Bi review on radiation development and testing
This presentation is the property of its rightful owner.
Sponsored Links
1 / 28

BI Review on Radiation Development and Testing PowerPoint PPT Presentation


  • 89 Views
  • Uploaded on
  • Presentation posted in: General

BI Review on Radiation Development and Testing. SPS Beam Position Monitors: MOPOS Front-End Electronics Jose Luis Gonzalez BE/BI 22/11/2013. Outline. SPS Multi Orbit POsition System (MOPOS) System overview Front-End Architecture Rad- tol requirements, design and status

Download Presentation

BI Review on Radiation Development and Testing

An Image/Link below is provided (as is) to download presentation

Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author.While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server.


- - - - - - - - - - - - - - - - - - - - - - - - - - E N D - - - - - - - - - - - - - - - - - - - - - - - - - -

Presentation Transcript


Bi review on radiation development and testing

BI Review on Radiation Development and Testing

SPS Beam Position Monitors:MOPOS Front-End Electronics

Jose Luis Gonzalez

BE/BI

22/11/2013


Outline

Outline

  • SPS Multi Orbit POsition System (MOPOS)

  • System overview

  • Front-End Architecture

  • Rad-tol requirements, design and status

  • Possible impact and mitigation

  • Long-term radiation test planning and strategy

  • BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Sps multi orbit position system mopos

    TT20

    (SPS NA)

    BA2

    BA3

    BA4

    ECA4

    BA1

    TT40

    BA5

    TT66

    (HiRadMat)

    BA7

    TI2

    (LHC)

    ECA5

    TT60

    BA6

    TT41

    (CNGS)

    TT10

    (PS)

    TI8

    (LHC)

    SPS Multi Orbit POsition System (MOPOS)

    • MOPOS Front-End

      • 216 BPMs in the tunnel

      • Exposed up to 100Gy/y

      • Optical transmission

    • MOPOS Read-Out

      • In surface buildings (BA1...6)

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Mopos simplified block diagram

    MOPOS: Simplified Block Diagram

    y

    U

    Serial

    ADC 10MHz

    FPGA

    LogAmps

    L

    R

    Optical Link

    @ 2.4 Gb/s

    Pickup

    x

    D

    Analogue Board

    Digital Board

    SPS Tunnel

    FPGA

    Front-End

    CHASSIS

    Radio Frequency

    Timing Distribution

    VME Interface

    Software

    Read-Out Board

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Front end architecture

    Front-End Architecture

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Analogue board

    Analogue Board

    • Log-Amps

      • AD8302

      • ADL5519

      • MAX2016

    • ADC Drivers

      • ADA4932-2

      • THS4521

    • Voltage regulators

      • LT1963AEQ

      • TL1963-KTT

      • LP3875-ADJ

      • TPS7A4501-KTT

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Psi irradiation facilities pif

    PSI Irradiation Facilities (PIF)

    • Energy: 230 MeV

    • Flux: 1.6 108 p/cm2 s

    • Fluence: 1.874 1012 p/cm2

    • Current: 4.7 nA

    • Collimator: 58 mm (Si)

    • Dose/run: 1 kGy - 105 rad/3.5 h

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Psi analogue test setup

    PSI: Analogue Test Setup

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Logamp adl5519 adc drivers

    LogAmp ADL5519 & ADC-Drivers

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Analogue components

    Analogue Components

    • LogAmps

      • AD8302: Analog Devices, Dual Log Amps

      • ADL5519: Analog Devices, Dual Log Detector

      • MAX2016: Maxim, Dual Log Detector

    • ADC Drivers

      • ADA4932: Analog Devices, Differential ADC driver

      • THS4521: Texas Inst., Differential ADC driver

    • These components have been qualified at PSI (TID 1kGy)

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Voltage regulators

    Voltage Regulators

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Analogue components1

    Analogue Components

    • Low Dropout Regulators

      • LT1963A: Linear Tech.,LDO Regulator (1/3 bad)

      • LP3875: National Semi., LDO Regulator (3/3 bad)

      • TL1963A: Texas Inst.,LDO Regulator

      • TPS7A4501: Texas Inst.,LDO Regulator

    • These components have been qualified at PSI (TID 1kGy)

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Optical transceivers test board

    Optical Transceivers Test Board

    Commercial SFP Modules

    • Double-fiber SFP

      • FTTX Technology: FT3A05D

    • Single-fiber, bidirectional

      • Ligent: LTE5350-BC and LTE3550-BC

      • Lightron: WSP24-313LC-I5A and WSP24-513LC-I3A

      • Source Photonics: SPL-35-GB-CDFM and SPL-53-GB-CDFM

      • Yamasaki: 541315L-15B and 541315L-15Y

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Psi test setup

    PSI Test Setup

    • Energy: 230 MeV; Current: 2nA (~3.5 rad/s) or 3 nA(~6 rad/s); Collimator: 58 mm (Si)

    • TID goal: 1 kGy - 105 rad/component

    • Measurements every second:

      • Communication rate: 1.25 Gb/s

      • 32-bit word sent from the controller board (FPGA, Spartan6)

      • Electrical loopback on the SFP Board

      • Cross-check between sent and received 32-bit word

      • 2 SFP modules tested in parallel

      • For each channel, 3 counters are enabled: single bit errors, multiple bit errors, total errors

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Measurements best sfp parts

    Measurements – Best SFP Parts

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Sfp test results summary

    SFP Test Results Summary

    • Ligentand Yamasaki components are very sensitive to the radiation level @ PIF

      • Source-Photonics components are more resistant but with many error bursts

      • FTTX and Lightron components behave much better but still generate many error bursts

    • For the MOPOS Front-End: decision to use the Versatile Transceiver (VTRx) developed at CERN

      TESTS to be done with long transmission fibres (up to 1.5 km)

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Cern vtrx radiation specs

    CERN VTRx Radiation Specs

    Versatile Link Technical Specification, rev. 2 [J. Troska et al.]

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Short term strategy

    Short-Term Strategy

    • Current Front-End Digital PCB (vers. 1)

      • Analog Devices Octal14-bit ADC: AD9252

      • Xilinx Spartan6 FPGA (Triplication, Hamming Code Correction…)

      • CERN VTRX Optical Transceiver

    • Will allow the first functional tests of the MOPOS system in 2014 (both hardware and software)

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Long term strategy radiation tests for adc digital parts

    Long-Term Strategy: Radiation Tests for ADC & Digital Parts

    • Beam Tests Conditions: equivalent to PSI Test Beams (230 MeV; TID: 1 kGy)

    • In our section there is no manpower available in 2014

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Analogue digital converters

    Analogue/Digital Converters

    • 40…65Msps – LVDS Serial ADC

      • AD9252: Analog Devices Octal 14-bit

      • AD9259: Analog Devices Quad 14-bit

      • LTM9009: Linear Tech.Octal 14-bit

      • LTC2171: Linear Tech.Quad 14-bit

      • ADS5294: Texas Inst. Octal 14-bit

      • ADS6442: Texas Inst. Quad 14-bit

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Adc radiation tests h takai bnl

    ADC Radiation Tests (H. Takai/BNL)

    TWEPP2013

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Digital components

    Digital Components

    • Low Voltage and LVDS Buffers

      • 74VCX162244: Fairchild 16-bit Buffer/Line Driver

      • 74ALVCH162244: Texas 16-bit Buffer/Line Driver

      • 74VMEH22501: Texas 8-bit Bus Transceiver

      • FIN1108: Fairchild 8-port LVDS Repeater

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Digital components fpga

    Digital Components: FPGA

    • SERDES integrated – SRAM technology

      • Xilinx SPARTAN6 (currently used)

        • Test of the first board prototype: SPS – 2014

      • Altera Stratix V

        • Cycling Redundancy Check of FPGA configuration

        • Possibility to get the corresponding ASIC

    • External SERDES  FPGA + GBT project

      • SRAM – if failures are mostly related to SERDES

      • Antifuse – MicrosemiAxceleratorAX2000

    • Flash RAM – for SRAM configuration

      • M25P128 – Numonyx

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Thank you for your attention

    THANK YOU FOR YOUR ATTENTION!

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Spare slides psi radiation tests

    Spare Slides: PSI Radiation Tests

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Psi sfp radiation setup

    PSI: SFP Radiation Setup

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Sfp tests fttx ft3a05d

    SFP Tests: FTTX FT3A05D

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


    Sfp tests lightron i3a

    SFP Tests: Lightron I3A

    BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013


  • Login