ARGCS ACTD
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ARGCS ACTD CONOPS. BIT/Integrated Diagnostics. Weapon System ECP. OL. IL. DL. OEM. Dataflow. Dataflow. Dataflow. Test / Maintenance Feedback. Coalition Team Concept for @world Wide Support. Northrop Grumman ARGCS Solution. ATML Elements. (Web) Services. TestStation. Instrument.

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Oem

ARGCS ACTD

CONOPS

BIT/Integrated

Diagnostics

Weapon System ECP

OL

IL

DL

OEM

Dataflow

Dataflow

Dataflow

Test / Maintenance Feedback

Coalition Team Concept for @world Wide Support


Northrop grumman argcs solution

Northrop Grumman ARGCS Solution


Atml elements

ATML Elements

(Web) Services

TestStation

Instrument

TestAdaptor

UUTData

TestConfiguration

Diagnostics

TestDescription

TestProgram

TestResults

Not Included

Not Started

Started

Draft

Candidate


Oem

UUT Repair Process

Observation

Bit Check

O level

I level

D level

UUTData

TestDescription

TestResults (Results & Diagnosis)

Diagnostics


Atml framework

ATML Framework

  • 12 Jan 05


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External Interface (UI)

UUTstatic

UUTstatic

Test Config

Test Results

Reasoner

UUTstatic

App Exec

Diagnostics

[1232]

UI

Data Store

Reasoner

Test Results

Test Description

A

B

Application Ex

Test Results

Test Description

C

Test Controller

Test Executive

Local

(Test Results)

D

ATML

E

IO

Outside ATML


Condensation of architectures

Condensation of Architectures

  • Test Controller or Test Executive

  • Application Executive

  • Historical Database

  • Data store (metadata)

Common Features


Condensation of architectures1

BIT

Condensation of Architectures

Contains UUT data, test descriptions, instrument metadata

Static DB

UUT

Fault Tree

Interface (Adapter?)

Diagnostic Interface

Application Executive

Test Controller

User Interface

Historical DB

Reasoner

  • PIREP

  • Technician knowledge

Contains prior test results for UUT, operator knowledge base (?)


A time line that test results may go through

A time line that test results may go through.

  • Start with a simple list of test that we want to perform

  • Each test is performed and a measurement is captured

  • A set of limits is applies to each test consistent with the design authority field test requirements, which may be different from the depot level.

  • The pass/fail criteria is determined from the limits supplied

  • The grouping pass/fail criteria is determined

  • The pass/fail limits and measurements are filtered out as a security measure

  • The test and pass/fail information is diagnosed to identify indictments and subsequent repair.


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  • How will Test Description define Test Limits? Simple, there’s a common type TestLimits just use that.

  • What happens if your TestDesription wants to reference an previous run? Oh allow for XPath & XLink

  • How do you define a group of test? Ahhh

  • More importantly how do we know we have to?

  • How do we ensure our Requirement specifications in Test Description can be met from our Instrument descriptions?


What s happening with

What’s happening with?

  •  - Design - Preconditions & Postconditions, Initialization & Termination (Ion Neag)

  •  - Design - Test Actions (Ion Neag)

  •  - A couple of use case scenarios (Dan Pleasant)

  • Supporting Both Static and Dynamic descriptions? (Chris Gorringe)

  • What Will Services mean? (Chris Gorringe)

  • XML Transaction Presentation (Tony Alwardt)


What s next

What’s Next?


Atml ari key elements

DRV

ATML/ARI KEY Elements

FRM

ICM

CXE

Web Services

(Web) Services

RAI

TestStation

Instrument

RMS

SWM

SFP

IFP

CTI

DNE

TestAdaptor

NET

UDI

AFP

UUTData

PDD

TestConfiguration

MCI

UTR

BTD

Diagnostics

TestDescription

TPD

DIAD

MTD

MTD

DTF

RTS

TestProgram

MMF

TestResults

Not Included

DIAS

Not Started

Started

Draft

Candidate


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INFORMATION FRAMEWORK

SYSTEMS INTERFACES

Adapter Functional &

Parametric Data

AFP

(IEEE P1641)

Instrument Functional

& Parametric Data

IFP/SFP

(IEEE P1641)

Product Design

Data

PDD

Built In

Test Data

BTD

(IEEE 1149.X)

Digital Test

Format

DTF

(IEEE 1445)

Test Program

Documentation

TPD

Interface

Adaptor

Test

Station

Instrument

Test

Description

UUTData

UUTData

Test

Description

UUTData

Diagnostics

Instrument

Driver

DRV

(VPP 3-X)

Data/

Distributed

Network

DNE

System

Framework

FRM

(VPP-2)

UUT Test

Requirements

UTR

(IEEE P1641)

Diagnostic Data

DIAD

(IEEE 1232)

IVI/Resource

Adapter

Interface

RAI

(IEEE P1641)

Multimedia

Formats

MMF

(JTA)

Data

Networking

NET

(TCP/IP)

Communication

Manager

ICM

(VPP-4)

Diagnostic

Services

DIAS

(IEEE 1232)

Instrument

UUT

Device Interfaces

UDI

Resource

Management

Services

RMS

Instrument

Computer to

External Env.

CXE

(TCP/IP)

UUTData

Diagnostics

Test

Program

Set

Test

Description

Interface

Adapter

Diagnostics

UUT

ATE

TPS

Run Time

Services

RTS

LEGEND

Switch

Matrix

SWM

Commercial std not yet selected/developed

Maintenance

Data and Services

MTD

(IEEE P1636)

Master

Conformance

Index

MCI

Common Test

Interface

CTI

(IEEE P1505)

Commercial std under review/evaluation

Commonly accepted commercial standard

IEEE P1671 ATML Initiative

DoD ATS Technical Framework & ATML Relationships


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