - - - - - - - - - - - - - - - - - - - - - - - - - -

## TES key development Issues

• Energy resolution

• Aim for 1 eV type resolution for E < 1 keV

• Field of view

• Increase of pixel size to typically 5/3 – 5/2 arc sec ≡ 416 - 625 μm (settle on 500 μm)

• Increase of pixels above 32 x 32 elements (wait for array and read-out developments going-on)

• Count rate ability

• TES limited to approximately 0.1 ms speed

XEUS Cryogenic Instrument 26 - 27 October 2004

Energy resolution limit is given by:

## TES key development Issues

with ESAT given by

Measured value of EFWHM = 4 eV for C = 0.5pJ/K, α = 70, and T = 100 mK is a factor 3 worse than theory. This is partially due to excess noise and partially due to non-optimum data analysis algorithm. A better data-analysis algorithm should result in 2.5 – 3 eV.

Saturation energy equals ≈ 10 keV for r = 0.1

Reduction of the saturation energy to 2.5 keV, C ≈ 1.25 10-13 J/K, would therefore result in an energy resolution improvement by a factor 2.0

Present schemes would than result in ≈ 2 eV energy resolution, while with better data analysis about 1.3 eV is expected.

Better understanding and reduction of the excess noise might result in a limit of 0.6 eV FWHM

XEUS Cryogenic Instrument 26 - 27 October 2004

• Energy resolution limit vs pixel size

• We can manufacture standard type pixels with a heat capacity C= 0.125 pJ/K and up to 250 x 250 μm2

• 0.05 pJ/K for TiAu TES

• 0.06 pJ/K for Cu/Sn and 0.08 pJ/K for Cu/Bi absorber

• Larger pixels will require different designs. Scaling to .5 x .5 mm pixels seems quite well feasible by

• Reduction of the fill factor TES/Multiple small TES in parallel

• Non-continuous Cu-layer beneath Bi/Sn absorber

• Pixels in access of 0.5 x 0.5 mm can most probably not be produced with a saturation at 2.5 keV and its corresponding energy resolution

## TES key development Issues

XEUS Cryogenic Instrument 26 - 27 October 2004

• single pixel optimization

• single pixel production by micro-electronics techniques

• Array production development

• SQUID development and optimization

• How we can use expertise build up for TES development for support of the magnetic sensor line?

## Magnetic sensor key development Issues

XEUS Cryogenic Instrument 26 - 27 October 2004

• Prove of good energy resolution for large DROID’s

• Arraying of DROID’s