Spezielle anwendungen des vlsi entwurfs applied vlsi design
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Spezielle Anwendungen des VLSI – Entwurfs Applied VLSI design. Changes across technologies Results of Phase 5 Andy Schellin. Fundamentals. Why changing manufacturing technology? Functionally reasons Economically reasons Lower Voltage Higher frequency. Power Loss. Problems.

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Spezielle Anwendungen des VLSI – Entwurfs Applied VLSI design

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Spezielle anwendungen des vlsi entwurfs applied vlsi design

Spezielle Anwendungen des VLSI – Entwurfs Applied VLSI design

Changesacrosstechnologies

Resultsof Phase 5

Andy Schellin


Fundamentals

Fundamentals

  • Why changing manufacturing technology?

  • Functionally reasons

  • Economically reasons

  • Lower Voltage

  • Higher frequency

Power Loss


Problems

Problems

  • RC delay of global wires

  • Gate oxid tunneling

  • Sub-threshold leakage

  • Leakage grows exponentially

Fig:1 Leakage power grows exponentially [6]


Results with design

Results with design


Results with design1

Results with design


Further technology improvements

Further technology improvements

  • 3D – Transistors (FinFET) with high-k gate dielectric

  • Low-k materials for separating wires

  • Substrate Biasing

  • 5nm technology until 2019


Thank you for your attention

Thank you for your attention


References

References

[1] http://www.ieee.org/portal/cms_docs_societies/sscs/PrintEditions/200701.pdf

[2] http://www.eetimes.com/design/automotive-design/4016329/Solve-leakage-and-dynamic-power-loss

[3]http://www.cs.cmu.edu/afs/cs/academic/class/15740-f03/public/doc/discussions/uniprocessors/power/isca02.pdf&sa=X&scisig=AAGBfm2jwcfhEOYVpQsHCHvWjLK134ml3g&oi=scholarr&ei=VxzwUPyMC8bJswb294G4DA&sqi=2&ved=0CDwQgAMoADAA

[4] http://www.dailytech.com/IDF+2011+Intel+Looks+to+Take+a+Bite+Out+of+ARM+AMD+With+3D+FinFET+Tech/article22719.htm

[5] Xiaodong Zhang, “High Performance Low Leakage Design Using Power Compiler and Multi-Vt Libraries”, Synopsys, SNUG, Europe, 2003, www.synopsys.com, 10/9/2007

[6] http://www.anandtech.com/print/1611


Backup

Backup

Fig2: Scaling Results for Circuit Performance [1]


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